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IEEE journal of the Electron Devices Society, 2020, Vol.8, p.668-673
2020
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Applied physics letters, 2015-08, Vol.107 (9)
2015
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2018 IEEE Symposium on VLSI Technology, 2018, p.141-142
2018
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2023 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits), 2023, p.1-2
- Mertens, H.
- Hosseini, M.
- Chiarella, T.
- Zhou, D.
- Wang, S.
- Mannaert, G.
- Dupuy, E.
- Radisic, D.
- Tao, Z.
- Oniki, Y.
- Hikavyy, A.
- Rosseel, R.
- Mingardi, A.
- Choudhury, S.
- Gowda, P. Puttarame
- Sebaai, F.
- Peter, A.
- Vandersmissen, K.
- Soulie, J.P.
- Keersgieter, A. De
- Lima, L. Petersen Barbosa
- Cavalcante, C.
- Batuk, D.
- Martinez, G.T.
- Geypen, J.
- Seidel, F.
- Paulussen, K.
- Favia, P.
- Boemmels, J.
- Loo, R.
- Wong, P.
- Marquez, A. Sepulveda
- Chan, B.T.
- Mitard, J.
- Subramanian, S.
- Demuynck, S.
- Litta, E. Dentoni
- Horiguchi, N.
- Samavedam, S.
- Biesemans, S.
2023
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2019 IEEE SOI-3D-Subthreshold Microelectronics Technology Unified Conference (S3S), 2019, p.1-2
2019
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2020 IEEE Symposium on VLSI Technology, 2020, p.1-2
- Subramanian, S.
- Hosseini, M.
- Chiarella, T.
- Sarkar, S.
- Schuddinck, P.
- Chan, B. T.
- Radisic, D.
- Mannaert, G.
- Hikavyy, A.
- Rosseel, E.
- Sebaai, F.
- Peter, A.
- Hopf, T.
- Morin, P.
- Wang, S.
- Devriendt, K.
- Batuk, D.
- Martinez, G. T.
- Veloso, A.
- Litta, E. Dentoni
- Baudot, S.
- Siew, Y. K.
- Zhou, X.
- Briggs, B.
- Capogreco, E.
- Hung, J.
- Koret, R.
- Spessot, A.
- Ryckaert, J.
- Demuynck, S.
- Horiguchi, N.
- Boemmels, J.
2020
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Journal of applied physics, 2015-02, Vol.117 (6)
2015
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2023 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits), 2023, p.1-2
2023
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2020 IEEE Symposium on VLSI Technology, 2020, p.1-2
- Vandooren, A.
- Wu, Z.
- Parihar, N.
- Franco, J.
- Parvais, B.
- Matagne, P.
- Debruyn, H.
- Mannaert, G.
- Devriendt, K.
- Teugels, L.
- Vecchio, E.
- Radisic, D.
- Rosseel, E.
- Hikavyy, A.
- Chan, B. T.
- Waldron, N.
- Mitard, J.
- Besnard, G.
- Alvarez, A.
- Gaudin, G.
- Schwarzenbach, W.
- Radu, I.
- Nguyen, B. Y.
- Huet, K.
- Tabata, T.
- Mazzamuto, F.
- Demuynck, S.
- Boemmels, J.
- Collaert, N.
- Horiguchi, N.
2020
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2019 Symposium on VLSI Technology, 2019, p.T198-T199
- Kim, M.-S.
- Harada, N.
- Kikuchi, Y.
- Boemmels, J.
- Mitard, J.
- Huynh-Bao, T.
- Matagne, P.
- Tao, Z.
- Li, W.
- Devriendt, K.
- Ragnarsson, L.-A.
- Lorant, C.
- Sebaai, F.
- Porret, C.
- Rosseel, E.
- Dangol, A.
- Batuk, D.
- Martinez-Alanis, G.
- Geypen, J.
- Jourdan, N.
- Sepulveda, A.
- Puliyalil, H.
- Jamieson, G.
- van der Veen, M.
- Teugels, L.
- El-Mekki, Z.
- Altamirano-Sanchez, E.
- Li, Y.
- Nakamura, H.
- Mocuta, D.
- Masuoka, F.
2019
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2014 44th European Solid State Device Research Conference (ESSDERC), 2014, p.102-105
2014
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2019 Symposium on VLSI Technology, 2019, p.T56-T57
- Vandooren, A.
- Wu, Z.
