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IEEE transactions on nuclear science, 2017-08, Vol.64 (8), p.2179-2187
2017




2021 IEEE 12th Latin America Symposium on Circuits and System (LASCAS), 2021, p.1-4
2021

2016 16th European Conference on Radiation and Its Effects on Components and Systems (RADECS), 2016, p.1-5
2016


2013 26th Symposium on Integrated Circuits and Systems Design (SBCCI), 2013, p.1-6
2013
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IEEE transactions on nuclear science, 2011-12, Vol.58 (6), p.2768-2775
2011

IEEE MICRO, 2006-09, Vol.26 (5), p.10-18
2006

IEEE transactions on nuclear science, 2009-08, Vol.56 (4), p.1950-1957
2009

IEEE transactions on nuclear science, 2006-08, Vol.53 (4), p.2060-2068
2006

2006 IEEE International Test Conference, 2006, p.1-9
2006

IEEE design & test of computers, 2004-11, Vol.21 (6), p.552-562
2004

IEEE design & test of computers, 2007-07, Vol.24 (4), p.340-350
2007

2009 15th IEEE International On-Line Testing Symposium, 2009, p.101-106
2009

2011 12th European Conference on Radiation and Its Effects on Components and Systems, 2011, p.501-506
2011

2012 IEEE Computer Society Annual Symposium on VLSI, 2012, p.338-343
2012

2010 18th IEEE/IFIP International Conference on VLSI and System-on-Chip, 2010, p.298-303
2010

2011 12th European Conference on Radiation and Its Effects on Components and Systems, 2011, p.132-137
2011

12th IEEE International On-Line Testing Symposium (IOLTS'06), 2006, p.2 pp.
2006

2005 8th European Conference on Radiation and Its Effects on Components and Systems, 2005, p.J6-1-J6-8
2005

2008 European Conference on Radiation and Its Effects on Components and Systems, 2008, p.90-95
2008
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