UB Paderborn / Katalog / Suche / in CDI

Sortiert nach

Einfacher Volltextzugriff von (fast) überall

Installieren Sie die LibKey Nomad-Browsererweiterung und erhalten Sie von vielen Webseiten einfachen Zugriff auf lizenzierte Volltexte oder Open Access Publikationen. Mehr erfahren...

Insertion of HfO2 Seed/Dielectric Layer to the Ferroelectric HZO Films for Heightened Remanent Polarization in MFM Capacitors

IEEE transactions on electron devices, 2020-02, Vol.67 (2), p.745-750

2020

Volltextzugriff (PDF)

Improvement of Endurance in HZO-Based Ferroelectric Capacitor Using Ru Electrode

IEEE electron device letters, 2019-11, Vol.40 (11), p.1744-1747

2019

Volltextzugriff (PDF)

Silicon doped hafnium oxide (HSO) and hafnium zirconium oxide (HZO) based FeFET: A material relation to device physics

Applied physics letters, 2018-05, Vol.112 (22)

2018

Volltextzugriff (PDF)

Boosting peroxymonosulfate activation by a novel bifunctional core-shell nanoreactor MnFe2O4@HZO for nitrilotris-methylenephosphonic acid removal

Applied catalysis. B, Environmental, 2023-08, Vol.330, p.122508, Article 122508

2023

Volltextzugriff (PDF)

Phase field modeling of domain dynamics and polarization accumulation in ferroelectric HZO

Applied physics letters, 2019-05, Vol.114 (20)

2019

Volltextzugriff (PDF)

In Operando Optical Tracking of Oxygen Vacancy Migration and Phase Change in few Nanometers Ferroelectric HZO Memories

Advanced functional materials, 2023-05, Vol.33 (22), p.n/a

2023

Volltextzugriff (PDF)

The Electrode‐Ferroelectric Interface as the Primary Constraint on Endurance and Retention in HZO‐Based Ferroelectric Capacitors

Advanced functional materials, 2023-10, Vol.33 (43)

2023

Volltextzugriff (PDF)

Interfacial Layer Engineering in Sub-5-nm HZO: Enabling Low-Temperature Process, Low-Voltage Operation, and High Robustness

IEEE transactions on electron devices, 2023-06, Vol.70 (6), p.1-8

2023

Volltextzugriff (PDF)

Novel Approach to High κ (∼59) and Low EOT (∼3.8 Å) near the Morphotrophic Phase Boundary with AFE/FE (ZrO2/HZO) Bilayer Heterostructures and High-Pressure Annealing

ACS applied materials & interfaces, 2022-09, Vol.14 (38), p.43463-43473

2022

Volltextzugriff (PDF)

Optimizing Ferroelectric and Interface Layers in HZO-Based FTJs for Neuromorphic Applications

IEEE transactions on electron devices, 2022-02, Vol.69 (2), p.808-815

2022

Volltextzugriff (PDF)

A Steep Slope MBE-Grown Thin p-Ge Channel FETs on Bulk Ge-on-Si Using HZO Internal Voltage Amplification

IEEE transactions on electron devices, 2022-05, Vol.69 (5), p.2725-2731

2022

Volltextzugriff (PDF)

HZO (>10 nm) Films for Achieving High-κ Near Morphotropic Phase Boundary at Low-Temperature Furnace Annealing Process

IEEE transactions on electron devices, 2024-09, Vol.71 (9), p.5618-5623

2024

Volltextzugriff (PDF)

Understanding HZO Thickness Scaling in Si FeFETs: Low Operating Voltage, Fast Wake-Up, and Suppressed Charge Trapping

IEEE transactions on electron devices, 2024-06, Vol.71 (6), p.3633-3639

2024

Volltextzugriff (PDF)

Electrical Investigation of Wake-Up in High Endurance Fatigue-Free La and Y Doped HZO Metal-Ferroelectric-Metal Capacitors

IEEE transactions on electron devices, 2022-08, Vol.69 (8), p.4744-4749

2022

Volltextzugriff (PDF)

Examination of Ferroelectric Domain Dynamics in HZO Under Endurance Cycling Stress

