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Optimizing Inverse-Mode SiGe HBTs for Immunity to Heavy-Ion-Induced Single-Event Upset

IEEE electron device letters, 2009-05, Vol.30 (5), p.511-513

2009

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IEEE_Xplore

A Novel Device Architecture for SEU Mitigation: The Inverse-Mode Cascode SiGe HBT

IEEE transactions on nuclear science, 2009-12, Vol.56 (6), p.3393-3401

2009

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IEEE_Xplore

Understanding Radiation- and Hot Carrier-Induced Damage Processes in SiGe HBTs Using Mixed-Mode Electrical Stress

IEEE transactions on nuclear science, 2007-12, Vol.54 (6), p.1938-1945

2007

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IEEE_Xplore

Impact of Scaling on the Inverse-Mode Operation of SiGe HBTs

IEEE transactions on electron devices, 2007-06, Vol.54 (6), p.1492-1501

2007

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IEEE_Xplore

Junction Isolation Single Event Radiation Hardening of a 200 GHz SiGe:C HBT Technology Without Deep Trench Isolation

IEEE transactions on nuclear science, 2009-12, Vol.56 (6), p.3402-3407

2009

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IEEE_Xplore

Temperature-Dependence of Off-State Drain Leakage in X-Ray Irradiated 130 nm CMOS Devices

IEEE transactions on nuclear science, 2006-12, Vol.53 (6), p.3203-3209

2006

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IEEE_Xplore

The Radiation Tolerance of Strained Si/SiGe n-MODFETs

IEEE transactions on nuclear science, 2007-12, Vol.54 (6), p.2251-2256

2007

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IEEE_Xplore

Optimizing Inverse-Mode @@iSiGe HBTs@ for Immunity to Heavy-Ion-Induced Single-Event Upset

IEEE electron device letters, 2009-05, Vol.30 (5), p.511-513

2009

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Overshoot-induced failures in forward-biased diodes: A new challenge to high-speed ESD design

2013 IEEE International Reliability Physics Symposium (IRPS), 2013, p.2B.1.1-2B.1.8

2013

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IEEE_Xplore

The Effects of Proton and X-Ray Irradiation on the DC and AC Performance of Complementary (npn + pnp) SiGe HBTs on Thick-Film SOI

IEEE transactions on nuclear science, 2007-12, Vol.54 (6), p.2245-2250

2007

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IEEE_Xplore

Engineering optimal high current characteristics of high voltage DENMOS

2012 IEEE International Reliability Physics Symposium (IRPS), 2012, p.3E.1.1-3E.1.6

2012

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IEEE_Xplore

Modeling mixed-mode DC and RF stress in SiGe HBT power amplifiers

2008 IEEE Bipolar/BiCMOS Circuits and Technology Meeting, 2008, p.133-136

2008

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IEEE_Xplore

A novel device structure using a shared-subcollector, cascoded inverse-mode SiGe HBT for enhanced radiation tolerance

2009 IEEE Bipolar/BiCMOS Circuits and Technology Meeting, 2009, p.79-82

2009

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IEEE_Xplore

A novel base current phenomenon in SiGe HBTs operating in inverse mode

ESSDERC 2007 - 37th European Solid State Device Research Conference, 2007, p.350-353

2007

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IEEE_Xplore

Impact of deep trench isolation on advanced SiGe HBT reliability in radiation environments

2009 IEEE International Reliability Physics Symposium, 2009, p.157-164

2009

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IEEE_Xplore

The Effects of Proton Irradiation on 90 nm Strained Si CMOS on SOI Devices

2006 IEEE Radiation Effects Data Workshop, 2006, p.62-65

2006

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IEEE_Xplore

Cryogenic matching performance of 90 nm MOSFETs

2009 International Semiconductor Device Research Symposium, 2009, p.1-2

2009

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IEEE_Xplore

A New Current-Sweep Method for Assessing the Mixed-Mode Damage Spectrum of SiGe HBTs

IEEE transactions on device and materials reliability, 2007-09, Vol.7 (3), p.479-487

2007

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IEEE_Xplore

Probing Hot Carrier Phenomena in npn and pnp SiGe HBTs

2008 IEEE Topical Meeting on Silicon Monolithic Integrated Circuits in RF Systems, 2008, p.54-57

2008

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IEEE_Xplore

A New Device Phenomenon in Cryogenically-Operated SiGe HBTs

2006 International Electron Devices Meeting, 2006, p.1-4

2006

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IEEE_Xplore

Reverse Active Operation of 200 GHz SiGe HBTs

2005 International Semiconductor Device Research Symposium, 2005, p.183-184

2005

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IEEE_Xplore

Neural Correlates of Urinary Retention in Lateral Medullary Infarction

International neurourology journal, 2019-09, p.205-210

2019

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Pop-out illusion as the initial presentation of posterior cortical atrophy

Neurocase, 2021-06, Vol.27 (3), p.266-269

Prabhakar, T Appaswamy

2021

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Homogeneous cooling of a dilute polydisperse granular gas

Granular matter, 2022-05, Vol.24 (2), Article 46

2022

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HAX1 deficiency causes autosomal recessive severe congenital neutropenia (Kostmann disease)

Nature genetics, 2007-01, Vol.39 (1), p.86-92

2007

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Optimizing Inverse-Mode SiGe HBTs for Immunity to Heavy-Ion-Induced Single-Event Upset

A Novel Device Architecture for SEU Mitigation: The Inverse-Mode Cascode SiGe HBT

Understanding Radiation- and Hot Carrier-Induced Damage Processes in SiGe HBTs Using Mixed-Mode Electrical Stress

Impact of Scaling on the Inverse-Mode Operation of SiGe HBTs

Junction Isolation Single Event Radiation Hardening of a 200 GHz SiGe:C HBT Technology Without Deep Trench Isolation

Temperature-Dependence of Off-State Drain Leakage in X-Ray Irradiated 130 nm CMOS Devices

The Radiation Tolerance of Strained Si/SiGe n-MODFETs

Optimizing Inverse-Mode @@iSiGe HBTs@ for Immunity to Heavy-Ion-Induced Single-Event Upset

Overshoot-induced failures in forward-biased diodes: A new challenge to high-speed ESD design

The Effects of Proton and X-Ray Irradiation on the DC and AC Performance of Complementary (npn + pnp) SiGe HBTs on Thick-Film SOI

Engineering optimal high current characteristics of high voltage DENMOS

Modeling mixed-mode DC and RF stress in SiGe HBT power amplifiers

A novel device structure using a shared-subcollector, cascoded inverse-mode SiGe HBT for enhanced radiation tolerance

A novel base current phenomenon in SiGe HBTs operating in inverse mode

Impact of deep trench isolation on advanced SiGe HBT reliability in radiation environments

The Effects of Proton Irradiation on 90 nm Strained Si CMOS on SOI Devices

Cryogenic matching performance of 90 nm MOSFETs

A New Current-Sweep Method for Assessing the Mixed-Mode Damage Spectrum of SiGe HBTs

Probing Hot Carrier Phenomena in npn and pnp SiGe HBTs

A New Device Phenomenon in Cryogenically-Operated SiGe HBTs

Reverse Active Operation of 200 GHz SiGe HBTs

Neural Correlates of Urinary Retention in Lateral Medullary Infarction

Pop-out illusion as the initial presentation of posterior cortical atrophy

Homogeneous cooling of a dilute polydisperse granular gas

HAX1 deficiency causes autosomal recessive severe congenital neutropenia (Kostmann disease)

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