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Register File Criticality and Compiler Optimization Effects on Embedded Microprocessor Reliability
IEEE transactions on nuclear science, 2017-08, Vol.64 (8), p.2179-2187
2017
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S-SETA: Selective Software-Only Error-Detection Technique Using Assertions
IEEE transactions on nuclear science, 2015-12, Vol.62 (6), p.3088-3095
2015
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Reliability on ARM Processors Against Soft Errors Through SIHFT Techniques
IEEE transactions on nuclear science, 2016-08, Vol.63 (4), p.2208-2216
2016
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Failure Mechanism and Sampling Frequency Dependency on TID Response of SAR ADCs
Journal of electronic testing, 2021-06, Vol.37 (3), p.329-343
2021
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Reliability Calculation With Respect to Functional Failures Induced by Radiation in TMR Arm Cortex-M0 Soft-Core Embedded Into SRAM-Based FPGA
IEEE transactions on nuclear science, 2019-07, Vol.66 (7), p.1433-1440
2019
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Mitigation of process variability effects using decoupling cells
Microelectronics and reliability, 2019-09, Vol.100-101, p.113446, Article 113446
2019
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Impact on Radiation Robustness of Gate Mapping in FinFET Circuits under Work-function Fluctuation
2023 IEEE International Symposium on Circuits and Systems (ISCAS), 2023, p.1-5
2023
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Circuit-Level Techniques to Mitigate Process Variability and Soft Errors in FinFET Designs
2019 IFIP/IEEE 27th International Conference on Very Large Scale Integration (VLSI-SoC), 2019, p.240-241
2019
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Hybrid soft error mitigation techniques for COTS processor-based systems
2016 17th Latin-American Test Symposium (LATS), 2016, p.99-104
2016
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Measuring Failure Probability of Coarse and Fine Grain TMR Schemes in SRAM-based FPGAs Under Neutron-Induced Effects
Applied Reconfigurable Computing, p.331-338
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Sleep Transistors to Improve the Process Variability and Soft Error Susceptibility
2019 26th IEEE International Conference on Electronics, Circuits and Systems (ICECS), 2019, p.582-585
2019
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Register file criticality on embedded microprocessor reliability
2016 16th European Conference on Radiation and Its Effects on Components and Systems (RADECS), 2016, p.1-5
2016
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A High-Fault-Coverage Approach for the Test of Data, Control and Handshake Interconnects in Mesh Networks-on-Chip
IEEE transactions on computers, 2008-09, Vol.57 (9), p.1202-1215
2008
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Using Bulk Built-in Current Sensors to Detect Soft Errors
IEEE MICRO, 2006-09, Vol.26 (5), p.10-18
2006
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A broad strategy to detect crosstalk faults in network-on-chip interconnects
2010 18th IEEE/IFIP International Conference on VLSI and System-on-Chip, 2010, p.298-303
2010
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Using Quadded logic in nanoPLAs to aggressively increase circuit yield
The 16th North-East Asia Symposium on Nano, Information Technology and Reliability, 2011, p.180-185
2011
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