IEEE electron device letters, 2024-06, Vol.45 (6), p.1016-1019

2024

Volltextzugriff (PDF)

Influence of metal electrodes on the irradiation resistance of HZO ferroelectric thin film capacitors and mechanism analysis

Journal of alloys and compounds, 2024-03, Vol.976, p.173175, Article 173175

2024

Volltextzugriff (PDF)

Understanding Bias Stress-Induced Instabilities in ALD-Deposited ZnO FeFETs Featuring HZO-Al2O3-HZO Ferroelectric Stack

IEEE electron device letters, 2024-11, Vol.45 (11), p.2122-2125

2024

Volltextzugriff (PDF)

An Investigation of HZO-Based n/p-FeFET Operation Mechanism and Improved Device Performance by the Electron Detrapping Mode

IEEE transactions on electron devices, 2022-04, Vol.69 (4), p.2080-2087

2022

Volltextzugriff (PDF)

An energy efficient reservoir computing system based on HZO memcapacitive devices

Applied physics letters, 2023-09, Vol.123 (12)

2023

Volltextzugriff (PDF)

Effects of Al2O3 Interfacial Layer Thickness for HZO/InGaAs Ferroelectric Capacitors With Superior Polarization and MOS Interface Properties

IEEE transactions on electron devices, 2023-12, Vol.70 (12), p.6237-6243

2023

Volltextzugriff (PDF)

Herpes Zoster Ophthalmicus Recurrence: Risk Factors and Long-Term Clinical Outcomes

American journal of ophthalmology, 2024-12, Vol.268, p.1-9

2024

Volltextzugriff (PDF)

Reduced annealing temperature for ferroelectric HZO on InAs with enhanced polarization

Applied physics letters, 2020-02, Vol.116 (6)

2020

Volltextzugriff (PDF)

La Doped HZO-Based 3D-Trench Metal-Ferroelectric-Metal Capacitors With High-Endurance (>10¹²) for FeRAM Applications

IEEE electron device letters, 2024-04, Vol.45 (4), p.578-581

2024

Volltextzugriff (PDF)

Grain Size Reduction of Ferroelectric HZO Enabled by Solid Phase Epitaxy (SPE): Working Principle, Experimental Demonstration, and Theoretical Understanding

IEEE transactions on electron devices, 2023-12, Vol.70 (12), p.6665-6672

2023

Volltextzugriff (PDF)

Excellent HZO ferroelectric thin films on flexible PET substrate

Journal of alloys and compounds, 2022-10, Vol.919, p.165872, Article 165872

2022

Volltextzugriff (PDF)

1 – 25 von 27.686

Suche als RSS-Feed

Suchergebnisse filtern

Filter anzeigen

Nur zeigen

Geprüft (Peer-Review)
(11.916)
Mit Volltextzugriff
(16.479)

Publikationsform

8 weitere anzeigen...

Weniger anzeigen...

Sprache

14 weitere anzeigen...

Weniger anzeigen...

Erscheinungsjahr

n.n

Thema

Science & Technology
(10.376)
Physical Sciences
(6.763)
Chemistry
(5.483)
Technology
(2.952)
Physics
(2.792)
Life Sciences & Biomedicine
(2.536)
Chemistry, Multidisciplinary
(2.344)
Exact Sciences And Technology
(1.859)
Organic Chemistry
(1.810)
Materials Science
(1.653)
Engineering
(1.642)
Physics, Applied
(1.359)
Chemistry, Physical
(1.064)
Materials Science, Multidisciplinary
(1.048)
Ferroelectricity
(942)
Humans
(898)
Science & Technology - Other Topics
(833)
Ferroelectric Materials
(818)
Engineering, Electrical & Electronic
(761)
Chemistry, Organic
(700)

15 weitere anzeigen...

Weniger anzeigen...

