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Efficient Statistical Parameter Selection for Nonlinear Modeling of Process/Performance Variation
IEEE transactions on computer-aided design of integrated circuits and systems, 2016-12, Vol.35 (12), p.1995-2007
2016
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CIRCA: Towards a modular and extensible framework for approximate circuit generation
Microelectronics and reliability, 2019-08, Vol.99, p.277-290
2019
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A Fault-Tolerant Ripple-Carry Adder with Controllable-Polarity Transistors
ACM journal on emerging technologies in computing systems, 2017-04, Vol.13 (2), p.1-13
2017
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Sub-threshold charge recovery circuits
2010 IEEE International Conference on Computer Design, 2010, p.138-144
2010
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DeepWind: An Accurate Wind Turbine Condition Monitoring Framework via Deep Learning on Embedded Platforms
2020 25th IEEE International Conference on Emerging Technologies and Factory Automation (ETFA), 2020, Vol.1, p.1431-1434
2020
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From Defect Analysis to Gate-Level Fault Modeling of Controllable-Polarity Silicon Nanowires
IEEE transactions on nanotechnology, 2015-11, Vol.14 (6), p.1117-1126
2015
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FLight: FPGA Acceleration of Lightweight DNN Model Inference in Industrial Analytics
Machine Learning and Principles and Practice of Knowledge Discovery in Databases, p.351-362
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Fault modeling in controllable polarity silicon nanowire circuits
2015 Design, Automation & Test in Europe Conference & Exhibition (DATE), 2015, p.453-458
2015
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A fast TCAD-based methodology for Variation analysis of emerging nano-devices
2013 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFTS), 2013, p.83-88
2013
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An MCTS-based Framework for Synthesis of Approximate Circuits
2018 IFIP/IEEE International Conference on Very Large Scale Integration (VLSI-SoC), 2018, p.219-224
2018
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Fast process variation analysis in nano-scaled technologies using column-wise sparse parameter selection
Proceedings of the 2014 IEEE/ACM International Symposium on nanoscale architectures, 2014, p.163-168
2014
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A cost-effective error detection and roll-back recovery technique for embedded microprocessor control logic
2008 International Conference on Microelectronics, 2008, p.470-473
2008
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Analysis of Macular Thickness Deviation Maps for Diagnosis of Glaucoma
Advances in Visual Computing, p.53-64
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Design Space Exploration for Hardware Acceleration of Machine Learning Applications in MapReduce
2018 IEEE 26th Annual International Symposium on Field-Programmable Custom Computing Machines (FCCM), 2018, p.221-221
2018
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