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Advanced Electron Microscopy for III/V on Silicon Integration

Advanced materials interfaces, 2019-06, Vol.6 (12), p.n/a

2019

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GaP-nucleation on exact Si (0 0 1) substrates for III/V device integration

Journal of crystal growth, 2011-01, Vol.315 (1), p.37-47

2011

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Quantitative Characterization of Nanometer-Scale Electric Fields via Momentum-Resolved STEM

Nano letters, 2021-03, Vol.21 (5), p.2018-2025

2021

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STEMsalabim: A high-performance computing cluster friendly code for scanning transmission electron microscopy image simulations of thin specimens

Ultramicroscopy, 2017-06, Vol.177, p.91-96

2017

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Pyramidal Structure Formation at the Interface between III/V Semiconductors and Silicon

Chemistry of materials, 2016-05, Vol.28 (10), p.3265-3275

2016

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Kinking of GaP Nanowires Grown in an In Situ (S)TEM Gas Cell Holder

Advanced materials interfaces, 2023-06, Vol.10 (17), p.n/a

2023

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Influence of spatial and temporal coherences on atomic resolution high angle annular dark field imaging

Ultramicroscopy, 2016-10, Vol.169, p.1-10

2016

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Tailoring the diameter of electrospun layered perovskite nanofibers for photocatalytic water splitting

Journal of materials chemistry. A, Materials for energy and sustainability, 2018, Vol.6 (5), p.1971-1978

2018

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Quantification of Bi distribution in MOVPE-grown Ga(AsBi) via HAADF STEM

Journal of crystal growth, 2016-01, Vol.433, p.89-96

2016

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Probing the Interface Evolution in Co‐sintered All‐Phosphate Cathode‐Solid Electrolyte Composites

Advanced materials interfaces, 2023-12, Vol.10 (35), p.n/a

2023

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Automating the optical identification of abrasive wear on electrical contact pins

Automatisierungstechnik : AT, 2021-10, Vol.69 (10), p.903-914

2021

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Synthesis and Characterization of Colloidal Fluorescent Silver Nanoclusters

Langmuir, 2012-06, Vol.28 (24), p.8915-8919

2012

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regNet: an R package for network-based propagation of gene expression alterations

Bioinformatics, 2018-01, Vol.34 (2), p.308-311

2018

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Assessing Long-Range Transport Potential of Persistent Organic Pollutants

Environmental science & technology, 2000-02, Vol.34 (4), p.699-703

2000

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"Depo-all-around": A novel FIB-based TEM specimen preparation technique for solid state battery composites and other loosely bound samples

Ultramicroscopy, 2024-03, Vol.257, p.113904-113904, Article 113904

2024

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Local Bi ordering in MOVPE grown Ga(As,Bi) investigated by high resolution scanning transmission electron microscopy

Applied materials today, 2017-03, Vol.6, p.22-28

2017

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Comparing Estimates of Persistence and Long-Range Transport Potential among Multimedia Models

Environmental science & technology, 2005-04, Vol.39 (7), p.1932-1942

2005

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Understanding the formation of antiphase boundaries in layered oxide cathode materials and their evolution upon electrochemical cycling

Matter, 2021-12, Vol.4 (12), p.3953-3966

2021

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Atomic-scale 3D reconstruction of antiphase boundaries in GaP on (001) silicon by STEM

Micron (Oxford, England : 1993), 2018-11, Vol.114, p.32-41

2018

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Surface relaxation of strained Ga(P,As)/GaP heterostructures investigated by HAADF STEM

Journal of microscopy (Oxford), 2017-12, Vol.268 (3), p.239-247

2017

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Composition determination of multinary III/V semiconductors via STEM HAADF multislice simulations

Ultramicroscopy, 2018-02, Vol.185, p.15-20

2018

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Influence of the sintering temperature on LLZO-NCM cathode composites for solid-state batteries studied by transmission electron microscopy

Matter, 2023-07, Vol.6 (7), p.2324-2339

2023

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GaP-interlayer formation on epitaxial GaAs(100) surfaces in MOVPE ambient

Journal of crystal growth, 2017-04, Vol.464, p.2-7

2017

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The Role of Intragranular Nanopores in Capacity Fade of Nickel-Rich Layered Li(Ni 1- x - y Co x Mn y )O 2 Cathode Materials

ACS nano, 2019-09, Vol.13 (9), p.10694-10704

2019

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In Situ Thermal Annealing Transmission Electron Microscopy (TEM) Investigation of III/V Semiconductor Heterostructures Using a Setup for Safe Usage of Toxic and Pyrophoric Gases

Microscopy and microanalysis, 2017-08, Vol.23 (4), p.751-757

2017

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Advanced Electron Microscopy for III/V on Silicon Integration

GaP-nucleation on exact Si (0 0 1) substrates for III/V device integration

Quantitative Characterization of Nanometer-Scale Electric Fields via Momentum-Resolved STEM

STEMsalabim: A high-performance computing cluster friendly code for scanning transmission electron microscopy image simulations of thin specimens

Pyramidal Structure Formation at the Interface between III/V Semiconductors and Silicon

Kinking of GaP Nanowires Grown in an In Situ (S)TEM Gas Cell Holder

Influence of spatial and temporal coherences on atomic resolution high angle annular dark field imaging

Tailoring the diameter of electrospun layered perovskite nanofibers for photocatalytic water splitting

Quantification of Bi distribution in MOVPE-grown Ga(AsBi) via HAADF STEM

Probing the Interface Evolution in Co‐sintered All‐Phosphate Cathode‐Solid Electrolyte Composites

Automating the optical identification of abrasive wear on electrical contact pins

Synthesis and Characterization of Colloidal Fluorescent Silver Nanoclusters

regNet: an R package for network-based propagation of gene expression alterations

Assessing Long-Range Transport Potential of Persistent Organic Pollutants

"Depo-all-around": A novel FIB-based TEM specimen preparation technique for solid state battery composites and other loosely bound samples

Local Bi ordering in MOVPE grown Ga(As,Bi) investigated by high resolution scanning transmission electron microscopy

Comparing Estimates of Persistence and Long-Range Transport Potential among Multimedia Models

Understanding the formation of antiphase boundaries in layered oxide cathode materials and their evolution upon electrochemical cycling

Atomic-scale 3D reconstruction of antiphase boundaries in GaP on (001) silicon by STEM

Surface relaxation of strained Ga(P,As)/GaP heterostructures investigated by HAADF STEM

Composition determination of multinary III/V semiconductors via STEM HAADF multislice simulations

Influence of the sintering temperature on LLZO-NCM cathode composites for solid-state batteries studied by transmission electron microscopy

GaP-interlayer formation on epitaxial GaAs(100) surfaces in MOVPE ambient

The Role of Intragranular Nanopores in Capacity Fade of Nickel-Rich Layered Li(Ni 1- x - y Co x Mn y )O 2 Cathode Materials

In Situ Thermal Annealing Transmission Electron Microscopy (TEM) Investigation of III/V Semiconductor Heterostructures Using a Setup for Safe Usage of Toxic and Pyrophoric Gases

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