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Evaluating Soft Core RISC-V Processor in SRAM-Based FPGA Under Radiation Effects

IEEE transactions on nuclear science, 2020-07, Vol.67 (7), p.1503-1510

2020

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Register File Criticality and Compiler Optimization Effects on Embedded Microprocessor Reliability

IEEE transactions on nuclear science, 2017-08, Vol.64 (8), p.2179-2187

2017

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S-SETA: Selective Software-Only Error-Detection Technique Using Assertions

IEEE transactions on nuclear science, 2015-12, Vol.62 (6), p.3088-3095

2015

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Single Event Transients in Logic Circuits-Load and Propagation Induced Pulse Broadening

IEEE transactions on nuclear science, 2008-12, Vol.55 (6), p.2928-2935

2008

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Reliability on ARM Processors Against Soft Errors Through SIHFT Techniques

IEEE transactions on nuclear science, 2016-08, Vol.63 (4), p.2208-2216

2016

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Failure Mechanism and Sampling Frequency Dependency on TID Response of SAR ADCs

Journal of electronic testing, 2021-06, Vol.37 (3), p.329-343

2021

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Reducing Soft Error Rate of SoCs Analog-to-Digital Interfaces With Design Diversity Redundancy

IEEE transactions on nuclear science, 2020-03, Vol.67 (3), p.518-524

2020

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Approximate Computing for Safety-Critical Applications

2021 IEEE 22nd Latin American Test Symposium (LATS), 2021, p.1-3

2021

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Circuit design using Schmitt Trigger to reliability improvement

Microelectronics and reliability, 2020-11, Vol.114, p.113754, Article 113754

2020

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Investigating the reliability impacts of neutron-induced soft errors in aerial image classification CNNs implemented in a softcore SRAM-based FPGA GPU

Microelectronics and reliability, 2022-11, Vol.138, p.114738, Article 114738

2022

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Reliability Calculation With Respect to Functional Failures Induced by Radiation in TMR Arm Cortex-M0 Soft-Core Embedded Into SRAM-Based FPGA

IEEE transactions on nuclear science, 2019-07, Vol.66 (7), p.1433-1440

2019

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Mitigation of process variability effects using decoupling cells

Microelectronics and reliability, 2019-09, Vol.100-101, p.113446, Article 113446

2019

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Exploring Gate Mapping and Transistor Sizing to Improve Radiation Robustness: A C17 Benchmark Case-study

2021 IEEE 22nd Latin American Test Symposium (LATS), 2021, p.1-6

2021

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Impact on Radiation Robustness of Gate Mapping in FinFET Circuits under Work-function Fluctuation

2023 IEEE International Symposium on Circuits and Systems (ISCAS), 2023, p.1-5

2023

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Circuit-Level Techniques to Mitigate Process Variability and Soft Errors in FinFET Designs

2019 IFIP/IEEE 27th International Conference on Very Large Scale Integration (VLSI-SoC), 2019, p.240-241

2019

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Hybrid soft error mitigation techniques for COTS processor-based systems

2016 17th Latin-American Test Symposium (LATS), 2016, p.99-104

2016

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Measuring Failure Probability of Coarse and Fine Grain TMR Schemes in SRAM-based FPGAs Under Neutron-Induced Effects

Applied Reconfigurable Computing, p.331-338

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Performances VS Reliability: how to exploit Approximate Computing for Safety-Critical applications

2018 IEEE 24th International Symposium on On-Line Testing And Robust System Design (IOLTS), 2018, p.291-294

2018

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Voltage Scaling Influence on the Soft Error Susceptibility of a FinFET-based Circuit

2021 IEEE 12th Latin America Symposium on Circuits and System (LASCAS), 2021, p.1-4

2021

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Exploring the inherent fault tolerance of successive approximation algorithms under laser fault injection

2018 IEEE 19th Latin-American Test Symposium (LATS), 2018, p.1-6

2018

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Using majority logic to cope with long duration transient faults

Proceedings of the 20th annual conference on integrated circuits and systems design, 2007, p.354-359

2007

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Sleep Transistors to Improve the Process Variability and Soft Error Susceptibility

2019 26th IEEE International Conference on Electronics, Circuits and Systems (ICECS), 2019, p.582-585

2019

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Register file criticality on embedded microprocessor reliability

2016 16th European Conference on Radiation and Its Effects on Components and Systems (RADECS), 2016, p.1-5

2016

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Evaluating Network-on-Chip for Homogeneous Embedded Multiprocessors in FPGAs

2007 IEEE International Symposium on Circuits and Systems (ISCAS), 2007, p.3776-3779

2007

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Analyzing the impact of using pthreads versus OpenMP under fault injection in ARM Cortex-A9 dual-core

2016 16th European Conference on Radiation and Its Effects on Components and Systems (RADECS), 2016, p.1-6

2016

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Evaluating Soft Core RISC-V Processor in SRAM-Based FPGA Under Radiation Effects

Register File Criticality and Compiler Optimization Effects on Embedded Microprocessor Reliability

S-SETA: Selective Software-Only Error-Detection Technique Using Assertions

Single Event Transients in Logic Circuits-Load and Propagation Induced Pulse Broadening

Reliability on ARM Processors Against Soft Errors Through SIHFT Techniques

Failure Mechanism and Sampling Frequency Dependency on TID Response of SAR ADCs

Reducing Soft Error Rate of SoCs Analog-to-Digital Interfaces With Design Diversity Redundancy

Approximate Computing for Safety-Critical Applications

Circuit design using Schmitt Trigger to reliability improvement

Investigating the reliability impacts of neutron-induced soft errors in aerial image classification CNNs implemented in a softcore SRAM-based FPGA GPU

Reliability Calculation With Respect to Functional Failures Induced by Radiation in TMR Arm Cortex-M0 Soft-Core Embedded Into SRAM-Based FPGA

Mitigation of process variability effects using decoupling cells

Exploring Gate Mapping and Transistor Sizing to Improve Radiation Robustness: A C17 Benchmark Case-study

Impact on Radiation Robustness of Gate Mapping in FinFET Circuits under Work-function Fluctuation

Circuit-Level Techniques to Mitigate Process Variability and Soft Errors in FinFET Designs

Hybrid soft error mitigation techniques for COTS processor-based systems

Measuring Failure Probability of Coarse and Fine Grain TMR Schemes in SRAM-based FPGAs Under Neutron-Induced Effects

Performances VS Reliability: how to exploit Approximate Computing for Safety-Critical applications

Voltage Scaling Influence on the Soft Error Susceptibility of a FinFET-based Circuit

Exploring the inherent fault tolerance of successive approximation algorithms under laser fault injection

Using majority logic to cope with long duration transient faults

Sleep Transistors to Improve the Process Variability and Soft Error Susceptibility

Register file criticality on embedded microprocessor reliability

Evaluating Network-on-Chip for Homogeneous Embedded Multiprocessors in FPGAs

Analyzing the impact of using pthreads versus OpenMP under fault injection in ARM Cortex-A9 dual-core

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