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SI traceable characterisation of nanomaterials by X-ray spectrometry

IOP conference series. Materials Science and Engineering, 2020-07, Vol.891 (1), p.12003

Beckhoff, B

2020

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In-line characterization of ultrathin transition metal dichalcogenides using X-ray fluorescence and X-ray photoelectron spectroscopy

Spectrochimica acta. Part B: Atomic spectroscopy, 2020-04, Vol.166, p.105788, Article 105788

2020

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A novel instrument for quantitative nanoanalytics involving complementary X-ray methodologies

Review of scientific instruments, 2013-04, Vol.84 (4), p.045106-045106

2013

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Quantification of Silane Molecules on Oxidized Silicon: Are there Options for a Traceable and Absolute Determination?

Analytical chemistry (Washington), 2015-10, Vol.87 (19), p.10117-10124

2015

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Experimental determination of the oxygen K-shell fluorescence yield using thin SiO2 and Al2O3 foils

Spectrochimica acta. Part B: Atomic spectroscopy, 2016-10, Vol.124, p.94-98

2016

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Approaches to calculate the dielectric function of ZnO around the band gap

Thin solid films, 2014-11, Vol.571, p.684-688

2014

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Thermal stability and relaxation mechanisms in compressively strained Ge0.94Sn0.06 thin films grown by molecular beam epitaxy

Journal of applied physics, 2016-08, Vol.120 (8)

2016

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Association between one’s own consumption and harm from others’ drinking: Does education play a role?

Scandinavian journal of public health, 2022-03, Vol.50 (2), p.205-214

2022

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Experimental determination of the x-ray atomic fundamental parameters of nickel

Metrologia, 2018-02, Vol.55 (1), p.56-66

2018

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Ion beam analysis of Cu(In,Ga)Se2 thin film solar cells

Applied surface science, 2015-11, Vol.356, p.631-638

2015

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High accuracy experimental determination of copper and zinc mass attenuation coefficients in the 100 eV to 30 keV photon energy range

Metrologia, 2016-02, Vol.53 (1), p.7-17

2016

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A combined experimental and theoretical approach to determine X‐ray atomic fundamental quantities of tin

X-ray spectrometry, 2018-09, Vol.47 (5), p.341-351

2018

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CASTOR, a new instrument for combined XRR‐GIXRF analysis at SOLEIL

X-ray spectrometry, 2017-09, Vol.46 (5), p.303-308

2017

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Proton induced quasi-monochromatic x-ray beams for soft x-ray spectroscopy studies and selective x-ray fluorescence analysis

Review of scientific instruments, 2012-12, Vol.83 (12), p.123102-123102

2012

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Characterization of iron-gall inks in historical manuscripts and music compositions using x-ray fluorescence spectrometry

X-ray spectrometry, 2004-07, Vol.33 (4), p.234-239

2004

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Characterization of ultra-shallow aluminum implants in silicon by grazing incidence and grazing emission X-ray fluorescence spectroscopy

Journal of analytical atomic spectrometry, 2012-01, Vol.27 (9), p.1432-1438

2012

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Characterization of ZnO structures by optical and X-ray methods

Applied surface science, 2013-09, Vol.281, p.123-128

2013

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S-passivation of the Ge gate stack: Tuning the gate stack properties by changing the atomic layer deposition oxidant precursor

Journal of applied physics, 2011-10, Vol.110 (8), p.084907-084907-8

2011

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In-depth elemental characterization of Cu(In,Ga)Se2 thin film solar cells by means of RBS and PIXE techniques

Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 2014-07, Vol.331, p.93-95

2014

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Grazing incidence x-ray fluorescence and secondary ion mass spectrometry combined approach for the characterization of ultrashallow arsenic distribution in silicon

Journal of vacuum science and technology. B, Nanotechnology & microelectronics, 2010-01, Vol.28 (1), p.C1-C1C64

2010

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Elemental depth profiling of Cu(In,Ga)Se2 thin films by reference-free grazing incidence X-ray fluorescence analysis

Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 2010-02, Vol.268 (3-4), p.277-281

2010

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Ultralow energy boron implants in silicon characterization by nonoxidizing secondary ion mass spectrometry analysis and soft x-ray grazing incidence x-ray fluorescence techniques

Journal of vacuum science and technology. B, Nanotechnology & microelectronics, 2010-01, Vol.28 (1), p.C1-C1C89

2010

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Evaluation of High-Resolution X-ray Absorption and Emission Spectroscopy for the Chemical Speciation of Binary Titanium Compounds

Analytical chemistry (Washington), 2009-03, Vol.81 (5), p.1770-1776

2009

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Atomic layer deposition of Al2O3 on S-passivated Ge

Microelectronic engineering, 2011-07, Vol.88 (7), p.1553-1556

2011

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GIXRF–NEXAFS investigations on buried ZnO/Si interfaces: A first insight in changes of chemical states due to annealing of the specimen

Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 2010-02, Vol.268 (3), p.370-373

2010

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SI traceable characterisation of nanomaterials by X-ray spectrometry

In-line characterization of ultrathin transition metal dichalcogenides using X-ray fluorescence and X-ray photoelectron spectroscopy

A novel instrument for quantitative nanoanalytics involving complementary X-ray methodologies

Quantification of Silane Molecules on Oxidized Silicon: Are there Options for a Traceable and Absolute Determination?

Experimental determination of the oxygen K-shell fluorescence yield using thin SiO2 and Al2O3 foils

Approaches to calculate the dielectric function of ZnO around the band gap

Thermal stability and relaxation mechanisms in compressively strained Ge0.94Sn0.06 thin films grown by molecular beam epitaxy

Association between one’s own consumption and harm from others’ drinking: Does education play a role?

Experimental determination of the x-ray atomic fundamental parameters of nickel

Ion beam analysis of Cu(In,Ga)Se2 thin film solar cells

High accuracy experimental determination of copper and zinc mass attenuation coefficients in the 100 eV to 30 keV photon energy range

A combined experimental and theoretical approach to determine X‐ray atomic fundamental quantities of tin

CASTOR, a new instrument for combined XRR‐GIXRF analysis at SOLEIL

Proton induced quasi-monochromatic x-ray beams for soft x-ray spectroscopy studies and selective x-ray fluorescence analysis

Characterization of iron-gall inks in historical manuscripts and music compositions using x-ray fluorescence spectrometry

Characterization of ultra-shallow aluminum implants in silicon by grazing incidence and grazing emission X-ray fluorescence spectroscopy

Characterization of ZnO structures by optical and X-ray methods

S-passivation of the Ge gate stack: Tuning the gate stack properties by changing the atomic layer deposition oxidant precursor

In-depth elemental characterization of Cu(In,Ga)Se2 thin film solar cells by means of RBS and PIXE techniques

Grazing incidence x-ray fluorescence and secondary ion mass spectrometry combined approach for the characterization of ultrashallow arsenic distribution in silicon

Elemental depth profiling of Cu(In,Ga)Se2 thin films by reference-free grazing incidence X-ray fluorescence analysis

Ultralow energy boron implants in silicon characterization by nonoxidizing secondary ion mass spectrometry analysis and soft x-ray grazing incidence x-ray fluorescence techniques

Evaluation of High-Resolution X-ray Absorption and Emission Spectroscopy for the Chemical Speciation of Binary Titanium Compounds

Atomic layer deposition of Al2O3 on S-passivated Ge

GIXRF–NEXAFS investigations on buried ZnO/Si interfaces: A first insight in changes of chemical states due to annealing of the specimen

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