Sortiert nach
Applied physics letters, 2015-08, Vol.107 (9)
2015
Link zum Volltext
IEEE transactions on electron devices, 2018-11, Vol.65 (11), p.5165-5171
- Vandooren, A.
- Franco, J.
- Parvais, B.
- Wu, Z.
- Witters, L.
- Walke, A.
- Li, W.
- Peng, L.
- Deshpande, V.
- Bufler, F. M.
- Rassoul, N.
- Hellings, G.
- Jamieson, G.
- Inoue, F.
- Verbinnen, G.
- Devriendt, K.
- Teugels, L.
- Heylen, N.
- Vecchio, E.
- Zheng, T.
- Rosseel, E.
- Vanherle, W.
- Hikavyy, A.
- Chan, B. T.
- Ritzenthaler, R.
- Besnard, G.
- Schwarzenbach, W.
- Gaudin, G.
- Radu, I.
- Nguyen, B.-Y.
- Waldron, N.
- De Heyn, V.
- Mocuta, D.
- Collaert, N.
2018
- Link zum Volltext
Microelectronic engineering, 2011-05, Vol.88 (5), p.690-693
2011
Link zum Volltext
Microelectronic engineering, 2007-11, Vol.84 (11), p.2620-2623
2007
Link zum Volltext
2021 IEEE International Electron Devices Meeting (IEDM), 2021, p.22.5.1-22.5.4
- Gupta, A.
- Radisic, D.
- Maes, J. W.
- Pedreira, O. Varela
- Soulie, J-P.
- Jourdan, N.
- Mertens, H.
- Bandyopadhyay, S.
- Le, Q. T.
- Pacco, A.
- Heylen, N.
- Vandersmissen, K.
- Devriendt, K.
- Zhu, C.
- Datta, S.
- Sebaai, F.
- Wang, S.
- Mousa, M.
- Lee, J.
- Geypen, J.
- De Wachter, B.
- Chehab, B.
- Salahuddin, S. M.
- Murdoch, G.
- Biesemans, S.
- Tokei, Zs
- Litta, E. Dentoni
- Horiguchi, N.
2021
- Link zum Volltext
International journal of oncology, 2002-04, Vol.20 (4), p.761
2002
Link zum Volltext
2010 Symposium on VLSI Technology, 2010, p.109-110
- Mercha, A
- Redolfi, A
- Stucchi, M
- Minas, N
- Van Olmen, J
- Thangaraju, S
- Velenis, D
- Domae, S
- Yang, Y
- Katti, G
- Labie, R
- Okoro, C
- Zhao, M
- Asimakopoulos, P
- De Wolf, I
- Chiarella, T
- Schram, T
- Rohr, E
- Van Ammel, A
- Jourdain, A
- Ruythooren, W
- Armini, S
- Radisic, A
- Philipsen, H
- Heylen, N
- Kostermans, M
- Jaenen, P
- Sleeckx, E
- Sabuncuoglu Tezcan, D
- Debusschere, I
- Soussan, P
- Perry, D
- Van der Plas, G
- Cho, J H
- Marchal, P
- Travaly, Y
- Beyne, E
- Biesemans, S
- Swinnen, B
2010
- Link zum Volltext
2016 IEEE International Interconnect Technology Conference / Advanced Metallization Conference (IITC/AMC), 2016, p.28-30
2016
- Link zum Volltext
2013 5th IEEE International Memory Workshop, 2013, p.26-29
2013
- Link zum Volltext
2021 IEEE International Interconnect Technology Conference (IITC), 2021, p.1-3
- Vega-Gonzalez, V.
- Montero, D.
- Versluijs, J.
- Pedreira, O. Varela
- Jourdan, N.
- Puliyalil, H.
- Chehab, B.
- Peissker, T.
- Haider, A.
- Batuk, D.
- Martinez, G. T.
- Geypen, J.
- Le, Q. T.
- Bazzazian, N.
- Heylen, N.
- van der Veen, M.
- El-Mekki, Z.
- Webers, T.
- Vats, H.
- Rynders, L.
- Cupak, M.
- Uk-Lee, J.
- Drissi, Y.
- Halipre, L.
- Gillijns, W.
- Charley, A.-L.
- Verdonck, P.
- Witters, T.
- Gompel, S. V.
- Kimura, Y.
- Ciofi, I.
- De Wachter, B.
- Swerts, J.
- Grieten, E.
- Ercken, M.
- Kim, R.
- Croes, K.
- Leray, P.
- Jaysankar, M.
- Nagesh, N.
- Ramakers, L.
- Murdoch, G.
- Park, S.
- Tokei, Z.
- Dentoni-Litta, E.
- Horiguchi, N.
2021
- Link zum Volltext
Clinical & experimental metastasis, 1998-02, Vol.16 (2), p.193-203
1998
Link zum Volltext
2010 Symposium on VLSI Technology, 2010, p.23-24
- Horiguchi, N
- Demuynck, S
- Ercken, M
- Locorotondo, S
- Lazzarino, F
- Altamirano, E
- Huffman, C
- Brus, S
- Demand, M
- Struyf, H
- De Backer, J
- Hermans, J
- Delvaux, C
- Vandeweyer, T
- Baerts, C
- Mannaert, G
- Truffert, V
- Verluijs, J
- Alaerts, W
- Dekkers, H
- Ong, P
- Heylen, N
- Kellens, K
- Volders, H
- Hikavyy, A
- Vrancken, C
- Rakowski, M
- Verhaegen, S
- Vandenberghe, G
- Beyer, G
- Lauwers, A
- Absil, P
- Hoffman, T
- Ronse, K
- Biesemans, S
2010
- Link zum Volltext
Microelectronic engineering, 2013-06, Vol.106, p.210-213
2013
Link zum Volltext
2018 IEEE Symposium on VLSI Technology, 2018, p.69-70
- Vandooren, A.
