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Quantification of Silane Molecules on Oxidized Silicon: Are there Options for a Traceable and Absolute Determination?

Analytical chemistry (Washington), 2015-10, Vol.87 (19), p.10117-10124

2015

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Approaches to calculate the dielectric function of ZnO around the band gap

Thin solid films, 2014-11, Vol.571, p.684-688

2014

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Comparison of techniques for detecting metal contamination in silicon wafers

Spectrochimica acta. Part B: Atomic spectroscopy, 2018-11, Vol.149, p.313-321

2018

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A comparative analysis of different measurement techniques to monitor metal and organic contamination in silicon device processing

Physica status solidi. A, Applications and materials science, 2015-03, Vol.212 (3), p.495-505

2015

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Associations between the Presence and Magnitude of Escherichia coli O157 in Feces at Harvest and Contamination of Preintervention Beef Carcasses

Journal of food protection, 2008-09, Vol.71 (9), p.1761-1767

2008

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Validation of a traditional Italian-style salami manufacturing process for control of Salmonella and Listeria monocytogenes

Journal of food protection, 2006-04, Vol.69 (4), p.794-800

2006

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Comparative measurements on atomic layer deposited Al2O3 thin films using ex situ table top and mapping ellipsometry, as well as X-ray and VUV reflectometry

Thin solid films, 2013-08, Vol.541, p.131-135

2013

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XPS study of MoO3 and WO3 oxide surface modification by low-energy Ar+ ion bombardment

Physica status solidi. C, 2015-03, Vol.12 (3), p.263-266

Alov, Nikolai V.

2015

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Expanded beam (macro-imaging) ellipsometry

Thin solid films, 2011-02, Vol.519 (9), p.2730-2736

2011

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An X-ray photoelectron spectroscopy study of ultra-thin oxynitride films

Thin solid films, 2011-11, Vol.520 (2), p.871-875

2011

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Characterization of ZnO structures by optical and X-ray methods

Applied surface science, 2013-09, Vol.281, p.123-128

2013

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Control current stress technique for the investigation of gate dielectrics of MIS devices

Physica status solidi. C, 2015-03, Vol.12 (3), p.299-303

2015

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Influence of the excitation energy on absorption effects in Total Reflection X-ray Fluorescence analysis

Journal of analytical atomic spectrometry, 2012-02, Vol.27 (2), p.34-345

2012

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Towards single-trap spectroscopy: Generation-recombination noise in UTBOX SOI nMOSFETs

Physica status solidi. C, 2015-03, Vol.12 (3), p.292-298

2015

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Near ambient pressure photoemission spectroscopy of metal and semiconductor surfaces

Physica status solidi. C, 2015-03, Vol.12 (3), p.259-262

2015

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Multi-angle spectroscopic extreme ultraviolet reflectometry for analysis of thin films and interfaces

Physica status solidi. C, 2015-03, Vol.12 (3), p.318-322

2015

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Efficacy of cetylpyridinium chloride against Listeria monocytogenes and its influence on color and texture of cooked roast beef

Journal of food protection, 2005-11, Vol.68 (11), p.2349-2355

2005

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Characterization of TiO2 antireflection coatings elaborated by APCVD for monocrystalline silicon solar cells

Physica status solidi. C, 2015-03, Vol.12 (3), p.323-326

2015

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Synthesis and utilization of LaVO4:Eu3+ nanoparticles as fluorescent near-field optical sensors

Physica status solidi. C, 2015-03, Vol.12 (3), p.282-286

2015

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Comparison of steam pasteurization and other methods for reduction of pathogens on surfaces of freshly slaughtered beef

Journal of food protection, 1997-05, Vol.60 (5), p.476-484

1997

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Accurate measurement of atomic segregation to grain boundaries or to planar faults by analytical transmission electron microscopy

Physica status solidi. C, 2015-03, Vol.12 (3), p.310-313

Walther, Thomas

2015

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Chemical Mechanical Planarization (CMP) Metrology for 45/32 nm Technology Generations

AIP conference proceedings, 2007, Vol.931 (1), p.173-177

2007

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Ga+ implantation in a PZT film during focused ion beam micro-machining

Physica status solidi. C, 2015-03, Vol.12 (3), p.314-317

2015

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Micro-Raman spectroscopy as a complementary technique to high resolution X-ray diffraction for the characterization of Si1-xGex thin layers

Physica status solidi. C, 2015-03, Vol.12 (3), p.304-309

2015

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Dimensional and defectivity nanometrology of directed self-assembly patterns

Physica status solidi. C, 2015-03, Vol.12 (3), p.267-270

2015

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Quantification of Silane Molecules on Oxidized Silicon: Are there Options for a Traceable and Absolute Determination?

Approaches to calculate the dielectric function of ZnO around the band gap

Comparison of techniques for detecting metal contamination in silicon wafers

A comparative analysis of different measurement techniques to monitor metal and organic contamination in silicon device processing

Associations between the Presence and Magnitude of Escherichia coli O157 in Feces at Harvest and Contamination of Preintervention Beef Carcasses

Validation of a traditional Italian-style salami manufacturing process for control of Salmonella and Listeria monocytogenes

Comparative measurements on atomic layer deposited Al2O3 thin films using ex situ table top and mapping ellipsometry, as well as X-ray and VUV reflectometry

XPS study of MoO3 and WO3 oxide surface modification by low-energy Ar+ ion bombardment

Expanded beam (macro-imaging) ellipsometry

An X-ray photoelectron spectroscopy study of ultra-thin oxynitride films

Characterization of ZnO structures by optical and X-ray methods

Control current stress technique for the investigation of gate dielectrics of MIS devices

Influence of the excitation energy on absorption effects in Total Reflection X-ray Fluorescence analysis

Towards single-trap spectroscopy: Generation-recombination noise in UTBOX SOI nMOSFETs

Near ambient pressure photoemission spectroscopy of metal and semiconductor surfaces

Multi-angle spectroscopic extreme ultraviolet reflectometry for analysis of thin films and interfaces

Efficacy of cetylpyridinium chloride against Listeria monocytogenes and its influence on color and texture of cooked roast beef

Characterization of TiO2 antireflection coatings elaborated by APCVD for monocrystalline silicon solar cells

Synthesis and utilization of LaVO4:Eu3+ nanoparticles as fluorescent near-field optical sensors

Comparison of steam pasteurization and other methods for reduction of pathogens on surfaces of freshly slaughtered beef

Accurate measurement of atomic segregation to grain boundaries or to planar faults by analytical transmission electron microscopy

Chemical Mechanical Planarization (CMP) Metrology for 45/32 nm Technology Generations

Ga+ implantation in a PZT film during focused ion beam micro-machining

Micro-Raman spectroscopy as a complementary technique to high resolution X-ray diffraction for the characterization of Si1-xGex thin layers

Dimensional and defectivity nanometrology of directed self-assembly patterns

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