Kollektion

Ingenta.com
(6.151)
Free E-Journal (出版社公開部分のみ）
(5.687)
ProQuest Dissertations & Theses A&I
(4.878)
IngentaConnect Journals
(3.724)
NUS Single-Journal Subscriptions
(2.482)
Ovid
(2.305)
Wiley Online Library All Obooks
(2.232)
eBooks on EBSCOhost
(1.896)
Ebook Central Perpetual and DDA
(1.880)
MEDLINE
(1.751)
Taylor & Francis Online
(1.540)
Taylor & Francis Journals Complete
(1.532)
SpringerLink_现刊
(1.424)
Nexis Uni
(1.250)
Taylor & Francis Journals
(1.110)
SpringerLINK Contemporary (Konsortium Baden-Württemberg)
(885)
Wiley-Blackwell Journals
(817)
IEEE Electronic Library Online
(670)
Elsevier ScienceDirect Journals Complete
(595)
美国小型学会期刊集（AIP Scitation平台）
(537)

15 weitere anzeigen...

Weniger anzeigen...

Neu hinzugefügt

Menü

Weitere Dienste

Einstellungen

Insertion of HfO2 Seed/Dielectric Layer to the Ferroelectric HZO Films for Heightened Remanent Polarization in MFM Capacitors

Improvement of Endurance in HZO-Based Ferroelectric Capacitor Using Ru Electrode

Silicon doped hafnium oxide (HSO) and hafnium zirconium oxide (HZO) based FeFET: A material relation to device physics

Boosting peroxymonosulfate activation by a novel bifunctional core-shell nanoreactor MnFe2O4@HZO for nitrilotris-methylenephosphonic acid removal

Phase field modeling of domain dynamics and polarization accumulation in ferroelectric HZO

In Operando Optical Tracking of Oxygen Vacancy Migration and Phase Change in few Nanometers Ferroelectric HZO Memories

The Electrode‐Ferroelectric Interface as the Primary Constraint on Endurance and Retention in HZO‐Based Ferroelectric Capacitors

Interfacial Layer Engineering in Sub-5-nm HZO: Enabling Low-Temperature Process, Low-Voltage Operation, and High Robustness

Novel Approach to High κ (∼59) and Low EOT (∼3.8 Å) near the Morphotrophic Phase Boundary with AFE/FE (ZrO2/HZO) Bilayer Heterostructures and High-Pressure Annealing

Optimizing Ferroelectric and Interface Layers in HZO-Based FTJs for Neuromorphic Applications

A Steep Slope MBE-Grown Thin p-Ge Channel FETs on Bulk Ge-on-Si Using HZO Internal Voltage Amplification

HZO (>10 nm) Films for Achieving High-κ Near Morphotropic Phase Boundary at Low-Temperature Furnace Annealing Process

Understanding HZO Thickness Scaling in Si FeFETs: Low Operating Voltage, Fast Wake-Up, and Suppressed Charge Trapping

Electrical Investigation of Wake-Up in High Endurance Fatigue-Free La and Y Doped HZO Metal-Ferroelectric-Metal Capacitors

Examination of Ferroelectric Domain Dynamics in HZO Under Endurance Cycling Stress

Influence of metal electrodes on the irradiation resistance of HZO ferroelectric thin film capacitors and mechanism analysis

Understanding Bias Stress-Induced Instabilities in ALD-Deposited ZnO FeFETs Featuring HZO-Al2O3-HZO Ferroelectric Stack

An Investigation of HZO-Based n/p-FeFET Operation Mechanism and Improved Device Performance by the Electron Detrapping Mode

An energy efficient reservoir computing system based on HZO memcapacitive devices

Effects of Al2O3 Interfacial Layer Thickness for HZO/InGaAs Ferroelectric Capacitors With Superior Polarization and MOS Interface Properties

Herpes Zoster Ophthalmicus Recurrence: Risk Factors and Long-Term Clinical Outcomes

Reduced annealing temperature for ferroelectric HZO on InAs with enhanced polarization

La Doped HZO-Based 3D-Trench Metal-Ferroelectric-Metal Capacitors With High-Endurance (>10¹²) for FeRAM Applications

Grain Size Reduction of Ferroelectric HZO Enabled by Solid Phase Epitaxy (SPE): Working Principle, Experimental Demonstration, and Theoretical Understanding

Excellent HZO ferroelectric thin films on flexible PET substrate

Suchergebnisse filtern