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Nanoscale electro-thermal interactions in AlGaN/GaN high electron mobility transistors

Journal of applied physics, 2020-01, Vol.127 (4)

2020

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Transient Thermal Characterization of AlGaN/GaN HEMTs Under Pulsed Biasing

IEEE transactions on electron devices, 2018-05, Vol.65 (5), p.1753-1758

2018

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Sub-Micron Thermal Imaging Characterization of GaN HEMT and MMIC Devices

2015 IEEE Compound Semiconductor Integrated Circuit Symposium (CSICS), 2015, p.1-4

2015

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Dynamic Temperature Measurements of a GaN DC-DC Boost Converter at MHz Frequencies

IEEE transactions on power electronics, 2020-08, Vol.35 (8), p.8303-8310

2020

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High-Speed Thermal Imaging Can Resolve Short RF Pulse Effects in Tissue Models

IEEE journal of electromagnetics, RF and microwaves in medicine and biology, 2024, p.1-5

2024

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Thermal Performance of GaN/Si HEMTs Using Near-Bandgap Thermoreflectance Imaging

IEEE transactions on electron devices, 2020-03, Vol.67 (3), p.822-827

2020

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Dual Mode Split Ring Resonator Sensing and Hyperthermia Array for Skin

IEEE journal of electromagnetics, RF and microwaves in medicine and biology, 2024, p.1-7

2024

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Deep-Ultraviolet Thermoreflectance Thermal Imaging of GaN High Electron Mobility Transistors

2022 21st IEEE Intersociety Conference on Thermal and Thermomechanical Phenomena in Electronic Systems (iTherm), 2022, p.1-5

2022

Volltextzugriff (PDF)

Hyperspectral thermoreflectance imaging for power devices

2017 33rd Thermal Measurement, Modeling & Management Symposium (SEMI-THERM), 2017, p.204-207

2017

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Submicron local and time-dependent thermal resistance characterization of GaN HEMTs

2018 34th Thermal Measurement, Modeling & Management Symposium (SEMI-THERM), 2018, p.165-169

2018

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High Resolution Thermal Characterization and Simulation of Power AlGaN/GaN HEMTs Using Micro-Raman Thermography and 800 Picosecond Transient Thermoreflectance Imaging

2014 IEEE Compound Semiconductor Integrated Circuit Symposium (CSICS), 2014, p.1-8

2014

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Observation of current filaments in IGBTs with thermoreflectance microscopy

2018 IEEE 30th International Symposium on Power Semiconductor Devices and ICs (ISPSD), 2018, p.164-167

2018

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High resolution thermal characterization of a GaAs MMIC

2015 IEEE Radio Frequency Integrated Circuits Symposium (RFIC), 2015, p.51-54

2015

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Intrinsic transient thermal response of GaN HEMT

2016 IEEE MTT-S International Microwave Symposium (IMS), 2016, p.1-3

2016

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Thermal imaging characterization for high frequency and high power devices

2015 International Conference on Electronics Packaging and iMAPS All Asia Conference (ICEP-IAAC), 2015, p.395-400

2015

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Transient thermal characterization of HEMT devices

2014 IEEE MTT-S International Microwave Symposium (IMS2014), 2014, p.1-4

2014

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Stable thermoreflectance thermal imaging microscopy with piezoelectric position control

2016 32nd Thermal Measurement, Modeling & Management Symposium (SEMI-THERM), 2016, p.128-132

2016

Volltextzugriff (PDF)

Thermal imaging of encapsulated LEDs

2011 27th Annual IEEE Semiconductor Thermal Measurement and Management Symposium, 2011, p.310-313

2011

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High speed thermal characterization of ESD protection devices

2014 Semiconductor Thermal Measurement and Management Symposium (SEMI-THERM), 2014, p.90-93

2014

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Transient thermal measurement and behavior of integrated circuits

29th IEEE Semiconductor Thermal Measurement and Management Symposium, 2013, p.206-210

2013

Volltextzugriff (PDF)

Sub-diffraction limit thermal imaging for HEMT devices

2015 31st Thermal Measurement, Modeling & Management Symposium (SEMI-THERM), 2015, p.82-87

2015

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Temperature sensitivity and noise in thermoreflectance thermal imaging

2015 31st Thermal Measurement, Modeling & Management Symposium (SEMI-THERM), 2015, p.216-220

2015

Volltextzugriff (PDF)

Nanosecond transient thermoreflectance imaging of snapback in semiconductor controlled rectifiers

2011 International Reliability Physics Symposium, 2011, p.EL.4.1-EL.4.6

2011

Volltextzugriff (PDF)

Side-by-side comparison between infrared and thermoreflectance imaging using a thermal test chip with embedded diode temperature sensors

2012 28th Annual IEEE Semiconductor Thermal Measurement and Management Symposium (SEMI-THERM), 2012, p.344-347

2012

Volltextzugriff (PDF)

Fast transient and steady state thermal imaging of CMOS integrated circuit chips considering package thermal boundaries

13th InterSociety Conference on Thermal and Thermomechanical Phenomena in Electronic Systems, 2012, p.1405-1411

2012

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Nanoscale electro-thermal interactions in AlGaN/GaN high electron mobility transistors

Transient Thermal Characterization of AlGaN/GaN HEMTs Under Pulsed Biasing

Sub-Micron Thermal Imaging Characterization of GaN HEMT and MMIC Devices

Dynamic Temperature Measurements of a GaN DC-DC Boost Converter at MHz Frequencies

High-Speed Thermal Imaging Can Resolve Short RF Pulse Effects in Tissue Models

Thermal Performance of GaN/Si HEMTs Using Near-Bandgap Thermoreflectance Imaging

Dual Mode Split Ring Resonator Sensing and Hyperthermia Array for Skin

Deep-Ultraviolet Thermoreflectance Thermal Imaging of GaN High Electron Mobility Transistors

Hyperspectral thermoreflectance imaging for power devices

Submicron local and time-dependent thermal resistance characterization of GaN HEMTs

High Resolution Thermal Characterization and Simulation of Power AlGaN/GaN HEMTs Using Micro-Raman Thermography and 800 Picosecond Transient Thermoreflectance Imaging

Observation of current filaments in IGBTs with thermoreflectance microscopy

High resolution thermal characterization of a GaAs MMIC

Intrinsic transient thermal response of GaN HEMT

Thermal imaging characterization for high frequency and high power devices

Transient thermal characterization of HEMT devices

Stable thermoreflectance thermal imaging microscopy with piezoelectric position control

Thermal imaging of encapsulated LEDs

High speed thermal characterization of ESD protection devices

Transient thermal measurement and behavior of integrated circuits

Sub-diffraction limit thermal imaging for HEMT devices

Temperature sensitivity and noise in thermoreflectance thermal imaging

Nanosecond transient thermoreflectance imaging of snapback in semiconductor controlled rectifiers

Side-by-side comparison between infrared and thermoreflectance imaging using a thermal test chip with embedded diode temperature sensors

Fast transient and steady state thermal imaging of CMOS integrated circuit chips considering package thermal boundaries

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