UB Paderborn / Katalog / Suche / in CDI

Physical review. E, Statistical physics, plasmas, fluids, and related interdisciplinary topics, 2003-04, Vol.67 (4 Pt 2), p.046611-046611, Article 046611

2003

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The role of scanning mode in near-field optical microscopy

Surface science, 1997-06, Vol.382 (1), p.9-18

1997

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Easy-to-use unglued tip replacement near-field optical microscope with piezoelectric shear force detection

Review of scientific instruments, 2000-09, Vol.71 (9), p.3441-3443

2000

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Isotropic incoherent scanning tunneling optical microscope (I 2STOM)

Optics communications, 2000-02, Vol.175 (1), p.83-88

2000

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Near‐field optical probing of two‐dimensional photonic crystals: theory and experiment

Journal of microscopy (Oxford), 2001-04, Vol.202 (1), p.110-116

2001

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A theoretical model for the Inverse Scanning Tunneling Optical Microscope (ISTOM)

Optics communications, 1995-02, Vol.114 (5), p.470-480

1995

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Piezoelectric shear force detection: A geometry avoiding critical tip/tuning fork gluing

Review of scientific instruments, 1998-04, Vol.69 (4), p.1744-1746

1998

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Novel spectromicroscopy: Pt–GaP studies by spatially resolved internal photoemission with near-field optics

Applied physics letters, 1996-10, Vol.69 (16), p.2361-2363

1996

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Photopolymers as vectorial sensors of the electric field

An all-fiber device for generating radially and other polarized light beams

Near field microscopy and near field optics

A versatile and stable device allowing the efficient generation of beams with radial, azimuthal or hybrid polarizations

Nanoring as a magnetic or electric field sensitive nano-antenna for near-field optics applications

Conical optics: the solution to confine light

Bessel beams as virtual tips for near‐field optics

Annular nanoantenna on fibre micro-axicon

Influence of the water layer on the shear force damping in near-field microscopy

Immaterial tip concept by light confinement

Nanopositioning system for macroscopic components based on shear-force detection

Scanning tunneling optical microscopy

Detection of nonradiative fields in light of the Heisenberg uncertainty principle and the Rayleigh criterion

Near‐field imaging: some attempts to define an apparatus function

Comparison of test images obtained from various configurations of scanning near-field optical microscopes

Photopolymer as vectorial sensors of the electric field

Polarization filtering induced by imaging systems: effect on image structure

The role of scanning mode in near-field optical microscopy

Easy-to-use unglued tip replacement near-field optical microscope with piezoelectric shear force detection

Isotropic incoherent scanning tunneling optical microscope (I 2STOM)

Near‐field optical probing of two‐dimensional photonic crystals: theory and experiment

A theoretical model for the Inverse Scanning Tunneling Optical Microscope (ISTOM)

Piezoelectric shear force detection: A geometry avoiding critical tip/tuning fork gluing

Novel spectromicroscopy: Pt–GaP studies by spatially resolved internal photoemission with near-field optics

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