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Evaluating Soft Core RISC-V Processor in SRAM-Based FPGA Under Radiation Effects
IEEE transactions on nuclear science, 2020-07, Vol.67 (7), p.1503-1510
2020
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Register File Criticality and Compiler Optimization Effects on Embedded Microprocessor Reliability
IEEE transactions on nuclear science, 2017-08, Vol.64 (8), p.2179-2187
2017
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S-SETA: Selective Software-Only Error-Detection Technique Using Assertions
IEEE transactions on nuclear science, 2015-12, Vol.62 (6), p.3088-3095
2015
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Single Event Transients in Logic Circuits-Load and Propagation Induced Pulse Broadening
IEEE transactions on nuclear science, 2008-12, Vol.55 (6), p.2928-2935
2008
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Reliability on ARM Processors Against Soft Errors Through SIHFT Techniques
IEEE transactions on nuclear science, 2016-08, Vol.63 (4), p.2208-2216
2016
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Failure Mechanism and Sampling Frequency Dependency on TID Response of SAR ADCs
Journal of electronic testing, 2021-06, Vol.37 (3), p.329-343
2021
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Reducing Soft Error Rate of SoCs Analog-to-Digital Interfaces With Design Diversity Redundancy
IEEE transactions on nuclear science, 2020-03, Vol.67 (3), p.518-524
2020
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Circuit design using Schmitt Trigger to reliability improvement
Microelectronics and reliability, 2020-11, Vol.114, p.113754, Article 113754
2020
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Investigating the reliability impacts of neutron-induced soft errors in aerial image classification CNNs implemented in a softcore SRAM-based FPGA GPU
Microelectronics and reliability, 2022-11, Vol.138, p.114738, Article 114738
2022
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Reliability Calculation With Respect to Functional Failures Induced by Radiation in TMR Arm Cortex-M0 Soft-Core Embedded Into SRAM-Based FPGA
IEEE transactions on nuclear science, 2019-07, Vol.66 (7), p.1433-1440
2019
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Mitigation of process variability effects using decoupling cells
Microelectronics and reliability, 2019-09, Vol.100-101, p.113446, Article 113446
2019
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Measuring Failure Probability of Coarse and Fine Grain TMR Schemes in SRAM-based FPGAs Under Neutron-Induced Effects
Applied Reconfigurable Computing, p.331-338
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Analyzing the Influence of the Angles of Incidence and Rotation on MBU Events Induced by Low LET Heavy Ions in a 28-nm SRAM-Based FPGA
IEEE transactions on nuclear science, 2017-08, Vol.64 (8), p.2161-2168
2017
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Detecting SEEs in Microprocessors Through a Non-Intrusive Hybrid Technique
IEEE transactions on nuclear science, 2011-06, Vol.58 (3), p.993-1000
2011
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Analyzing the Impact of Single-Event-Induced Charge Sharing in Complex Circuits
IEEE transactions on nuclear science, 2011-12, Vol.58 (6), p.2768-2775
2011
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A High-Fault-Coverage Approach for the Test of Data, Control and Handshake Interconnects in Mesh Networks-on-Chip
IEEE transactions on computers, 2008-09, Vol.57 (9), p.1202-1215
2008
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Voltage scaling and aging effects on soft error rate in SRAM-based FPGAs
Microelectronics and reliability, 2014-09, Vol.54 (9-10), p.2344-2348
2014
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Using Bulk Built-in Current Sensors to Detect Soft Errors
IEEE MICRO, 2006-09, Vol.26 (5), p.10-18
2006
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Reconfigurable Routers for Low Power and High Performance
IEEE transactions on very large scale integration (VLSI) systems, 2011-11, Vol.19 (11), p.2045-2057
2011
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Tbulk-BICS: A Built-In Current Sensor Robust to Process and Temperature Variations for Soft Error Detection
IEEE transactions on nuclear science, 2008-08, Vol.55 (4), p.2281-2288
2008
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A Self-Checking Scheme to Mitigate Single Event Upset Effects in SRAM-Based FPAAs
IEEE transactions on nuclear science, 2009-08, Vol.56 (4), p.1950-1957
2009
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Improving Reliability of SRAM-Based FPGAs by Inserting Redundant Routing
IEEE transactions on nuclear science, 2006-08, Vol.53 (4), p.2060-2068
2006
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Exploiting Idle Hardware to Provide Low Overhead Fault Tolerance for VLIW Processors
ACM journal on emerging technologies in computing systems, 2017-04, Vol.13 (2), p.1-21
2017
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TID in Flash-Based FPGA: Power Supply-Current Rise and Logic Function Mapping Effects in Propagation-Delay Degradation
IEEE transactions on nuclear science, 2011-08, Vol.58 (4), p.1927-1934
2011
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Exploring Performance Overhead Versus Soft Error Detection in Lockstep Dual-Core ARM Cortex-A9 Processor Embedded into Xilinx Zynq APSoC
Applied Reconfigurable Computing, p.189-201
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