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Wafer-Scale Statistical Analysis of Graphene Field-Effect Transistors-Part II: Analysis of Device Properties

IEEE transactions on electron devices, 2017-09, Vol.64 (9), p.3927-3933

2017

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Wafer-Scale Statistical Analysis of Graphene FETs-Part I: Wafer-Scale Fabrication and Yield Analysis

IEEE transactions on electron devices, 2017-09, Vol.64 (9), p.3919-3926

2017

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Dependence of the colored frequency noise in spin torque oscillators on current and magnetic field

Applied physics letters, 2014-03, Vol.104 (9), p.92405

2014

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Ultrafast Metal‐Free Microsupercapacitor Arrays Directly Store Instantaneous High‐Voltage Electricity from Mechanical Energy Harvesters

Advanced science, 2024-06, Vol.11 (22), p.e2400697-n/a

2024

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3D Free-Form Patterning of Silicon by Ion Implantation, Silicon Deposition, and Selective Silicon Etching

Advanced functional materials, 2012-10, Vol.22 (19), p.4004-4008

2012

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Process considerations for layer-by-layer 3D patterning of silicon, using ion implantation, silicon deposition, and selective silicon etching

Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures, 2012-11, Vol.30 (6)

2012

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Germanium on Insulator Fabrication for Monolithic 3-D Integration

IEEE journal of the Electron Devices Society, 2018-01, Vol.6 (1), p.588-593

2018

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Low-frequency noise in high-k LaLuO3/TiN MOSFETs

Solid-state electronics, 2012-12, Vol.78, p.51-55

2012

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Ultrafast Pulsed I-V and Charge Pumping Interface Characterization of Low-Voltage n-Channel SiC MOSFETs

Materials science forum, 2020-07, Vol.1004, p.642-651

2020

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Order of magnitude improvement of nano-contact spin torque nano-oscillator performance

Nanoscale, 2017-02, Vol.9 (5), p.1896-19

2017

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Editorial Selected papers from the 15th Ultimate Integration on Silicon (ULIS) conference

Solid-state electronics, 2015-06, Vol.108, p.1-1

2015

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Order of magnitude improvement of nano-contact spin torque nano-oscillator performance

Nanoscale, 2017, Vol.9 (5), p.1896-1900

2017

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Bipolar integrated circuits in SiC for extreme environment operation

Semiconductor science and technology, 2017, Vol.32 (3), p.34002

2017

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ECL-Based SiC Logic Circuits for Extreme Temperatures

Materials science forum, 2015-06, Vol.821-823, p.910-913

2015

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Impact of intragrain spin wave reflections on nanocontact spin torque oscillators

Physical review. B, 2021-06, Vol.103 (21), Article 214433

2021

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Comprehensive and Macrospin-Based Magnetic Tunnel Junction Spin Torque Oscillator Model-Part I: Analytical Model of the MTJ STO

IEEE transactions on electron devices, 2015, Vol.62 (3), p.1037-1044

2015

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Integration of GMR-based spin torque oscillators and CMOS circuitry

Solid-state electronics, 2015-09, Vol.111, p.91-99

2015

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Influence of Dislocations on Low Frequency Noise in nMOSFETs Fabricated on Tensile Strained Virtual Substrates

Noise and Fluctuations (AIP Conference Proceedings Volume 922), 2007, Vol.922, p.133-136

2007

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Ge-profile design for improved linearity of SiGe double HBTs

IEEE electron device letters, 2002-01, Vol.23 (1), p.19-21

2002

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ALD high-k layer grating couplers for single and double slot on-chip SOI photonics

Solid-state electronics, 2012-08, Vol.74, p.58-63

2012

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Spin-Torque and Spin-Hall Nano-Oscillators

Proceedings of the IEEE, 2016-10, Vol.104 (10), p.1919-1945

2016

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Investigation of Current Gain Degradation in 4H-SiC Power BJTs

Materials science forum, 2012-05, Vol.717-720, p.1131-1134

2012

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High-Temperature Recessed Channel SiC CMOS Inverters and Ring Oscillators

IEEE electron device letters, 2019-05, Vol.40 (5), p.670-673

2019

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Impact of Random Grain Structure on Spin-Hall Nano-Oscillator Modal Stability

IEEE electron device letters, 2022-02, Vol.43 (2), p.312-315

2022

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Current Gain Degradation in 4H-SiC Power BJTs

Materials science forum, 2011-03, Vol.679-680, p.702-705

2011

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Wafer-Scale Statistical Analysis of Graphene Field-Effect Transistors-Part II: Analysis of Device Properties

Wafer-Scale Statistical Analysis of Graphene FETs-Part I: Wafer-Scale Fabrication and Yield Analysis

Dependence of the colored frequency noise in spin torque oscillators on current and magnetic field

Ultrafast Metal‐Free Microsupercapacitor Arrays Directly Store Instantaneous High‐Voltage Electricity from Mechanical Energy Harvesters

3D Free-Form Patterning of Silicon by Ion Implantation, Silicon Deposition, and Selective Silicon Etching

Process considerations for layer-by-layer 3D patterning of silicon, using ion implantation, silicon deposition, and selective silicon etching

Germanium on Insulator Fabrication for Monolithic 3-D Integration

Low-frequency noise in high-k LaLuO3/TiN MOSFETs

Ultrafast Pulsed I-V and Charge Pumping Interface Characterization of Low-Voltage n-Channel SiC MOSFETs

Order of magnitude improvement of nano-contact spin torque nano-oscillator performance

Editorial Selected papers from the 15th Ultimate Integration on Silicon (ULIS) conference

Order of magnitude improvement of nano-contact spin torque nano-oscillator performance

Bipolar integrated circuits in SiC for extreme environment operation

ECL-Based SiC Logic Circuits for Extreme Temperatures

Impact of intragrain spin wave reflections on nanocontact spin torque oscillators

Comprehensive and Macrospin-Based Magnetic Tunnel Junction Spin Torque Oscillator Model-Part I: Analytical Model of the MTJ STO

Integration of GMR-based spin torque oscillators and CMOS circuitry

Influence of Dislocations on Low Frequency Noise in nMOSFETs Fabricated on Tensile Strained Virtual Substrates

Ge-profile design for improved linearity of SiGe double HBTs

ALD high-k layer grating couplers for single and double slot on-chip SOI photonics

Spin-Torque and Spin-Hall Nano-Oscillators

Investigation of Current Gain Degradation in 4H-SiC Power BJTs

High-Temperature Recessed Channel SiC CMOS Inverters and Ring Oscillators

Impact of Random Grain Structure on Spin-Hall Nano-Oscillator Modal Stability

Current Gain Degradation in 4H-SiC Power BJTs

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