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Advanced Electrical Circuit Analysis: Practice Problems, Methods, and Solutions

Rahmani-Andebili, Mehdi

1st Edition 2022, 2021

Volltextzugriff (PDF)

Hardware Trojan: Threats and emerging solutions

2009 IEEE International High Level Design Validation and Test Workshop, 2009, p.166-171

2009

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Effects of voltage harmonic on losses and temperature rise in distribution transformers

IET generation, transmission & distribution, 2018-01, Vol.12 (2), p.347-354

2018

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True random bit generation from a double-scroll attractor

IEEE transactions on circuits and systems. 1, Fundamental theory and applications, 2004-07, Vol.51 (7), p.1395-1404

2004

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VLSI Test Principles and Architectures - Design for Testability

1, 2006

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Fault detection in multiple controlled Fredkin circuits

IET circuits, devices & systems, 2019-08, Vol.13 (5), p.723-729

2019

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Signature Testing of Analog and RF Circuits: Algorithms and Methodology

IEEE transactions on circuits and systems. 1, Fundamental theory and applications, 2007-05, Vol.54 (5), p.1018-1031

2007

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L- and S-Band Compact Octave Bandwidth 4-bit MMIC Phase Shifters

IEEE transactions on microwave theory and techniques, 2008-02, Vol.56 (2), p.293-299

2008

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Characterization of the Temperature Dependence of the Piezoresistive Coefficients of Silicon From 150\,^C to 125\,^C

IEEE sensors journal, 2008-08, Vol.8 (8), p.1455-1468

2008

Volltextzugriff (PDF)

ESD: Failure Mechanisms and Models

Voldman, Steven H

1. Aufl., 2009

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Qualification and Integration Aspects of the DSSC Mega-Pixel X-Ray Imager

IEEE transactions on nuclear science, 2019-08, Vol.66 (8), p.1966-1975

2019

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An industry-driven laboratory development for mixed-signal IC test education

2010 IEEE International Symposium on Circuits and Systems (ISCAS), 2010, p.85-88

2010

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Testing Techniques for Hardware Security

2008 IEEE International Test Conference, 2008, p.1-10

2008

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Contactless Measurement of Absolute Voltage Waveforms by a Passive Electric-Field Probe

IEEE microwave and wireless components letters, 2016-12, Vol.26 (12), p.1008-1010

2016

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Test-Pattern Selection for Screening Small-Delay Defects in Very-Deep Submicrometer Integrated Circuits

IEEE transactions on computer-aided design of integrated circuits and systems, 2010-05, Vol.29 (5), p.760-773

2010

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An efficient test vector compression scheme using selective Huffman coding

IEEE transactions on computer-aided design of integrated circuits and systems, 2003-06, Vol.22 (6), p.797-806

2003

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On-chip testing of blind and open-sleeve TSVs for 3D IC before bonding

2010 28th VLSI Test Symposium (VTS), 2010, p.263-268

2010

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Design and Testing of Reversible Logic

1st ed. 2020., 2019

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Nine-coded compression technique for testing embedded cores in SoCs

IEEE transactions on very large scale integration (VLSI) systems, 2005-06, Vol.13 (6), p.719-731

2005

Volltextzugriff (PDF)

Prediction of analog performance parameters using fast transient testing

IEEE transactions on computer-aided design of integrated circuits and systems, 2002-03, Vol.21 (3), p.349-361

2002

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Low Frequency Pulsed Resonant Converter for Energy Harvesting

IEEE transactions on power electronics, 2007-01, Vol.22 (1), p.63-68

2007

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Diagnosis of Integrated Circuits With Multiple Defects of Arbitrary Characteristics

IEEE transactions on computer-aided design of integrated circuits and systems, 2010-06, Vol.29 (6), p.977-987

2010

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Effect of the Ion Mass and Energy on the Response of 70-nm SOI Transistors to the Ion Deposited Charge by Direct Ionization

IEEE transactions on nuclear science, 2010-08, Vol.57 (4), p.1892-1899

2010

Volltextzugriff (PDF)

Clock, Flip-Flop, and Combinatorial Logic Contributions to the SEU Cross Section in 90 nm ASIC Technology

IEEE transactions on nuclear science, 2009-12, Vol.56 (6), p.3542-3550

2009

Volltextzugriff (PDF)

Variable-length input Huffman coding for system-on-a-chip test

IEEE transactions on computer-aided design of integrated circuits and systems, 2003-06, Vol.22 (6), p.783-796

2003

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Advanced Electrical Circuit Analysis: Practice Problems, Methods, and Solutions

Hardware Trojan: Threats and emerging solutions

Effects of voltage harmonic on losses and temperature rise in distribution transformers

True random bit generation from a double-scroll attractor

VLSI Test Principles and Architectures - Design for Testability

Fault detection in multiple controlled Fredkin circuits

Signature Testing of Analog and RF Circuits: Algorithms and Methodology

L- and S-Band Compact Octave Bandwidth 4-bit MMIC Phase Shifters

Characterization of the Temperature Dependence of the Piezoresistive Coefficients of Silicon From 150\,^C to 125\,^C

ESD: Failure Mechanisms and Models

Qualification and Integration Aspects of the DSSC Mega-Pixel X-Ray Imager

An industry-driven laboratory development for mixed-signal IC test education

Testing Techniques for Hardware Security

Contactless Measurement of Absolute Voltage Waveforms by a Passive Electric-Field Probe

Test-Pattern Selection for Screening Small-Delay Defects in Very-Deep Submicrometer Integrated Circuits

An efficient test vector compression scheme using selective Huffman coding

On-chip testing of blind and open-sleeve TSVs for 3D IC before bonding

Design and Testing of Reversible Logic

Nine-coded compression technique for testing embedded cores in SoCs

Prediction of analog performance parameters using fast transient testing

Low Frequency Pulsed Resonant Converter for Energy Harvesting

Diagnosis of Integrated Circuits With Multiple Defects of Arbitrary Characteristics

Effect of the Ion Mass and Energy on the Response of 70-nm SOI Transistors to the Ion Deposited Charge by Direct Ionization

Clock, Flip-Flop, and Combinatorial Logic Contributions to the SEU Cross Section in 90 nm ASIC Technology

Variable-length input Huffman coding for system-on-a-chip test

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