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Measurement of the activation energies of oxygen ion diffusion in yttria stabilized zirconia by flicker noise spectroscopy

Applied physics letters, 2019-06, Vol.114 (25)

2019

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Effect of SiO2 sublayer on the retention characteristics of nanometer-sized Si3N4 memristive devices investigated by low-frequency noise spectroscopy

Japanese Journal of Applied Physics, 2022-10, Vol.61 (SM), p.SM1013

2022

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Memory effect and generation-recombination noise of magnetic monopoles in spin ice

Journal of statistical mechanics, 2019-09, Vol.2019 (9), p.94005

2019

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Image Fluctuations in LED Electromechanical 3D–Display

Fluctuation and noise letters, 2018-06, Vol.17 (2), p.1850022

2018

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Statistics of Fluctuations of Magnetic Monopole Concentration in Spin Ice

Fluctuation and noise letters, 2017-12, Vol.16 (4), p.1750035

2017

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1/f Noise in Optical Output and Non-Gaussianity in Voltage Noise of GaAs Nanoscale Light-Emitting Structures

Fluctuation and noise letters, 2017-09, Vol.16 (3), p.1750030

2017

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Investigation of 1/f Noise and Superimposed RTS Noise in Ti–Au/n-Type GaAs Schottky Barrier Diodes

Fluctuation and noise letters, 2015-12, Vol.14 (4), p.1550041

2015

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1/f Noise in Ti–Au /n-Type GaAs Schottky Barrier Diodes

Fluctuation and noise letters, 2015-09, Vol.14 (3), p.1550029

2015

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PHYSICAL ORIGINS OF 1/f NOISE IN Si δ-DOPED SCHOTTKY DIODES

Fluctuation and noise letters, 2014-03, Vol.13 (1), p.1450003

2014

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COMPLEXES OF SPATIALLY MULTISTABLE DEFECTS AS THE SOURCE OF 1/f NOISE IN GaAs DEVICES

Fluctuation and noise letters, 2013-03, Vol.12 (1), p.1350008

2013

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1/f Noise in the Mixer Based on Schottky Diode

Fluctuation and noise letters, 2017-03, Vol.16 (1), p.1750001

2017

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MODIFICATION OF VAN DER ZIEL RELATION FOR SPECTRUM OF NOISE IN p–n JUNCTION

Fluctuation and noise letters, 2012-06, Vol.11 (2), p.1250015

2012

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Influence of oxygen ion elementary diffusion jumps on the electron current through the conductive filament in yttria stabilized zirconia nanometer-sized memristor

Chaos, solitons and fractals, 2021-07, Vol.148, p.111014, Article 111014

2021

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Corrigendum to “Influence of oxygen ion elementary diffusion jumps on the electron current through the conductive filament in yttria stabilized zirconia nanometer-sized memristor” [Chaos, Solitons Fractals 148 (2021) 111014]

Chaos, solitons and fractals, 2022-11, Vol.164, p.112652, Article 112652

2022

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Complexes Of Defects As The Source Of 1/F Noise In GaAs Based Devices

Noise and Fluctuations (AIP Conference Proceedings Volume 1129), 2009, Vol.1129, p.65-68

2009

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1/F Noise In Si Delta-Doped Schottky Diodes

Noise and Fluctuations (AIP Conference Proceedings Volume 1129), 2009, Vol.1129, p.225-228

2009

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Effect of Nitrogen Ion Diffusion Jumps in Nanometer-Sized Si 3 N 4 Memristors Investigated by Low-Frequency Noise Spectroscopy

Fluctuation and noise letters, 2024-02, Vol.23 (1)

2024

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Application of Direct Digital Synthesis and Cross Correlation Solution in Phase Noise Measurement System

Noise and Fluctuations (AIP Conference Proceedings Volume 922), 2007, Vol.922, p.411-414

2007

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Effect of SiO 2 sublayer on the retention characteristics of nanometer-sized Si 3 N 4 memristive devices investigated by low-frequency noise spectroscopy

