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Evaluating Soft Core RISC-V Processor in SRAM-Based FPGA Under Radiation Effects
IEEE transactions on nuclear science, 2020-07, Vol.67 (7), p.1503-1510
2020
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Register File Criticality and Compiler Optimization Effects on Embedded Microprocessor Reliability
IEEE transactions on nuclear science, 2017-08, Vol.64 (8), p.2179-2187
2017
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S-SETA: Selective Software-Only Error-Detection Technique Using Assertions
IEEE transactions on nuclear science, 2015-12, Vol.62 (6), p.3088-3095
2015
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Single Event Transients in Logic Circuits-Load and Propagation Induced Pulse Broadening
IEEE transactions on nuclear science, 2008-12, Vol.55 (6), p.2928-2935
2008
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Reliability on ARM Processors Against Soft Errors Through SIHFT Techniques
IEEE transactions on nuclear science, 2016-08, Vol.63 (4), p.2208-2216
2016
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Reducing Soft Error Rate of SoCs Analog-to-Digital Interfaces With Design Diversity Redundancy
IEEE transactions on nuclear science, 2020-03, Vol.67 (3), p.518-524
2020
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Reliability Calculation With Respect to Functional Failures Induced by Radiation in TMR Arm Cortex-M0 Soft-Core Embedded Into SRAM-Based FPGA
IEEE transactions on nuclear science, 2019-07, Vol.66 (7), p.1433-1440
2019
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Analyzing the Influence of the Angles of Incidence and Rotation on MBU Events Induced by Low LET Heavy Ions in a 28-nm SRAM-Based FPGA
IEEE transactions on nuclear science, 2017-08, Vol.64 (8), p.2161-2168
2017
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Detecting SEEs in Microprocessors Through a Non-Intrusive Hybrid Technique
IEEE transactions on nuclear science, 2011-06, Vol.58 (3), p.993-1000
2011
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Analyzing the Impact of Single-Event-Induced Charge Sharing in Complex Circuits
IEEE transactions on nuclear science, 2011-12, Vol.58 (6), p.2768-2775
2011
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Tbulk-BICS: A Built-In Current Sensor Robust to Process and Temperature Variations for Soft Error Detection
IEEE transactions on nuclear science, 2008-08, Vol.55 (4), p.2281-2288
2008
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A Self-Checking Scheme to Mitigate Single Event Upset Effects in SRAM-Based FPAAs
IEEE transactions on nuclear science, 2009-08, Vol.56 (4), p.1950-1957
2009
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Improving Reliability of SRAM-Based FPGAs by Inserting Redundant Routing
IEEE transactions on nuclear science, 2006-08, Vol.53 (4), p.2060-2068
2006
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TID in Flash-Based FPGA: Power Supply-Current Rise and Logic Function Mapping Effects in Propagation-Delay Degradation
IEEE transactions on nuclear science, 2011-08, Vol.58 (4), p.1927-1934
2011
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Analyzing the Effects of TID in an Embedded System Running in a Flash-Based FPGA
IEEE transactions on nuclear science, 2011-12, Vol.58 (6), p.2855-2862
2011
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