UB Paderborn / Katalog / Suche / in CDI

1 – 25 von 153

Sortiert nach

Semi-Analytical Modeling of Short-Channel Effects in Si and Ge Symmetrical Double-Gate MOSFETs

IEEE transactions on electron devices, 2007-08, Vol.54 (8), p.1943-1952

2007

Link zum Volltext
Volltext

Threshold Voltage Model for Short-Channel Undoped Symmetrical Double-Gate MOSFETs

IEEE transactions on electron devices, 2008-09, Vol.55 (9), p.2512-2516

2008

Link zum Volltext
Volltext

Low frequency noise variability in ultra scaled FD-SOI n-MOSFETs: Dependence on gate bias, frequency and temperature

Solid-state electronics, 2016-03, Vol.117, p.88-93

2016

Link zum Volltext

Verfügbarkeit prüfen

Influence of AC signal oscillator level on effective mobility measurement by split C–V technique in MOSFETs

Electronics letters, 2016-08, Vol.52 (17), p.1492-1493

2016

Link zum Volltext

Verfügbarkeit prüfen

Drain current local variability from linear to saturation region in 28nm bulk NMOSFETs

Solid-state electronics, 2017-02, Vol.128, p.31-36

2017

Link zum Volltext

Verfügbarkeit prüfen

Semianalytical Modeling of Short-Channel Effects in Lightly Doped Silicon Trigate MOSFETs

IEEE transactions on electron devices, 2008-10, Vol.55 (10), p.2623-2631

2008

Link zum Volltext
Volltext

Impact of low-frequency noise variability on statistical parameter extraction in ultra-scaled CMOS devices

Electronics letters, 2014-09, Vol.50 (19), p.1393-1395

2014

Link zum Volltext

Verfügbarkeit prüfen

Impact of dynamic variability on the operation of CMOS inverter

Electronics letters, 2013-09, Vol.49 (19), p.1214-1216

2013

Link zum Volltext

Verfügbarkeit prüfen

On-current modeling of large-grain polycrystalline silicon thin-film transistors

IEEE transactions on electron devices, 2001-04, Vol.48 (4), p.701-706

2001

Link zum Volltext
Volltext

A Fast and Compact Analog Buffer Design for Active Matrix Liquid Crystal Displays Using Polysilicon Thin-Film Transistors

IEEE transactions on circuits and systems. II, Express briefs, 2008-06, Vol.55 (6), p.537-540

2008

Link zum Volltext
Volltext

On-state drain current modeling of large-grain poly-Si TFTs based on carrier transport through latitudinal and longitudinal grain boundaries

IEEE transactions on electron devices, 2005-08, Vol.52 (8), p.1727-1733

2005

Link zum Volltext
Volltext

Anomalous turn-on voltage degradation during hot-carrier stress in polycrystalline silicon thin-film transistors

IEEE electron device letters, 2001-02, Vol.22 (2), p.74-76

2001

Link zum Volltext
Volltext

Hot-carrier-induced degradation in short p-channel nonhydrogenated polysilicon thin-film transistors

IEEE transactions on electron devices, 2002-09, Vol.49 (9), p.1552-1557

2002

Link zum Volltext
Volltext

An analytical hot-carrier induced degradation model in polysilicon TFTs

IEEE transactions on electron devices, 2005-10, Vol.52 (10), p.2182-2187

2005

Link zum Volltext
Volltext

Stability of Amorphous-Silicon and Nanocrystalline Silicon Thin-Film Transistors Under DC and AC Stress

IEEE electron device letters, 2007-09, Vol.28 (9), p.803-805

2007

Link zum Volltext
Volltext

Study of the Drain Leakage Current in Bottom-Gated Nanocrystalline Silicon Thin-Film Transistors by Conduction and Low-Frequency Noise Measurements

IEEE transactions on electron devices, 2007-05, Vol.54 (5), p.1076-1082

2007

Link zum Volltext
Volltext

Effect of Channel Width on the Electrical Characteristics of Amorphous/Nanocrystalline Silicon Bilayer Thin-Film Transistors

IEEE transactions on electron devices, 2007-05, Vol.54 (5), p.1265-1269

2007

Link zum Volltext
Volltext

Model of low frequency noise in polycrystalline silicon thin-film transistors

IEEE electron device letters, 2001-08, Vol.22 (8), p.381-383

2001

Link zum Volltext
Volltext

Effect of Channel Width Shortening on the Stability of a-Si:H/nc-Si:H Bilayer Thin-Film Transistors

IEEE electron device letters, 2008-08, Vol.29 (8), p.873-875

2008

Link zum Volltext
Volltext

Drain current local variability analysis in nanoscale junctionless FinFETs utilizing a compact model

Solid-state electronics, 2020-08, Vol.170, p.107835, Article 107835

2020

Link zum Volltext

Verfügbarkeit prüfen

Corrigendum to “Drain current local variability analysis in nanoscale junctionless FinFETs utilizing a compact model” [Solid-State Electron. 170 (2020) 107835]

