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CRaTeBo: a high-speed, radiation-tolerant and versatile testing platform for FPGA radiation qualification for high-energy particle accelerator applications

Journal of instrumentation, 2024-01, Vol.19 (1), p.P01012

2024

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Determining Realistic Parameters for the Double Exponential Law that Models Transient Current Pulses

IEEE transactions on nuclear science, 2014-08, Vol.61 (4), p.1813-1818

2014

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Single-Event Effects in the Peripheral Circuitry of a Commercial Ferroelectric Random Access Memory

IEEE transactions on nuclear science, 2018-08, Vol.65 (8), p.1708-1714

2018

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Multiple Cell Upset Classification in Commercial SRAMs

IEEE transactions on nuclear science, 2014-08, Vol.61 (4), p.1747-1754

2014

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Soft errors in commercial off-the-shelf static random access memories

Semiconductor science and technology, 2017-01, Vol.32 (1), p.13006

2017

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Investigation on MCU Clustering Methodologies for Cross-Section Estimation of RAMs

IEEE transactions on nuclear science, 2015-12, Vol.62 (6), p.2620-2626

2015

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The Power Law Shape of Heavy Ions Experimental Cross Section

IEEE transactions on nuclear science, 2017-01, Vol.64 (1), p.427-433

2017

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Dynamic Test Methods for COTS SRAMs

IEEE transactions on nuclear science, 2014-12, Vol.61 (6), p.3095-3102

2014

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Testing a Commercial MRAM Under Neutron and Alpha Radiation in Dynamic Mode

IEEE transactions on nuclear science, 2013-08, Vol.60 (4), p.2617-2622

2013

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Neutron-Induced Multiple Bit Upsets on Two Commercial SRAMs Under Dynamic-Stress

IEEE transactions on nuclear science, 2012-08, Vol.59 (4), p.893-899

2012

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Design of a radiation tolerant system for total ionizing dose monitoring using floating gate and RadFET dosimeters

Journal of instrumentation, 2017-04, Vol.12 (4), p.C04007-C04007

2017

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Heavy Ion SEU Cross Section Calculation Based on Proton Experimental Data, and Vice Versa

IEEE transactions on nuclear science, 2014-12, Vol.61 (6), p.3564-3571

2014

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SEE on Different Layers of Stacked-SRAMs

IEEE transactions on nuclear science, 2015-12, Vol.62 (6), p.2673-2678

2015

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Gate Voltage Contribution to Neutron-Induced SEB of Trench Gate Fieldstop IGBT

IEEE transactions on nuclear science, 2014-08, Vol.61 (4), p.1739-1746

2014

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Use of CCD to Detect Terrestrial Cosmic Rays at Ground Level: Altitude vs. Underground Experiments, Modeling and Numerical Monte Carlo Simulation

IEEE transactions on nuclear science, 2014-12, Vol.61 (6), p.3380-3388

2014

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An SRAM Based Monitor for Mixed-Field Radiation Environments

IEEE transactions on nuclear science, 2014-08, Vol.61 (4), p.1663-1670

2014

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SEU Evaluation of Hardened-by-Replication Software in RISC- V Soft Processor

2021 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT), 2021, p.1-6

2021

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90 nm SRAM Static and Dynamic Mode Real-Time Testing at Concordia Station in Antarctica

IEEE transactions on nuclear science, 2014-12, Vol.61 (6), p.3389-3394

2014

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A Pipelined Multi-Level Fault Injector for Deep Neural Networks

2020 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT), 2020, p.1-6

2020

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A Lightweight Security Checking Module to Protect Microprocessors against Hardware Trojan Horses

2021 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT), 2021, p.1-6

2021

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A Fault Tolerant soft-core obtained from an Interleaved-Multi- Threading RISC- V microprocessor design

2021 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT), 2021, p.1-4

2021

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Zero-Overhead Protection for CNN Weights

2021 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT), 2021, p.1-6

2021

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Investigating the Impact of Radiation-Induced Soft Errors on the Reliability of Approximate Computing Systems

2020 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT), 2020, p.1-6

2020

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Software-only based Diverse Redundancy for ASIL-D Automotive Applications on Embedded HPC Platforms

2020 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT), 2020, p.1-4

2020

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A Self-Healing, High Performance and Low-Cost Radiation Hardened Latch Design

2021 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT), 2021, p.1-6

2021

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CRaTeBo: a high-speed, radiation-tolerant and versatile testing platform for FPGA radiation qualification for high-energy particle accelerator applications

Determining Realistic Parameters for the Double Exponential Law that Models Transient Current Pulses

Single-Event Effects in the Peripheral Circuitry of a Commercial Ferroelectric Random Access Memory

Multiple Cell Upset Classification in Commercial SRAMs

Soft errors in commercial off-the-shelf static random access memories

Investigation on MCU Clustering Methodologies for Cross-Section Estimation of RAMs

The Power Law Shape of Heavy Ions Experimental Cross Section

Dynamic Test Methods for COTS SRAMs

Testing a Commercial MRAM Under Neutron and Alpha Radiation in Dynamic Mode

Neutron-Induced Multiple Bit Upsets on Two Commercial SRAMs Under Dynamic-Stress

Design of a radiation tolerant system for total ionizing dose monitoring using floating gate and RadFET dosimeters

Heavy Ion SEU Cross Section Calculation Based on Proton Experimental Data, and Vice Versa

SEE on Different Layers of Stacked-SRAMs

Gate Voltage Contribution to Neutron-Induced SEB of Trench Gate Fieldstop IGBT

Use of CCD to Detect Terrestrial Cosmic Rays at Ground Level: Altitude vs. Underground Experiments, Modeling and Numerical Monte Carlo Simulation

An SRAM Based Monitor for Mixed-Field Radiation Environments

SEU Evaluation of Hardened-by-Replication Software in RISC- V Soft Processor

90 nm SRAM Static and Dynamic Mode Real-Time Testing at Concordia Station in Antarctica

A Pipelined Multi-Level Fault Injector for Deep Neural Networks

A Lightweight Security Checking Module to Protect Microprocessors against Hardware Trojan Horses

A Fault Tolerant soft-core obtained from an Interleaved-Multi- Threading RISC- V microprocessor design

Zero-Overhead Protection for CNN Weights

Investigating the Impact of Radiation-Induced Soft Errors on the Reliability of Approximate Computing Systems

Software-only based Diverse Redundancy for ASIL-D Automotive Applications on Embedded HPC Platforms

A Self-Healing, High Performance and Low-Cost Radiation Hardened Latch Design

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