- Franco, J.
- Parvais, B.
- Wu, Z.
- Witters, L.
- Walke, A.
- Li, W.
- Peng, L.
- Desphande, V.
- Bufler, F.M.
- Rassoul, N.
- Hellings, G.
- Jamieson, G.
- Inoue, F.
- Verbinnen, G.
- Devriendt, K.
- Teugels, L.
- Heylen, N.
- Vecchio, E.
- Zheng, T.
- Rosseel, E.
- Vanherle, W.
- Hikavyy, A.
- Chan, B. T.
- Ritzenthaler, R.
- Besnard, G.
- Schwarzenbach, W.
- Gaudin, G.
- Radu, I.
- Nguyen, B.-Y.
- Waldron, N.
- Heyn, V. De
- Mocuta, D.
- Collaert, N.
2018
- Link zum Volltext
2014 IEEE International Electron Devices Meeting, 2014, p.19.1.1-19.1.4
2014
- Link zum Volltext
2019 Symposium on VLSI Technology, 2019, p.T56-T57
- Vandooren, A.
- Wu, Z.
- Khaled, A.
- Franco, J.
- Parvais, B.
- Li, W.
- Witters, L.
- Walke, A.
- Peng, L.
- Rassoul, N.
- Matagne, P.
- Debruyn, H.
- Jamieson, G.
- Inoue, F.
- Devriendt, K.
- Teugels, L.
- Heylen, N.
- Vecchio, E.
- Zheng, T.
- Radisic, D.
- Rosseel, E.
- Vanherle, W.
- Hikavyy, A.
- Chan, B. T.
- Besnard, G.
- Schwarzenbach, W.
- Gaudin, G.
- Radu, I.
- Nguyen, B.-Y.
- Waldron, N.
- De Heyn, V.
- Demuynck, S.
- Boemmels, J.
- Ryckaert, J.
- Collaert, N.
- Mocuta, D.
2019
Link zum Volltext
ESSDERC '03. 33rd Conference on European Solid-State Device Research, 2003, 2003, p.159-162
2003
- Link zum Volltext
Journal de pharmacie de Belgique, 2011-12 (4), p.109
2011
Link zum Volltext
Digest of Technical Papers. 2005 Symposium on VLSI Technology, 2005, 2005, p.60-61
2005
- Link zum Volltext
2015 IEEE International Interconnect Technology Conference and 2015 IEEE Materials for Advanced Metallization Conference (IITC/MAM), 2015, p.197-200
2015
- Link zum Volltext
2016 IEEE International Interconnect Technology Conference / Advanced Metallization Conference (IITC/AMC), 2016, p.21-23
2016
- Link zum Volltext
2015 IEEE International Interconnect Technology Conference and 2015 IEEE Materials for Advanced Metallization Conference (IITC/MAM), 2015, p.345-348
2015
- Link zum Volltext
2018 IEEE International Interconnect Technology Conference (IITC), 2018, p.172-174
2018
- Link zum Volltext
2013 Symposium on VLSI Technology, 2013, p.T194-T195
- Veloso, A.
- Boccardi, G.
- Ragnarsson, L.-A
- Higuchi, Y.
- Lee, J. W.
- Simoen, E.
- Roussel, Ph J.
- Cho, M. J.
- Chew, S. A.
- Schram, T.
- Dekkers, H.
- Van Ammel, A.
- Witters, T.
- Brus, S.
- Dangol, A.
- Paraschiv, V.
- Vecchio, E.
- Shi, X.
- Sebaai, F.
- Kellens, K.
- Heylen, N.
- Devriendt, K.
- Richard, O.
- Bender, H.
- Chiarella, T.
- Arimura, H.
- Thean, A.
- Horiguchi, N.
2013
- Link zum Volltext
Japanese Journal of Applied Physics, 2009-04
2009
Link zum Volltext
Suchergebnisse filtern
Filter anzeigenNur zeigen
Publikationsform
Sprache
Erscheinungsjahr
n.n
n.n
Thema
Kollektion
- National Council for the Social Studies Journals
- Free E-Journal (出版社公開部分のみ）
- IEL
- MEDLINE
- WK Lippincott Williams & Wilkins–Connect here FIRST to enable access
- Springer Online Journals
- SpringerLINK Contemporary (Konsortium Baden-Württemberg)
- Publisher website
- Wiley Blackwell Single Titles
- Elsevier ScienceDirect Journals Complete
- IngentaConnect Journals
- JSTOR
- Elsevier Journal Backfiles on ScienceDirect (DFG Nationallizenzen)
- Wiley Online Library
- APS_美国物理学会期刊
- Taylor & Francis Journals Complete
- Taylor & Francis
- PROLA - Physical Review Online Archive
- Springer Book Series
- Peeters Online Journals
Zeitschrift / Serie
- Perspectives Chinoises
- Journal Of Porous Materials
- Physical Review. C
- Revue Théologique De Louvain
- Angewandte Chemie
- Angewandte Chemie International Edition
- European Journal Of Anaesthesiology
- International Journal Of Legal Medicine
- Microelectronic Engineering
- Nuclear Instruments & Methods In Physics Research. Section B, Beam Interactions With Materials And Atoms
Neu hinzugefügt