Sortiert nach
PloS one, 2010-07, Vol.5 (7), p.e11803-e11803
2010
Link zum Volltext
IEEE access, 2020, Vol.8, p.116226-116238
2020
Link zum Volltext
IEEE transactions on emerging topics in computing, 2022, Vol.10 (2), p.549-563
2022
- Link zum Volltext
Electronics (Basel), 2021-12, Vol.10 (24), p.3160
2021
Link zum Volltext
The Journal of supercomputing, 2021-10, Vol.77 (10), p.11625-11642
2021
Link zum Volltext
Intelligent systems with applications, 2023-02, Vol.17, p.200174, Article 200174
2023
Link zum Volltext
Analyzing Radiation-Induced Transient Errors on SRAM-Based FPGAs by Propagation of Broadening Effect
2019
Link zum Volltext
The Journal of supercomputing, 2022-04, Vol.78 (6), p.8081-8105
2022
Link zum Volltext
Electronics (Basel), 2023-01, Vol.12 (1), p.169
2023
Link zum Volltext
Radiation effects and defects in solids, 2020-07, Vol.175 (7-8), p.745-754
2020
Link zum Volltext
Nuclear science and techniques, 2021-10, Vol.32 (10), p.45-54, Article 106
2021
Link zum Volltext
2020 IEEE International Test Conference (ITC), 2020, p.1-10
2020
- Link zum Volltext
Microelectronics and reliability, 2017-09, Vol.76-77, p.154-158
2017
Link zum Volltext
IEEE transactions on very large scale integration (VLSI) systems, 2021-08, Vol.29 (8), p.1596-1600
2021
- Link zum Volltext
IEEE transactions on nuclear science, 2008-08, Vol.55 (4), p.1968-1973
2008
- Link zum Volltext
IEEE transactions on computer-aided design of integrated circuits and systems, 2024-04, Vol.43 (4), p.1-1
2024
Link zum Volltext
2023 IEEE 41st International Conference on Computer Design (ICCD), 2023, p.596-604
2023
- Link zum Volltext
IEEE transactions on nuclear science, 2008-12, Vol.55 (6), p.3381-3387
2008
- Link zum Volltext
Microelectronics and reliability, 2020-06, Vol.109, p.113660, Article 113660
2020
Link zum Volltext
IEEE transactions on computers, 2017-06, Vol.66 (6), p.1022-1033
2017
- Link zum Volltext
Microelectronics and reliability, 2021-05, Vol.120, p.114122, Article 114122
2021
Link zum Volltext
2018 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT), 2018, p.1-6
2018
- Link zum Volltext
IEEE transactions on nuclear science, 2022-07, Vol.69 (7), p.1633-1641
2022
Link zum Volltext
2021 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT), 2021, p.1-6
2021
- Link zum Volltext
IEEE transactions on computer-aided design of integrated circuits and systems, 2014-09, Vol.33 (9), p.1342-1355
2014
- Link zum Volltext
Suchergebnisse filtern
Filter anzeigenNur zeigen
Publikationsform
Erscheinungsjahr
n.n
n.n
Thema
- Science & Technology
- Technology
- Engineering
- Engineering, Electrical & Electronic
- Computer Science
- Field Programmable Gate Arrays
- Computer Science, Hardware & Architecture
- Circuit Faults
- Fpga
- Routing
- Fault Tolerance
- Fault Injection
- Reliability
- Single Event Upsets
- Hardware
- Radiation Effects
- Computer Science, Information Systems
- Soft Errors
- Algorithms
- Computer Science, Theory & Methods
Kollektion
- IEEE Xplore
- IngentaConnect Journals
- EZB-FREE-00999 freely available EZB journals
- SpringerLink Series
- Elsevier ScienceDirect Journals Complete
- ACM Digital Library
- Ebook Central Perpetual and DDA
- eBooks on EBSCOhost
- Springer Books
- SpringerLink E-Journals
- SpringerLINK Contemporary (Konsortium Baden-Württemberg)
- IngentaConnect Journals
- Journals@Ovid Ovid Full Text
- Wiley Online Library - AutoHoldings Journals
- Taylor & Francis Journals Complete
- Jstor Complete Legacy
- Nomos eLibrary
- Taylor & Francis Current Content Access
Zeitschrift / Serie
- Ieee Transactions On Nuclear Science
- Ieee Transactions On Computers
- Microelectronics And Reliability
- Electronics
- Ieee Access
- Ieee Transactions On Computer-Aided Design Of Integrated Circuits And Systems
- Ieee Transactions On Emerging Topics In Computing
- Ieee Transactions On Very Large Scale Integration
- Journal Of Systems Architecture
- The Journal Of Supercomputing