- Khaled, A.
- Franco, J.
- Parvais, B.
- Li, W.
- Witters, L.
- Walke, A.
- Peng, L.
- Rassoul, N.
- Matagne, P.
- Debruyn, H.
- Jamieson, G.
- Inoue, F.
- Devriendt, K.
- Teugels, L.
- Heylen, N.
- Vecchio, E.
- Zheng, T.
- Radisic, D.
- Rosseel, E.
- Vanherle, W.
- Hikavyy, A.
- Chan, B. T.
- Besnard, G.
- Schwarzenbach, W.
- Gaudin, G.
- Radu, I.
- Nguyen, B.-Y.
- Waldron, N.
- De Heyn, V.
- Demuynck, S.
- Boemmels, J.
- Ryckaert, J.
- Collaert, N.
- Mocuta, D.
2019
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Microelectronics and reliability, 2014-09, Vol.54 (9-10), p.1675-1679
2014
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2016 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD), 2016, p.43-46
2016
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2018 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD), 2018, p.45-48
2018
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2015 IEEE International Interconnect Technology Conference and 2015 IEEE Materials for Advanced Metallization Conference (IITC/MAM), 2015, p.345-348
2015
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2015 IEEE International Interconnect Technology Conference and 2015 IEEE Materials for Advanced Metallization Conference (IITC/MAM), 2015, p.91-94
2015
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2017 IEEE International Electron Devices Meeting (IEDM), 2017, p.20.5.1-20.5.4
2017
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2018 IEEE International Electron Devices Meeting (IEDM), 2018, p.7.1.1-7.1.4
- Vandooren, A.
- Franco, J.
- Wu, Z.
- Parvais, B.
- Li, W.
- Witters, L.
- Walke, A.
- Peng, L.
- Deshpande, V.
- Rassoul, N.
- Hellings, G.
- Jamieson, G.
- Inoue, F.
- Devriendt, K.
- Teugels, L.
- Heylen, N.
- Vecchio, E.
- Zheng, T.
- Rosseel, E.
- Vanherle, W.
- Hikavyy, A.
- Mannaert, G.
- Chan, B. T.
- Ritzenthaler, R.
- Mitard, J.
- Ragnarsson, L.
- Waldron, N.
- De Heyn, V.
- Demuynck, S.
- Boemmels, J.
- Mocuta, D.
- Ryckaert, J.
- Collaert, N.
2018
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2009 IEEE International Reliability Physics Symposium, 2009, p.832-836
2009
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2020 IEEE International Electron Devices Meeting (IEDM), 2020, p.32.2.1-32.2.4
- Tokei, Zs
- Vega, V.
- Murdoch, G.
- O'Toole, M.
- Croes, K.
- Baert, R.
- Veen, M. Van der
- Adelmann, C.
- Soulie, J. P.
- Boemmels, J.
- Wilson, C.
- Park, S. H.
- Sankaran, K.
- Pourtois, G.
- Sweerts, J.
- Paolillo, S.
- Decoster, S.
- Mao, M.
- Lazzarino, F.
- Versluijs, J.
- Blanco, V.
- Ercken, M.
- Kesters, E.
- Le, Q-T.
- Holsteyns, F.
- Heylen, N.
- Teugels, L.
- Devriendt, K.
- Struyf, H.
- Morin, P.
- Jourdan, N.
- Elshocht, S. Van
- Ciofi, I.
- Gupta, A.
- Zahedmanesh, H.
- Vanstreels, K.
- Na, M. H.
2020
Volltextzugriff (PDF)
2018 IEEE SOI-3D-Subthreshold Microelectronics Technology Unified Conference (S3S), 2018, p.1-4
2018
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2017 IEEE International Interconnect Technology Conference (IITC), 2017, p.1-3
2017
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Physical review. A, Atomic, molecular, and optical physics, 2008-07, Vol.78 (1), Article 012712
2008
Volltextzugriff (PDF)
2013 IEEE International Interconnect Technology Conference - IITC, 2013, p.1-3
2013
Volltextzugriff (PDF)
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- Journal Of Antimicrobial Chemotherapy
- The journal Of Antimicrobial Chemotherapy/journal Of Antimicrobial Chemotherapy
- Physical Review. A, Atomic, Molecular, And Optical Physics
- Applied Physics Letters
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- Ieee Transactions On Electron Devices
- Journal Of Applied Physics
- Microelectronics And Reliability
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