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Critical evaluation of the state of the art of the analysis of light elements in thin films demonstrated using the examples of SiOXNY and AlOXNY films (IUPAC Technical Report)

Pure and applied chemistry, 2004-01, Vol.76 (6), p.1161-1213

2004

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Can oxygen stabilize chromium nitride?—Characterization of high temperature cycled chromium oxynitride

Thin solid films, , Vol.447, p.289-295

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Investigations on the oxidation behavior of technical molybdenum foils by means of secondary-ion mass spectrometry

Surface science, 2000-05, Vol.454, p.284-288

2000

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SIMS analysis of the oxidation behaviour of SiFeCr coated technical refractory metal alloys

Materials and corrosion, 2001-07, Vol.52 (7), p.501-508

2001

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Three dimensional characterization of trace element distribution in high purity chromium

Mikrochimica acta (1966), 1996-01, Vol.122 (3-4), p.195-202

1996

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Statistical evaluation of refractive index, growth rate, hardness and Young's modulus of aluminium oxynitride films

Thin solid films, 1999-10, Vol.354 (1), p.43-49

1999

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Quantitative SIMS depth profiling of diffusion barrier gate-oxynitride structures in TFT-LCDs

Analytical and bioanalytical chemistry, 2004-06, Vol.379 (4), p.599-604

2004

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Application of scanning SIMS techniques for the evaluation of the oxidation behavior of high-purity molybdenum

Fresenius' journal of analytical chemistry, 1999-09, Vol.365 (1-3), p.188-194

1999

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Optimisation of plasma techniques for trace analysis of refractory metals

Mikrochimica acta (1966), 1995-03, Vol.120 (1-4), p.53-61

WILHARTITZ, P

1995

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Investigation of the synthesis and internal structure of protective oxide layers on high-purity chromium with SIMS scanning techniques

Fresenius' journal of analytical chemistry, 1997-05, Vol.358 (1-2), p.233-236

1997

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Multidimensional optimisation of process parameters by experimental design for the deposition of aluminium and silicon oxynitride films with predictable composition

Surface & coatings technology, 1999-04, Vol.114 (1), p.29-38

1999

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High performance ultra trace analysis in molybdenum and tungsten accomplished by on-line coupling of ion chromatography with simultaneous ICP-AES

Mikrochimica acta (1966), 1997-01, Vol.125 (1-4), p.45-52

1997

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Analysis of tantalum by ICP-AES involving trace-matrix separation

Fresenius' Journal of Analytical Chemistry, 1991-01, Vol.341 (9), p.550-554

1991

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On the mechanism of high-temperature oxidation of ODS superalloys : Significance of yttrium depletion within the oxide scales

Oxidation of metals, 1999-02, Vol.51 (1-2), p.111-128

1999

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Multielement ultratrace analysis of molybdenum with high performance secondary ion mass spectrometry

Journal of materials research, 1988-08, Vol.3 (4), p.694-704

1988

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Analytische Charakterisierung von Phosphor in Hartmetallen und Rohstoffen

Fresenius' Zeitschrift für analytische Chemie, 1984, Vol.317 (7), p.782-787

1984

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Problems of automated qualitative x-ray fluorescence analysis 3-element selection

X-ray spectrometry, 1993-03, Vol.22 (2), p.97-102

1993

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Distribution analysis of carbon and sulphur in CVD-Al2O3-layers by SIMS using Cs+ primary ions

Surface and interface analysis, 1986-08, Vol.8 (4), p.159-165

1986

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Applied analytical tools for the characterization of cermets

International journal of refractory metals & hard materials, 1992, Vol.11 (4), p.235-246

1992

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Quantitative analysis of silicon-oxynitride films by EPMA

Mikrochimica acta (1966), 1999-01, Vol.130 (4), p.281-288

1999

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Quantitative analysis of thin aluminium-oxynitride films by EPMA

Mikrochimica acta (1966), 1999-01, Vol.131 (3-4), p.211-218

1999

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Investigations on the oxidation behavior of technical molybdenum foils by means of secondary-ion mass spectrometry

Surface science, 1999-09, Vol.454-456, p.284-288

1999

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Characterization of buried interfaces in electroplated bronze wires by SIMS

Surface and interface analysis, 1987-07, Vol.10 (6), p.267-272

1987

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Progress in materials analysis with SIMS: Quantitative surface and interface characterization

Mikrochimica acta (1966), 1984-09, Vol.84 (5-6), p.317-348

1984

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Investigations on the thermal cycling stability of SiFeCr coated NbWZr

Mikrochimica acta (1966. Print), 2000, Vol.133 (1-4), p.89-93

2000

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Critical evaluation of the state of the art of the analysis of light elements in thin films demonstrated using the examples of SiOXNY and AlOXNY films (IUPAC Technical Report)

Can oxygen stabilize chromium nitride?—Characterization of high temperature cycled chromium oxynitride

Investigations on the oxidation behavior of technical molybdenum foils by means of secondary-ion mass spectrometry

SIMS analysis of the oxidation behaviour of SiFeCr coated technical refractory metal alloys

Three dimensional characterization of trace element distribution in high purity chromium

Statistical evaluation of refractive index, growth rate, hardness and Young's modulus of aluminium oxynitride films

Quantitative SIMS depth profiling of diffusion barrier gate-oxynitride structures in TFT-LCDs

Application of scanning SIMS techniques for the evaluation of the oxidation behavior of high-purity molybdenum

Optimisation of plasma techniques for trace analysis of refractory metals

Investigation of the synthesis and internal structure of protective oxide layers on high-purity chromium with SIMS scanning techniques

Multidimensional optimisation of process parameters by experimental design for the deposition of aluminium and silicon oxynitride films with predictable composition

High performance ultra trace analysis in molybdenum and tungsten accomplished by on-line coupling of ion chromatography with simultaneous ICP-AES

Analysis of tantalum by ICP-AES involving trace-matrix separation

On the mechanism of high-temperature oxidation of ODS superalloys : Significance of yttrium depletion within the oxide scales

Multielement ultratrace analysis of molybdenum with high performance secondary ion mass spectrometry

Analytische Charakterisierung von Phosphor in Hartmetallen und Rohstoffen

Problems of automated qualitative x-ray fluorescence analysis 3-element selection

Distribution analysis of carbon and sulphur in CVD-Al2O3-layers by SIMS using Cs+ primary ions

Applied analytical tools for the characterization of cermets

Quantitative analysis of silicon-oxynitride films by EPMA

Quantitative analysis of thin aluminium-oxynitride films by EPMA

Investigations on the oxidation behavior of technical molybdenum foils by means of secondary-ion mass spectrometry

Characterization of buried interfaces in electroplated bronze wires by SIMS

Progress in materials analysis with SIMS: Quantitative surface and interface characterization

Investigations on the thermal cycling stability of SiFeCr coated NbWZr

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