Details

Autor(en) / Beteiligte

• Rajaram, S[Herausgeber]
• Balamurugan, N.B[Herausgeber]
• Gracia Nirmala Rani, D[Herausgeber]
• Singh, Virendra[Herausgeber]

Titel

VLSI Design and Test : 22nd International Symposium, VDAT 2018, Madurai, India, June 28-30, 2018, Revised Selected Papers [electronic resource]

Auflage

1st ed. 2019

Ort / Verlag

Singapore : Springer Singapore

Erscheinungsjahr

2019

Link zum Volltext

• SpringerLink Books - AutoHoldings

Beschreibungen/Notizen

• Digital design -- Analog and mixed signal design -- Hardware security -- Micro bio-fluidics -- VLSI testing -- Analog circuits and devices -- Network-on-chip -- Memory -- Quantum computing and NoC -- Sensors and interfaces.
• This book constitutes the refereed proceedings of the 22st International Symposium on VLSI Design and Test, VDAT 2018, held in Madurai, India, in June 2018. The 39 full papers and 11 short papers presented together with 8 poster papers were carefully reviewed and selected from 231 submissions. The papers are organized in topical sections named: digital design; analog and mixed signal design; hardware security; micro bio-fluidics; VLSI testing; analog circuits and devices; network-on-chip; memory; quantum computing and NoC; sensors and interfaces.