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Evaluating Soft Core RISC-V Processor in SRAM-Based FPGA Under Radiation Effects
IEEE transactions on nuclear science, 2020-07, Vol.67 (7), p.1503-1510
2020
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Register File Criticality and Compiler Optimization Effects on Embedded Microprocessor Reliability
IEEE transactions on nuclear science, 2017-08, Vol.64 (8), p.2179-2187
2017
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S-SETA: Selective Software-Only Error-Detection Technique Using Assertions
IEEE transactions on nuclear science, 2015-12, Vol.62 (6), p.3088-3095
2015
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Single Event Transients in Logic Circuits-Load and Propagation Induced Pulse Broadening
IEEE transactions on nuclear science, 2008-12, Vol.55 (6), p.2928-2935
2008
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Reliability on ARM Processors Against Soft Errors Through SIHFT Techniques
IEEE transactions on nuclear science, 2016-08, Vol.63 (4), p.2208-2216
2016
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Failure Mechanism and Sampling Frequency Dependency on TID Response of SAR ADCs
Journal of electronic testing, 2021-06, Vol.37 (3), p.329-343
2021
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Reducing Soft Error Rate of SoCs Analog-to-Digital Interfaces With Design Diversity Redundancy
IEEE transactions on nuclear science, 2020-03, Vol.67 (3), p.518-524
2020
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Approximate Computing for Safety-Critical Applications
2021 IEEE 22nd Latin American Test Symposium (LATS), 2021, p.1-3
2021
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Circuit design using Schmitt Trigger to reliability improvement
Microelectronics and reliability, 2020-11, Vol.114, p.113754, Article 113754
2020
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Investigating the reliability impacts of neutron-induced soft errors in aerial image classification CNNs implemented in a softcore SRAM-based FPGA GPU
Microelectronics and reliability, 2022-11, Vol.138, p.114738, Article 114738
2022
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Reliability Calculation With Respect to Functional Failures Induced by Radiation in TMR Arm Cortex-M0 Soft-Core Embedded Into SRAM-Based FPGA
IEEE transactions on nuclear science, 2019-07, Vol.66 (7), p.1433-1440
2019
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Mitigation of process variability effects using decoupling cells
Microelectronics and reliability, 2019-09, Vol.100-101, p.113446, Article 113446
2019
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Exploring Gate Mapping and Transistor Sizing to Improve Radiation Robustness: A C17 Benchmark Case-study
2021 IEEE 22nd Latin American Test Symposium (LATS), 2021, p.1-6
2021
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Circuit-Level Techniques to Mitigate Process Variability and Soft Errors in FinFET Designs
2019 IFIP/IEEE 27th International Conference on Very Large Scale Integration (VLSI-SoC), 2019, p.240-241
2019
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Hybrid soft error mitigation techniques for COTS processor-based systems
2016 17th Latin-American Test Symposium (LATS), 2016, p.99-104
2016
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Measuring Failure Probability of Coarse and Fine Grain TMR Schemes in SRAM-based FPGAs Under Neutron-Induced Effects
Applied Reconfigurable Computing, p.331-338
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Voltage Scaling Influence on the Soft Error Susceptibility of a FinFET-based Circuit
2021 IEEE 12th Latin America Symposium on Circuits and System (LASCAS), 2021, p.1-4
2021
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Exploring the inherent fault tolerance of successive approximation algorithms under laser fault injection
2018 IEEE 19th Latin-American Test Symposium (LATS), 2018, p.1-6
2018
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Sleep Transistors to Improve the Process Variability and Soft Error Susceptibility
2019 26th IEEE International Conference on Electronics, Circuits and Systems (ICECS), 2019, p.582-585
2019
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Approximate Computing for Fault Tolerance Mechanisms for Safety-Critical Applications
Approximate Computing Techniques, p.387-414
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Register file criticality on embedded microprocessor reliability
2016 16th European Conference on Radiation and Its Effects on Components and Systems (RADECS), 2016, p.1-5
2016
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Analyzing the impact of using pthreads versus OpenMP under fault injection in ARM Cortex-A9 dual-core
2016 16th European Conference on Radiation and Its Effects on Components and Systems (RADECS), 2016, p.1-6
2016
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Investigating parallel TMR approaches and thread disposability in Linux
2017 24th IEEE International Conference on Electronics, Circuits and Systems (ICECS), 2017, p.393-396
2017
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Simulation of SET faults in a voltage controlled oscillator
2012 13th Latin American Test Workshop (LATW), 2012, p.1-6
2012
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Improving error detection with selective redundancy in software-based techniques
2013 14th Latin American Test Workshop - LATW, 2013, p.1-6
2013
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