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Evaluation of Microlenses, Color Filters, and Polarizing Filters in CIS for Space Applications

Sensors (Basel, Switzerland), 2023-06, Vol.23 (13), p.5884

2023

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Effect of Proton Energy and Bias Conditions during Irradiation on CMOS Single-Photon Avalanche Diodes

IEEE transactions on nuclear science, 2023, p.1-1

2023

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Total Ionizing Dose Effects on a CDTI based CCD-on-CMOS through Buildup of Interface Traps and Oxide Charges

IEEE transactions on nuclear science, 2024, p.1-1

2024

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Proton-Induced Displacement Damages in 2-D and Stacked CMOS SPADs: Study of Dark Count Rate Degradation

IEEE transactions on nuclear science, 2023-04, Vol.70 (4), p.515-522

2023

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Study of Proton-Induced Defects in 40-nm CMOS SPADs

IEEE transactions on nuclear science, 2023-08, Vol.70 (8), p.1680-1686

2023

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Single-Event Effects in CMOS Image Sensors

IEEE transactions on nuclear science, 2013-08, Vol.60 (4), p.2494-2502

2013

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Proton-Induced Displacement Damages in 2D and Stacked CMOS SPADs: Study of Dark Count Rate Degradation

IEEE transactions on nuclear science, 2023-02, p.1-1

2023

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Radiation-Induced Dose and Single Event Effects in Digital CMOS Image Sensors

IEEE transactions on nuclear science, 2014-12, Vol.61 (6), p.3331-3340

2014

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Single Event Effects in 4T Pinned Photodiode Image Sensors

IEEE transactions on nuclear science, 2013-12, Vol.60 (6), p.4314-4322

2013

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Comparison of the 2D and 3D integrated circuit fabrication process for visible imaging SPAD arrays

2015 IEEE Photonics Conference (IPC), 2015, p.442-443

2015

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Evaluation of Microlenses, Color Filters, and Polarizing Filters in CIS for Space Applications

Effect of Proton Energy and Bias Conditions during Irradiation on CMOS Single-Photon Avalanche Diodes

Total Ionizing Dose Effects on a CDTI based CCD-on-CMOS through Buildup of Interface Traps and Oxide Charges

Proton-Induced Displacement Damages in 2-D and Stacked CMOS SPADs: Study of Dark Count Rate Degradation

Study of Proton-Induced Defects in 40-nm CMOS SPADs

Single-Event Effects in CMOS Image Sensors

Proton-Induced Displacement Damages in 2D and Stacked CMOS SPADs: Study of Dark Count Rate Degradation

Radiation-Induced Dose and Single Event Effects in Digital CMOS Image Sensors

Single Event Effects in 4T Pinned Photodiode Image Sensors

Comparison of the 2D and 3D integrated circuit fabrication process for visible imaging SPAD arrays

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