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Investigation on the Impact of Program/Erase Cycling Frequency on Data Retention of Nanoscale Charge Trap Nonvolatile Memory

IEEE electron device letters, 2014-09, Vol.35 (9), p.918-920

2014

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Short-Circuit Protection Circuits for Silicon-Carbide Power Transistors

IEEE transactions on industrial electronics (1982), 2016-04, Vol.63 (4), p.1995-2004

2016

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Reliability of NAND Flash Arrays: A Review of What the 2-D-to-3-D Transition Meant

IEEE transactions on electron devices, 2019-11, Vol.66 (11), p.4504-4516

2019

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Power Electronics Converters for Wind Turbine Systems

IEEE transactions on industry applications, 2012-03, Vol.48 (2), p.708-719

2012

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Reviewing the Evolution of the NAND Flash Technology

Proceedings of the IEEE, 2017-09, Vol.105 (9), p.1609-1633

2017

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Beneficial Hydrogen Doping in Single Spinel Phase Crystallized IZTO Thin-Film Transistors

IEEE electron device letters, 2024-08, p.1-1

2024

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Reliability assessment of high-power GaN-HEMT devices with different buffers under influence of gate bias and high-temperature tests

Applied physics express, 2024-07, Vol.17 (7), p.76501

2024

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Single-Pulse Avalanche Mode Robustness of Commercial 1200 V/80 mΩ SiC MOSFETs

IEEE transactions on power electronics, 2017-08, Vol.32 (8), p.6405-6415

2017

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Changes to the Editorial Board

IEEE electron device letters, 2022-04, Vol.43 (4), p.518-518

Del Alamo, Jesus A.

2022

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Comphy — A compact-physics framework for unified modeling of BTI

Microelectronics and reliability, 2018-06, Vol.85, p.49-65

2018

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Review of Topside Interconnections for Wide Bandgap Power Semiconductor Packaging

IEEE transactions on power electronics, 2023-01, Vol.38 (1), p.472-490

2023

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Evidence of Widely Distributed Time Constants in the Vertical Charge Loss of 3-D Charge-Trap NAND Flash Memories

IEEE electron device letters, 2024-07, p.1-1

2024

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Study of MoN gate impact on GaN high electron mobility transistor

Electronics letters, 2024-05, Vol.60 (10), p.n/a

2024

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Impact of BTI-Induced Threshold Voltage Shifts in Shoot-Through Currents From Crosstalk in SiC MOSFETs

IEEE transactions on power electronics, 2021-03, Vol.36 (3), p.3279-3291

2021

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Erratum to "Modeling Avalanche Induced Degradation for 4H-SiC Power MOSFETs"

IEEE transactions on power electronics, 2021-02, Vol.36 (2), p.2447-2447

2021

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Reliability of InAs/GaAs Quantum Dot Lasers Epitaxially Grown on Silicon

IEEE journal of selected topics in quantum electronics, 2015-11, Vol.21 (6), p.690-697

2015

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A remaining useful life prediction method of SiC MOSFET considering failure threshold uncertainty

IET power electronics, 2024-09, Vol.17 (12), p.1594-1606

2024

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Highly Efficient Single-Phase Transformerless Inverters for Grid-Connected Photovoltaic Systems

IEEE transactions on industrial electronics (1982), 2010-09, Vol.57 (9), p.3118-3128

2010

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Review and analysis of SiC MOSFETs’ ruggedness and reliability

IET power electronics, 2020-02, Vol.13 (3), p.445-455

2020

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Experimental and Modeling Investigation of the Temperature Activation of TDDB in Galvanic Isolators Based on Polymeric Dielectrics

IEEE transactions on dielectrics and electrical insulation, 2024, p.1-1

2024

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In situ Condition Monitoring of IGBTs Based on the Miller Plateau Duration

IEEE transactions on power electronics, 2019-01, Vol.34 (1), p.769-782

2019

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Achieving High Yield of Perpendicular SOT-MTJ Manufactured on 300 mm Wafers

IEEE electron device letters, 2024-09, p.1-1

2024

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Active Power Cycling Test Bench for SiC Power MOSFETs-Principles, Design, and Implementation

IEEE transactions on power electronics, 2021-03, Vol.36 (3), p.2661-2675

2021

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Open-Circuit Fault Diagnosis in PMSG Drives for Wind Turbine Applications

IEEE transactions on industrial electronics (1982), 2013-09, Vol.60 (9), p.3957-3967

2013

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A Voltage-Based Approach Without Extra Hardware for Open-Circuit Fault Diagnosis in Closed-Loop PWM AC Regenerative Drives

IEEE transactions on industrial electronics (1982), 2014-09, Vol.61 (9), p.4960-4970

2014

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Investigation on the Impact of Program/Erase Cycling Frequency on Data Retention of Nanoscale Charge Trap Nonvolatile Memory

Short-Circuit Protection Circuits for Silicon-Carbide Power Transistors

Reliability of NAND Flash Arrays: A Review of What the 2-D-to-3-D Transition Meant

Power Electronics Converters for Wind Turbine Systems

Reviewing the Evolution of the NAND Flash Technology

Beneficial Hydrogen Doping in Single Spinel Phase Crystallized IZTO Thin-Film Transistors

Reliability assessment of high-power GaN-HEMT devices with different buffers under influence of gate bias and high-temperature tests

Single-Pulse Avalanche Mode Robustness of Commercial 1200 V/80 mΩ SiC MOSFETs

Changes to the Editorial Board

Comphy — A compact-physics framework for unified modeling of BTI

Review of Topside Interconnections for Wide Bandgap Power Semiconductor Packaging

Evidence of Widely Distributed Time Constants in the Vertical Charge Loss of 3-D Charge-Trap NAND Flash Memories

Study of MoN gate impact on GaN high electron mobility transistor

Impact of BTI-Induced Threshold Voltage Shifts in Shoot-Through Currents From Crosstalk in SiC MOSFETs

Erratum to "Modeling Avalanche Induced Degradation for 4H-SiC Power MOSFETs"

Reliability of InAs/GaAs Quantum Dot Lasers Epitaxially Grown on Silicon

A remaining useful life prediction method of SiC MOSFET considering failure threshold uncertainty

Highly Efficient Single-Phase Transformerless Inverters for Grid-Connected Photovoltaic Systems

Review and analysis of SiC MOSFETs’ ruggedness and reliability

Experimental and Modeling Investigation of the Temperature Activation of TDDB in Galvanic Isolators Based on Polymeric Dielectrics

In situ Condition Monitoring of IGBTs Based on the Miller Plateau Duration

Achieving High Yield of Perpendicular SOT-MTJ Manufactured on 300 mm Wafers

Active Power Cycling Test Bench for SiC Power MOSFETs-Principles, Design, and Implementation

Open-Circuit Fault Diagnosis in PMSG Drives for Wind Turbine Applications

A Voltage-Based Approach Without Extra Hardware for Open-Circuit Fault Diagnosis in Closed-Loop PWM AC Regenerative Drives

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