Solid-state electronics, 2020-09, Vol.171, p.107865, Article 107865

2020

Link zum Volltext

Verfügbarkeit prüfen

Management of bile duct injury during and after laparoscopic cholecystectomy

Surgical endoscopy, 2003, Vol.17 (1), p.31-37

2003

Link zum Volltext

Verfügbarkeit prüfen

Full gate voltage range Lambert-function based methodology for FDSOI MOSFET parameter extraction

Solid-state electronics, 2015-09, Vol.111, p.123-128

2015

Link zum Volltext

Verfügbarkeit prüfen

Continuous and symmetric trans-capacitance compact model for triple-gate junctionless MOSFETs

Solid-state electronics, 2021-01, Vol.175, p.107945, Article 107945

2021

Link zum Volltext

Verfügbarkeit prüfen

Performance enhancement of offset gated polysilicon thin-film transistors

IEEE electron device letters, 2000-12, Vol.21 (12), p.584-586

2000

Link zum Volltext
Volltext

1 – 25 von 153

Suche als RSS-Feed

Suchergebnisse filtern

Filter anzeigen

Nur zeigen

Geprüft (Peer-Review)
(127)
Mit Volltextzugriff
(152)

Publikationsform

Sprache

Englisch
(153)
Japanisch
(31)

Erscheinungsjahr

n.n

Thema

Science & Technology
(128)
Technology
(112)
Physics
(101)
Engineering
(95)
Engineering, Electrical & Electronic
(95)
Physical Sciences
(94)
Physics, Applied
(81)
Exact Sciences And Technology
(65)
Physics, Condensed Matter
(47)
Applied Sciences
(45)
Electronics
(43)
Transistors
(42)
Semiconductor Electronics. Microelectronics. Optoelectronics. Solid State Devices
(40)
Microelectronics
(38)
Engineering Sciences
(37)
Micro And Nanotechnologies
(36)
Thin Film Transistors
(31)
Silicon
(28)
Electrical And Electronic Engineering
(25)
Electronic, Optical And Magnetic Materials
(25)

15 weitere anzeigen...

Weniger anzeigen...

Menü

Weitere Dienste

Einstellungen

Semi-Analytical Modeling of Short-Channel Effects in Si and Ge Symmetrical Double-Gate MOSFETs

Threshold Voltage Model for Short-Channel Undoped Symmetrical Double-Gate MOSFETs

Low frequency noise variability in ultra scaled FD-SOI n-MOSFETs: Dependence on gate bias, frequency and temperature

Influence of AC signal oscillator level on effective mobility measurement by split C–V technique in MOSFETs

Drain current local variability from linear to saturation region in 28nm bulk NMOSFETs

Semianalytical Modeling of Short-Channel Effects in Lightly Doped Silicon Trigate MOSFETs

Impact of low-frequency noise variability on statistical parameter extraction in ultra-scaled CMOS devices

Impact of dynamic variability on the operation of CMOS inverter

On-current modeling of large-grain polycrystalline silicon thin-film transistors

A Fast and Compact Analog Buffer Design for Active Matrix Liquid Crystal Displays Using Polysilicon Thin-Film Transistors

On-state drain current modeling of large-grain poly-Si TFTs based on carrier transport through latitudinal and longitudinal grain boundaries

Anomalous turn-on voltage degradation during hot-carrier stress in polycrystalline silicon thin-film transistors

Hot-carrier-induced degradation in short p-channel nonhydrogenated polysilicon thin-film transistors

An analytical hot-carrier induced degradation model in polysilicon TFTs

Stability of Amorphous-Silicon and Nanocrystalline Silicon Thin-Film Transistors Under DC and AC Stress

Study of the Drain Leakage Current in Bottom-Gated Nanocrystalline Silicon Thin-Film Transistors by Conduction and Low-Frequency Noise Measurements

Effect of Channel Width on the Electrical Characteristics of Amorphous/Nanocrystalline Silicon Bilayer Thin-Film Transistors

Model of low frequency noise in polycrystalline silicon thin-film transistors

Effect of Channel Width Shortening on the Stability of a-Si:H/nc-Si:H Bilayer Thin-Film Transistors

Drain current local variability analysis in nanoscale junctionless FinFETs utilizing a compact model

Corrigendum to “Drain current local variability analysis in nanoscale junctionless FinFETs utilizing a compact model” [Solid-State Electron. 170 (2020) 107835]

Management of bile duct injury during and after laparoscopic cholecystectomy

Full gate voltage range Lambert-function based methodology for FDSOI MOSFET parameter extraction

Continuous and symmetric trans-capacitance compact model for triple-gate junctionless MOSFETs

Performance enhancement of offset gated polysilicon thin-film transistors

Suchergebnisse filtern