Japanese Journal of Applied Physics, 2022-10, Vol.61 (SM), p.SM1013

2022

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Modification of A. Van der Ziel relation for natural noise in diodes with non-ideality factor of I-V characteristic e > 1

Noise and Fluctuations (AIP Conference Proceedings Volume 1129), 2009-01, Vol.1129, p.361-366

2009

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Noise In Leakage Current Of Nanoscale Light Emitting Structures

Noise and Fluctuations (AIP Conference Proceedings Volume 922), 2007-01, Vol.922, p.329-334

2007

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1/F noise in TiAu/SiO2/GaAs Schottky diodes

2013 22nd International Conference on Noise and Fluctuations (ICNF), 2013, p.1-4

2013

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Sources of 1/f noise in Si delta-doped Schottky diodes

2011 21st International Conference on Noise and Fluctuations, 2011, p.102-105

2011

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Defects influenced by the Jahn-Teller effect as the sources of flicker noise in GaAs based devices

2011 21st International Conference on Noise and Fluctuations, 2011, p.176-179

2011

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Grown and Characterization of ZnO Aligned Nanorod Arrays for Sensor Applications

Energies (Basel), 2021-07, Vol.14 (13), p.3750

2021

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Measurement of the activation energies of oxygen ion diffusion in yttria stabilized zirconia by flicker noise spectroscopy

Effect of SiO2 sublayer on the retention characteristics of nanometer-sized Si3N4 memristive devices investigated by low-frequency noise spectroscopy

Memory effect and generation-recombination noise of magnetic monopoles in spin ice

Image Fluctuations in LED Electromechanical 3D–Display

Statistics of Fluctuations of Magnetic Monopole Concentration in Spin Ice

1/f Noise in Optical Output and Non-Gaussianity in Voltage Noise of GaAs Nanoscale Light-Emitting Structures

Investigation of 1/f Noise and Superimposed RTS Noise in Ti–Au/n-Type GaAs Schottky Barrier Diodes

1/f Noise in Ti–Au /n-Type GaAs Schottky Barrier Diodes

PHYSICAL ORIGINS OF 1/f NOISE IN Si δ-DOPED SCHOTTKY DIODES

COMPLEXES OF SPATIALLY MULTISTABLE DEFECTS AS THE SOURCE OF 1/f NOISE IN GaAs DEVICES

1/f Noise in the Mixer Based on Schottky Diode

MODIFICATION OF VAN DER ZIEL RELATION FOR SPECTRUM OF NOISE IN p–n JUNCTION

Influence of oxygen ion elementary diffusion jumps on the electron current through the conductive filament in yttria stabilized zirconia nanometer-sized memristor

Corrigendum to “Influence of oxygen ion elementary diffusion jumps on the electron current through the conductive filament in yttria stabilized zirconia nanometer-sized memristor” [Chaos, Solitons Fractals 148 (2021) 111014]

Complexes Of Defects As The Source Of 1/F Noise In GaAs Based Devices

1/F Noise In Si Delta-Doped Schottky Diodes

Effect of Nitrogen Ion Diffusion Jumps in Nanometer-Sized Si 3 N 4 Memristors Investigated by Low-Frequency Noise Spectroscopy

Application of Direct Digital Synthesis and Cross Correlation Solution in Phase Noise Measurement System

Effect of SiO 2 sublayer on the retention characteristics of nanometer-sized Si 3 N 4 memristive devices investigated by low-frequency noise spectroscopy

Modification of A. Van der Ziel relation for natural noise in diodes with non-ideality factor of I-V characteristic e > 1

Noise In Leakage Current Of Nanoscale Light Emitting Structures

1/F noise in TiAu/SiO2/GaAs Schottky diodes

Sources of 1/f noise in Si delta-doped Schottky diodes

Defects influenced by the Jahn-Teller effect as the sources of flicker noise in GaAs based devices

Grown and Characterization of ZnO Aligned Nanorod Arrays for Sensor Applications

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