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An Assessment of Subsurface Residual Stress Analysis in SLM Ti-6Al-4V

Materials, 2017-03, Vol.10 (4), p.348

2017

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Chemistry and Dynamics of Ge in Kesterite: Toward Band-Gap-Graded Absorbers

Chemistry of materials, 2017-11, Vol.29 (21), p.9399-9406

2017

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Ni/Al-Hybrid Cellular Foams: An Interface Study by Combination of 3D-Phase Morphology Imaging, Microbeam Fracture Mechanics and In Situ Synchrotron Stress Analysis

Materials, 2021-06, Vol.14 (13), p.3473

2021

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In Situ Investigations on Stress and Microstructure Evolution in Polycrystalline Ti(C,N)/α-Al2O3 CVD Coatings under Thermal Cycling Loads

Crystals (Basel), 2021-02, Vol.11 (2), p.158

2021

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Formation of CuInSe2 and CuGaSe2 Thin-Films Deposited by Three-Stage Thermal Co-Evaporation: A Real-Time X-Ray Diffraction and Fluorescence Study

Advanced energy materials, 2013-10, Vol.3 (10), p.1381-1387

2013

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Reassessment of evaluation methods for the analysis of near‐surface residual stress fields using energy‐dispersive diffraction

Journal of applied crystallography, 2019-02, Vol.52 (1), p.94-105

2019

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Nondestructive separation of residual stress and composition gradients in thin films by angle‐ and energy‐dispersive X‐ray diffraction. I. Theoretical concepts

Journal of applied crystallography, 2017-02, Vol.50 (1), p.252-264

2017

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Thin Film Analysis by X-Ray Scattering

Birkholz, Mario

1. Aufl., 2006

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X-ray residual stress analysis on multilayer systems: an approach for depth-resolved data evaluation

Journal of applied crystallography, 2013-10, Vol.46 (5), p.1266-1276

2013

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A self-consistent method for X-ray diffraction analysis of multiaxial residual-stress fields in the near-surface region of polycrystalline materials. I. Theoretical concept

Journal of applied crystallography, 1999-08, Vol.32 (4), p.770-778

Genzel, Christoph

1999

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Thin film stress and microstructure analysis by energy-dispersive diffraction

Acta crystallographica. Section A, Foundations and advances, 2014-08, Vol.70 (a1), p.C724-C724

Genzel, Christoph

2014

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Concepts for nondestructive and depth‐resolved X‐ray residual stress analysis in the near‐surface region of nearly single crystalline materials with mosaic structure

Journal of applied crystallography, 2021-02, Vol.54 (1), p.22-31

2021

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Nondestructive residual stress depth profile analysis at the inner surface of small boreholes using energy‐dispersive diffraction under laboratory conditions

Journal of applied crystallography, 2021-02, Vol.54 (1), p.32-41

2021

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The Influence of the Support Structure on Residual Stress and Distortion in SLM Inconel 718 Parts

Metallurgical and materials transactions. A, Physical metallurgy and materials science, 2018-07, Vol.49 (7), p.3038-3046

2018

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EDDIDAT: a graphical user interface for the analysis of energy‐dispersive diffraction data

Journal of applied crystallography, 2020-08, Vol.53 (4), p.1130-1137

2020

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Energy‐dispersive X‐ray stress analysis under geometric constraints: exploiting the material's inherent anisotropy

Journal of applied crystallography, 2023-04, Vol.56 (2), p.526-538

2023

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On the influence of heat treatment on microstructure and mechanical behavior of laser powder bed fused Inconel 718

Materials science & engineering. A, Structural materials : properties, microstructure and processing, 2021-02, Vol.805, p.140555, Article 140555

2021

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Moderne Röntgenbeugung: Röntgendiffraktometrie für Materialwissenschaftler, Physiker und Chemiker

3. Aufl. 2019, 2019

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Photon flux determination of a liquid-metal jet X-ray source by means of photon scattering

Journal of analytical atomic spectrometry, 2019-07, Vol.34 (7), p.1497-152

2019

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Multilayer Systems for Cutting Tools: On the Relationship between Coating Design, Surface Processing, and Residual Stress

