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Surface science, 2001-02, Vol.473 (3), p.172-182
2001
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Asian agricultural research, 2018-09, Vol.10 (9), p.63-73
1812, 2018
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Electronics (Basel), 2022-06, Vol.11 (11)
2022
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2019 IEEE Custom Integrated Circuits Conference (CICC), 2019, p.1-4
2019
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2018 IEEE Custom Integrated Circuits Conference (CICC), 2018, p.1-4
2018
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Sensors (Basel, Switzerland), 2019-04, Vol.19 (8)
2019
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Sensors (Basel, Switzerland), 2019-04, Vol.19 (8), p.1777
2019
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IET circuits, devices & systems, 2021-11, Vol.15 (8), p.738-744
2021
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2022 IEEE Asian Solid-State Circuits Conference (A-SSCC), 2022, p.10-12
2022
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IEEE transactions on very large scale integration (VLSI) systems, 2022-07, Vol.30 (7), p.905-914
2022
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2022 14th German Microwave Conference (GeMiC), 2022, p.104-107
2022
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IEEE transactions on circuits and systems. II, Express briefs, 2017-06, Vol.64 (6), p.655-659
2017
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日本鉱業会誌, 1984/07/25, Vol.100(1157), pp.610-614
1984
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IEEE electron device letters, 1999-01, Vol.20 (5), p.206-208
1999
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IEEE electron device letters, 1999-05, Vol.20 (5), p.206-208
1999
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IEEE electron device letters, 1999-05, Vol.20 (5), p.206-208
1999
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ChemElectroChem, 2020-07, Vol.7 (14), p.3089-3097
2020
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IEEE electron device letters, 1999-05, Vol.20 (5), p.206-208
1999
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2010 International Electron Devices Meeting, 2010, p.27.5.1-27.5.4
- Butt, N
- Mcstay, K
- Cestero, A
- Ho, H
- Kong, W
- Fang, S
- Krishnan, R
- Khan, B
- Tessier, A
- Davies, W
- Lee, S
- Zhang, Y
- Johnson, J
- Rombawa, S
- Takalkar, R
- Blauberg, A
- Hawkins, K V
- Liu, J
- Rosenblatt, S
- Goyal, P
- Gupta, S
- Ervin, J
- Li, Z
- Galis, S
- Barth, J
- Yin, M
- Weaver, T
- Li, J H
- Narasimha, S
- Parries, P
- Henson, W K
- Robson, N
- Kirihata, T
- Chudzik, M
- Maciejewski, E
- Agnello, P
- Stiffler, S
- Iyer, S S
2010
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軽金属, 1978/04/30, Vol.28(4), pp.199-201
1978
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2010 IEEE Radio Frequency Integrated Circuits Symposium, 2010, p.123-126
2010
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2018 IEEE SOI-3D-Subthreshold Microelectronics Technology Unified Conference (S3S), 2018, p.1-2
2018
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日本金属学会誌, 1960, Vol.24(7), pp.421-424
1960
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日本金属学会誌, 1959, Vol.23(2), pp.132-134
1959
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2010 Symposium on VLSI Technology, 2010, p.19-20
- Basker, V S
- Standaert, T
- Kawasaki, H
- Yeh, C
- Maitra, K
- Yamashita, T
- Faltermeier, J
- Adhikari, H
- Jagannathan, H
- Wang, J
- Sunamura, H
- Kanakasabapathy, S
- Schmitz, S
- Cummings, J
- Inada, A
- Lin, C
- Kulkarni, P
- Zhu, Y
- Kuss, J
- Yamamoto, T
- Kumar, A
- Wahl, J
- Yagishita, A
- Edge, L F
- Kim, R H
- Mclellan, E
- Holmes, S J
- Johnson, R C
- Levin, T
- Demarest, J
- Hane, M
- Takayanagi, M
- Colburn, M
- Paruchuri, V K
- Miller, R J
- Bu, H
- Doris, B
- McHerron, D
- Leobandung, E
- O'Neill, J
2010
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