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Semiconductor science and technology, 2005-04, Vol.20 (4), p.S45-S48
2005
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Journal of physics. Conference series, 2019-10, Vol.1322 (1), p.12035
2019
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IEEE transactions on nuclear science, 2008-06, Vol.55 (3), p.1397-1403
2008
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Journal of electronic materials, 2006-04, Vol.35 (4), p.550-555
2006
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Electronics letters, 2012-02, Vol.48 (3), p.144-146
2012
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Journal of physics. Conference series, 2011-06, Vol.301 (1), p.012037
2011
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Journal of physics. Conference series, 2011-06, Vol.301 (1), p.012065
2011
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IEEE transactions on audio, speech, and language processing, 2010-08, Vol.18 (6), p.1588-1600
2010
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Proceedings of the 21st International Symposium on High Voltage Engineering, p.738-751
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2023 IEEE 50th Photovoltaic Specialists Conference (PVSC), 2023, p.1-3
2023
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Proceedings of the 21st International Symposium on High Voltage Engineering, 2020, p.481-488
2020
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Proceedings of the 21st International Symposium on High Voltage Engineering, 2020, p.1218-1224
2020
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Proceedings of the 21st International Symposium on High Voltage Engineering, 2020, p.1538-1549
2020
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Proceedings of the 21st International Symposium on High Voltage Engineering, 2020, p.643-652
2020
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Proceedings of the 21st International Symposium on High Voltage Engineering, p.308-315
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Proceedings of the 21st International Symposium on High Voltage Engineering, p.1328-1339
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Proceedings of the 21st International Symposium on High Voltage Engineering, p.279-288
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Proceedings of the 21st International Symposium on High Voltage Engineering, 2020, p.410-419
2020
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Proceedings of the 21st International Symposium on High Voltage Engineering, 2020, p.12-21
2020
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Proceedings of the 21st International Symposium on High Voltage Engineering, p.231-241
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Proceedings of the 21st International Symposium on High Voltage Engineering, 2019, p.1406-1417
2019
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Proceedings of the 21st International Symposium on High Voltage Engineering, p.635-642
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Proceedings of the 21st International Symposium on High Voltage Engineering, p.1276-1285
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Proceedings of the 21st International Symposium on High Voltage Engineering, p.663-671
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Proceedings of the 21st International Symposium on High Voltage Engineering, p.811-824
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