Advanced engineering materials, 2011-08, Vol.13 (8), p.845-850

2011

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Rietveld-based energy-dispersive residual stress evaluation: analysis of complex stress fields σij(z)

Journal of applied crystallography, 2014-04, Vol.47 (2), p.511-526

2014

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Diffraction analysis of strongly inhomogeneous residual stress depth distributions by modification of the stress scanning method. II. Experimental implementation

Journal of applied crystallography, 2015-10, Vol.48 (5), p.1462-1475

2015

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In situ observations of single grain behavior during plastic deformation in polycrystalline Ni using energy dispersive Laue diffraction

Materials science & engineering. A, Structural materials : properties, microstructure and processing, 2020-01, Vol.772, p.138778, Article 138778

2020

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Influence of the Grain Size on the Properties of CH3NH3PbI3 Thin Films

ACS applied materials & interfaces, 2017-11, Vol.9 (44), p.38428-38435

2017

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Nondestructive separation of residual stress and composition gradients in thin films by angle‐ and energy‐dispersive X‐ray diffraction. II. Experimental validation

Journal of applied crystallography, 2017-02, Vol.50 (1), p.265-277

2017

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An Assessment of Subsurface Residual Stress Analysis in SLM Ti-6Al-4V

Chemistry and Dynamics of Ge in Kesterite: Toward Band-Gap-Graded Absorbers

Ni/Al-Hybrid Cellular Foams: An Interface Study by Combination of 3D-Phase Morphology Imaging, Microbeam Fracture Mechanics and In Situ Synchrotron Stress Analysis

In Situ Investigations on Stress and Microstructure Evolution in Polycrystalline Ti(C,N)/α-Al2O3 CVD Coatings under Thermal Cycling Loads

Formation of CuInSe2 and CuGaSe2 Thin-Films Deposited by Three-Stage Thermal Co-Evaporation: A Real-Time X-Ray Diffraction and Fluorescence Study

Reassessment of evaluation methods for the analysis of near‐surface residual stress fields using energy‐dispersive diffraction

Nondestructive separation of residual stress and composition gradients in thin films by angle‐ and energy‐dispersive X‐ray diffraction. I. Theoretical concepts

Thin Film Analysis by X-Ray Scattering

X-ray residual stress analysis on multilayer systems: an approach for depth-resolved data evaluation

A self-consistent method for X-ray diffraction analysis of multiaxial residual-stress fields in the near-surface region of polycrystalline materials. I. Theoretical concept

Thin film stress and microstructure analysis by energy-dispersive diffraction

Concepts for nondestructive and depth‐resolved X‐ray residual stress analysis in the near‐surface region of nearly single crystalline materials with mosaic structure

Nondestructive residual stress depth profile analysis at the inner surface of small boreholes using energy‐dispersive diffraction under laboratory conditions

The Influence of the Support Structure on Residual Stress and Distortion in SLM Inconel 718 Parts

EDDIDAT: a graphical user interface for the analysis of energy‐dispersive diffraction data

Energy‐dispersive X‐ray stress analysis under geometric constraints: exploiting the material's inherent anisotropy

On the influence of heat treatment on microstructure and mechanical behavior of laser powder bed fused Inconel 718

Moderne Röntgenbeugung: Röntgendiffraktometrie für Materialwissenschaftler, Physiker und Chemiker

Photon flux determination of a liquid-metal jet X-ray source by means of photon scattering

Multilayer Systems for Cutting Tools: On the Relationship between Coating Design, Surface Processing, and Residual Stress

Rietveld-based energy-dispersive residual stress evaluation: analysis of complex stress fields σij(z)

Diffraction analysis of strongly inhomogeneous residual stress depth distributions by modification of the stress scanning method. II. Experimental implementation

In situ observations of single grain behavior during plastic deformation in polycrystalline Ni using energy dispersive Laue diffraction

Influence of the Grain Size on the Properties of CH3NH3PbI3 Thin Films

Nondestructive separation of residual stress and composition gradients in thin films by angle‐ and energy‐dispersive X‐ray diffraction. II. Experimental validation

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