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Anthranilic diamides: A new class of insecticides with a novel mode of action, ryanodine receptor activation

Pesticide biochemistry and physiology, 2006-03, Vol.84 (3), p.196-214

2006

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Fabrication and Measurement of Test Structures to Monitor Stress in SU-8 Films

IEEE transactions on semiconductor manufacturing, 2012-08, Vol.25 (3), p.346-354

2012

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Development of a miniaturised drug delivery system with wireless power transfer and communication

IET nanobiotechnology, 2007-10, Vol.1 (5), p.80-86

2007

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Direct Al–Al contact using low temperature wafer bonding for integrating MEMS and CMOS devices

Microelectronic engineering, 2008-05, Vol.85 (5-6), p.1059-1061

2008

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Design and fabrication of dielectric diaphragm pressure sensors for applications to shock wave measurement in air

Journal of micromechanics and microengineering, 2007-07, Vol.17 (7), p.1334-1342

2007

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Test Structures for Characterizing the Integration of EWOD and SAW Technologies for Microfluidics

IEEE transactions on semiconductor manufacturing, 2012-08, Vol.25 (3), p.323-330

2012

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Implementation of wireless power transfer and communications for an implantable ocular drug delivery system

IET nanobiotechnology, 2008-09, Vol.2 (3), p.72-79

2008

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Characterisation and integration of Parylene as an insulating structural layer for high aspect ratio electroplated copper coils

2013 IEEE International Conference on Microelectronic Test Structures (ICMTS), 2013, p.7-12

2013

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Test structures for electrical evaluation of high aspect ratio TSV arrays fabricated using planarised sacrificial photoresist

2013 IEEE International Conference on Microelectronic Test Structures (ICMTS), 2013, p.37-42

2013

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Early patellofemoral revision following total knee arthroplasty

The Journal of arthroplasty, 1995-06, Vol.10 (3), p.287-291

1995

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Comparison of Measurement Techniques for Linewidth Metrology on Advanced Photomasks

IEEE transactions on semiconductor manufacturing, 2009-02, Vol.22 (1), p.72-79

2009

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Direct measurement of residual stress in sub-micron interconnects

Semiconductor science and technology, 2003-11, Vol.18 (11), p.992-996

2003

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An evaluation of test structures for measuring the contact resistance of 3-D bonded interconnects

2008 IEEE International Conference on Microelectronic Test Structures, 2008, p.123-127

2008

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On-mask CD and overlay test structures for alternating aperture phase shift lithography

IEEE transactions on semiconductor manufacturing, 2005-05, Vol.18 (2), p.238-245

2005

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Kelvin resistor structures for the investigation of corner serif Proximity Correction

2010 International Conference on Microelectronic Test Structures (ICMTS), 2010, p.24-29

2010

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Analysis of the performance of a micromechanical test structure to measure stress in thick electroplated metal films

2010 International Conference on Microelectronic Test Structures (ICMTS), 2010, p.80-85

2010

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Electrical Test Structures for Investigating the Effects of Optical Proximity Correction

2009 IEEE International Conference on Microelectronic Test Structures, 2009, p.162-167

2009

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Application of Matching Structures to Identify the Source of Systematic Dimensional Offsets in GHOST Proximity Corrected Photomasks

2009 IEEE International Conference on Microelectronic Test Structures, 2009, p.50-55

2009

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Electrical Measurement of On-Mask Mismatch Resistor Structures

2007 IEEE International Conference on Microelectronic Test Structures, 2007, p.3-8

2007

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Test structures for characterising the integration of EWOD and SAW technologies for microfluidics

2010 International Conference on Microelectronic Test Structures (ICMTS), 2010, p.52-57

2010

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Fabrication of prototype imaging arrays for SCUBA-2

Nuclear instruments & methods in physics research. Section A, Accelerators, spectrometers, detectors and associated equipment, 2006-04, Vol.559 (2), p.513-515

2006

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Quantitative analysis of Joule heating in surface micromachined Greek cross test structures

2007 IEEE International Conference on Microelectronic Test Structures, 2007, p.218-221

2007

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The integration of EWOD and SAW technologies for improved droplet manipulation and mixing

2009 Proceedings of the European Solid State Device Research Conference, 2009, p.371-374

2009

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Investigation of Electrical and Optical CD Measurement Techniques for the Characterisation of On-Mask GHOST Proximity Corrected Features

2008 IEEE International Conference on Microelectronic Test Structures, 2008, p.29-34

2008

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CD Reference Materials Fabricated on Monolithic 200 mm Wafers for Automated Metrology Tool Applications

Frontiers of Characterization and Metrology for Nanoelectronics: 2007 (AIP Conference Proceedings Volume 931), 2007, Vol.931, p.387-391

2007

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Anthranilic diamides: A new class of insecticides with a novel mode of action, ryanodine receptor activation

Fabrication and Measurement of Test Structures to Monitor Stress in SU-8 Films

Development of a miniaturised drug delivery system with wireless power transfer and communication

Direct Al–Al contact using low temperature wafer bonding for integrating MEMS and CMOS devices

Design and fabrication of dielectric diaphragm pressure sensors for applications to shock wave measurement in air

Test Structures for Characterizing the Integration of EWOD and SAW Technologies for Microfluidics

Implementation of wireless power transfer and communications for an implantable ocular drug delivery system

Characterisation and integration of Parylene as an insulating structural layer for high aspect ratio electroplated copper coils

Test structures for electrical evaluation of high aspect ratio TSV arrays fabricated using planarised sacrificial photoresist

Early patellofemoral revision following total knee arthroplasty

Comparison of Measurement Techniques for Linewidth Metrology on Advanced Photomasks

Direct measurement of residual stress in sub-micron interconnects

An evaluation of test structures for measuring the contact resistance of 3-D bonded interconnects

On-mask CD and overlay test structures for alternating aperture phase shift lithography

Kelvin resistor structures for the investigation of corner serif Proximity Correction

Analysis of the performance of a micromechanical test structure to measure stress in thick electroplated metal films

Electrical Test Structures for Investigating the Effects of Optical Proximity Correction

Application of Matching Structures to Identify the Source of Systematic Dimensional Offsets in GHOST Proximity Corrected Photomasks

Electrical Measurement of On-Mask Mismatch Resistor Structures

Test structures for characterising the integration of EWOD and SAW technologies for microfluidics

Fabrication of prototype imaging arrays for SCUBA-2

Quantitative analysis of Joule heating in surface micromachined Greek cross test structures

The integration of EWOD and SAW technologies for improved droplet manipulation and mixing

Investigation of Electrical and Optical CD Measurement Techniques for the Characterisation of On-Mask GHOST Proximity Corrected Features

CD Reference Materials Fabricated on Monolithic 200 mm Wafers for Automated Metrology Tool Applications

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