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Soft error interception latch: double node charge sharing SEU tolerant design

Electronics letters, 2015-02, Vol.51 (4), p.330-332

2015

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Soft Error Susceptibilities of 22 nm Tri-Gate Devices

IEEE transactions on nuclear science, 2012-12, Vol.59 (6), p.2666-2673

2012

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Novel Speed-and-Power-Optimized SRAM Cell Designs With Enhanced Self-Recoverability From Single- and Double-Node Upsets

IEEE transactions on circuits and systems. I, Regular papers, 2020-12, Vol.67 (12), p.4684-4695

2020

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Impact of Irradiation Side on Muon-Induced Single Event Upsets in 65-nm Bulk SRAMs

IEEE transactions on nuclear science, 2024-04, Vol.71 (4), p.1-1

2024

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Temperature-Constrained Reliability Optimization of Industrial Cyber-Physical Systems Using Machine Learning and Feedback Control

IEEE transactions on automation science and engineering, 2023-01, Vol.20 (1), p.20-31

2023

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Using Benchmarks for Radiation Testing of Microprocessors and FPGAs

IEEE transactions on nuclear science, 2015-12, Vol.62 (6), p.2547-2554

2015

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Soft Error Reliability of VLSI Circuits: Analysis and Mitigation Techniques

1st Edition 2021, 2020

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Eff-ECC: Protecting GPGPUs Register File With a Unified Energy-Efficient ECC Mechanism

IEEE transactions on computer-aided design of integrated circuits and systems, 2022-07, Vol.41 (7), p.2080-2093

2022

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Design of Soft-Error-Aware SRAM With Multi-Node Upset Recovery for Aerospace Applications

IEEE transactions on circuits and systems. I, Regular papers, 2021-06, Vol.68 (6), p.2470-2480

2021

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Enhancing Neural Network Reliability: Insights From Hardware/Software Collaboration With Neuron Vulnerability Quantization

IEEE transactions on computers, 2024-08, Vol.73 (8), p.1953-1966

2024

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Dependable Scheduling for Real-Time Workflows on Cyber-Physical Cloud Systems

IEEE transactions on industrial informatics, 2021-11, Vol.17 (11), p.7820-7829

2021

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Using Machine Learning Techniques to Evaluate Multicore Soft Error Reliability

IEEE transactions on circuits and systems. I, Regular papers, 2019-06, Vol.66 (6), p.2151-2164

2019

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Half-Select-Free Low-Power Dynamic Loop-Cutting Write Assist SRAM Cell for Space Applications

IEEE transactions on electron devices, 2020-01, Vol.67 (1), p.80-89

2020

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Quadruple Cross-Coupled Latch-Based 10T and 12T SRAM Bit-Cell Designs for Highly Reliable Terrestrial Applications

IEEE transactions on circuits and systems. I, Regular papers, 2019-03, Vol.66 (3), p.967-977

2019

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A Robust Hardened Latch Featuring Tolerance to Double-Node-Upset in 28nm CMOS for Spaceborne Application

IEEE transactions on circuits and systems. II, Express briefs, 2020-09, Vol.67 (9), p.1619-1623

2020

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A software implemented comprehensive soft error detection method for embedded systems

Microprocessors and microsystems, 2020-09, Vol.77, p.103161, Article 103161

2020

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Soft-Error-Immune Read-Stability-Improved SRAM for Multi-Node Upset Tolerance in Space Applications

IEEE transactions on circuits and systems. I, Regular papers, 2021-08, Vol.68 (8), p.3317-3327

2021

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Online Resource Management for Improving Reliability of Real-Time Systems on "Big-Little" Type MPSoCs

IEEE transactions on computer-aided design of integrated circuits and systems, 2020-01, Vol.39 (1), p.88-100

2020

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DMBF: Design Metrics Balancing Framework for Soft-Error-Tolerant Digital Circuits Through Bayesian Optimization

IEEE transactions on circuits and systems. I, Regular papers, 2023-10, Vol.70 (10), p.1-13

2023

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Frequency Dependency of Soft Error Rates Based on Dynamic Soft Error Measurements

2023 International Conference on IC Design and Technology (ICICDT), 2023, p.68-71

2023

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Transistor Width Effect on the Power Supply Voltage Dependence of α-SER in CMOS 6T SRAM

IEEE transactions on nuclear science, 2020-05, Vol.67 (5), p.811-817

2020

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Applying Lightweight Soft Error Mitigation Techniques to Embedded Mixed Precision Deep Neural Networks

IEEE transactions on circuits and systems. I, Regular papers, 2021-11, Vol.68 (11), p.4772-4782

2021

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Transition Detector-Based Radiation-Hardened Latch for Both Single- and Multiple-Node Upsets

IEEE transactions on circuits and systems. II, Express briefs, 2020-06, Vol.67 (6), p.1114-1118

2020

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Mitigating Process Variability and Soft Errors at Circuit-Level for FinFETs

1st Edition 2021, 2021

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A 14T radiation hardened SRAM for space applications with high reliability

International journal of circuit theory and applications, 2024-06, Vol.52 (6), p.2956-2970

2024

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Soft error interception latch: double node charge sharing SEU tolerant design

Soft Error Susceptibilities of 22 nm Tri-Gate Devices

Novel Speed-and-Power-Optimized SRAM Cell Designs With Enhanced Self-Recoverability From Single- and Double-Node Upsets

Impact of Irradiation Side on Muon-Induced Single Event Upsets in 65-nm Bulk SRAMs

Temperature-Constrained Reliability Optimization of Industrial Cyber-Physical Systems Using Machine Learning and Feedback Control

Using Benchmarks for Radiation Testing of Microprocessors and FPGAs

Soft Error Reliability of VLSI Circuits: Analysis and Mitigation Techniques

Eff-ECC: Protecting GPGPUs Register File With a Unified Energy-Efficient ECC Mechanism

Design of Soft-Error-Aware SRAM With Multi-Node Upset Recovery for Aerospace Applications

Enhancing Neural Network Reliability: Insights From Hardware/Software Collaboration With Neuron Vulnerability Quantization

Dependable Scheduling for Real-Time Workflows on Cyber-Physical Cloud Systems

Using Machine Learning Techniques to Evaluate Multicore Soft Error Reliability

Half-Select-Free Low-Power Dynamic Loop-Cutting Write Assist SRAM Cell for Space Applications

Quadruple Cross-Coupled Latch-Based 10T and 12T SRAM Bit-Cell Designs for Highly Reliable Terrestrial Applications

A Robust Hardened Latch Featuring Tolerance to Double-Node-Upset in 28nm CMOS for Spaceborne Application

A software implemented comprehensive soft error detection method for embedded systems

Soft-Error-Immune Read-Stability-Improved SRAM for Multi-Node Upset Tolerance in Space Applications

Online Resource Management for Improving Reliability of Real-Time Systems on "Big-Little" Type MPSoCs

DMBF: Design Metrics Balancing Framework for Soft-Error-Tolerant Digital Circuits Through Bayesian Optimization

Frequency Dependency of Soft Error Rates Based on Dynamic Soft Error Measurements

Transistor Width Effect on the Power Supply Voltage Dependence of α-SER in CMOS 6T SRAM

Applying Lightweight Soft Error Mitigation Techniques to Embedded Mixed Precision Deep Neural Networks

Transition Detector-Based Radiation-Hardened Latch for Both Single- and Multiple-Node Upsets

Mitigating Process Variability and Soft Errors at Circuit-Level for FinFETs

A 14T radiation hardened SRAM for space applications with high reliability

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