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IEEE transactions on nuclear science, 2017-08, Vol.64 (8), p.2179-2187
2017





2021 IEEE 22nd Latin American Test Symposium (LATS), 2021, p.1-3
2021
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Microelectronics and reliability, 2020-11, Vol.114, p.113754, Article 113754
2020
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Microelectronics and reliability, 2019-09, Vol.100-101, p.113446, Article 113446
2019
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2018 IEEE 24th International Symposium on On-Line Testing And Robust System Design (IOLTS), 2018, p.291-294
2018

2021 IEEE 12th Latin America Symposium on Circuits and System (LASCAS), 2021, p.1-4
2021


Proceedings of the 20th annual conference on integrated circuits and systems design, 2007, p.354-359
2007
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2019 26th IEEE International Conference on Electronics, Circuits and Systems (ICECS), 2019, p.582-585
2019
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2016 16th European Conference on Radiation and Its Effects on Components and Systems (RADECS), 2016, p.1-5
2016

2007 IEEE International Symposium on Circuits and Systems (ISCAS), 2007, p.3776-3779
2007

2016 16th European Conference on Radiation and Its Effects on Components and Systems (RADECS), 2016, p.1-6
2016

2017 24th IEEE International Conference on Electronics, Circuits and Systems (ICECS), 2017, p.393-396
2017

2012 13th Latin American Test Workshop (LATW), 2012, p.1-6
2012

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