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A comprehensive survey of fake news in social networks: Attributes, features, and detection approaches

Journal of King Saud University. Computer and information sciences, 2023-06, Vol.35 (6), p.101571, Article 101571

2023

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On-Chip Adaptive Body Bias for Reducing the Impact of NBTI on 6T SRAM Cells

IEEE transactions on semiconductor manufacturing, 2018-05, Vol.31 (2), p.242-249

2018

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A Novel FPGA Accelerator Design for Real-Time and Ultra-Low Power Deep Convolutional Neural Networks Compared With Titan X GPU

IEEE access, 2020, Vol.8, p.105455-105471

2020

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Stable, Low Power and Bit-Interleaving Aware SRAM Memory for Multi-Core Processing Elements

Electronics (Basel), 2021-11, Vol.10 (21), p.2724

2021

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Ultra-Low Power and High-Throughput SRAM Design to Enhance AI Computing Ability in Autonomous Vehicles

Electronics (Basel), 2021-02, Vol.10 (3), p.256

2021

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A Novel Ultra-Low Power 8T SRAM-Based Compute-in-Memory Design for Binary Neural Networks

Electronics (Basel), 2021-09, Vol.10 (17), p.2181

2021

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Novel CNN-Based AP2D-Net Accelerator: An Area and Power Efficient Solution for Real-Time Applications on Mobile FPGA

Electronics (Basel), 2020-05, Vol.9 (5), p.832

2020

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Design and Development of BTI Model and 3D InGaAs HEMT-Based SRAM for Reliable and Secure Internet of Things Application

Electronics (Basel), 2020-03, Vol.9 (3), p.469

2020

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Low-Power RTL Code Generation for Advanced CNN Algorithms toward Object Detection in Autonomous Vehicles

Electronics (Basel), 2020-03, Vol.9 (3), p.478

2020

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Sensitive, Linear, Robust Current-To-Time Converter Circuit for Vehicle Automation Application

Electronics (Basel), 2020-03, Vol.9 (3), p.490

2020

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A Reactive and On-Chip Sensor Circuit for NBTI and PBTI Resilient SRAM Design

Electronics (Basel), 2020-02, Vol.9 (2), p.326

2020

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Design of a Voltage to Time Converter with High Conversion Gain for Reliable and Secure Autonomous Vehicles

Electronics (Basel), 2020-03, Vol.9 (3), p.384

2020

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Symmetric dual gate insulator-based FinFET module and design window for reliable circuits

Micro & nano letters, 2019-03, Vol.14 (3), p.317-322

2019

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Stable, Reliable, and Bit-Interleaving 12T SRAM for Space Applications: A Device Circuit Co-Design

IEEE transactions on semiconductor manufacturing, 2017-08, Vol.30 (3), p.276-284

2017

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IEEE_Xplore

An efficient NBTI sensor and compensation circuit for stable and reliable SRAM cells

Microelectronics and reliability, 2018-08, Vol.87, p.15-23

2018

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SPICE compatible semi-empirical compact model for ferroelectric hysteresis

Solid-state electronics, 2023-01, Vol.199, p.108501, Article 108501

2023

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Integration of ferroelectric devices for advanced in-memory computing concepts

Japanese Journal of Applied Physics, 2024-05, Vol.63 (5), p.050802

2024

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Analysis of trap-assisted tunnelling in asymmetrical underlap 3D-cylindrical GAA-TFET based on hetero-spacer engineering for improved device reliability

Micro & nano letters, 2017-12, Vol.12 (12), p.982-986

2017

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Low-Frequency Noise Sources and Back-Gate Coupling Effects in FDX-SOI Device

2023 IEEE International Integrated Reliability Workshop (IIRW), 2023, p.1-4

2023

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IEEE_Xplore

SUBHDIP: process variations tolerant subthreshold Darlington pair-based NBTI sensor circuit

IET computers & digital techniques, 2019-05, Vol.13 (3), p.243-249

2019

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Analog/RF characteristics of a 3D-Cyl underlap GAA-TFET based on a Ge source using fringing-field engineering for low-power applications

Journal of computational electronics, 2018-12, Vol.17 (4), p.1650-1657

2018

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Impact of varying carbon concentration in SiC S/D asymmetric dual-k spacer for high performance and reliable FinFET

Journal of semiconductors, 2018-10, Vol.39 (10), p.104001

2018

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A novel stability and process sensitivity driven model for optimal sized FinFET based SRAM

Microelectronics and reliability, 2015-07, Vol.55 (8), p.1131-1143

2015

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LISOCHIN: An NBTI Degradation Monitoring Sensor for Reliable CMOS Circuits

VLSI Design and Test, p.441-451

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A New Sensitivity-Driven Process Variation Aware Self-Repairing Low-Power SRAM Design

2014 27th International Conference on VLSI Design and 2014 13th International Conference on Embedded Systems, 2014, p.116-121

2014

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IEEE_Xplore

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A comprehensive survey of fake news in social networks: Attributes, features, and detection approaches

On-Chip Adaptive Body Bias for Reducing the Impact of NBTI on 6T SRAM Cells

A Novel FPGA Accelerator Design for Real-Time and Ultra-Low Power Deep Convolutional Neural Networks Compared With Titan X GPU

Stable, Low Power and Bit-Interleaving Aware SRAM Memory for Multi-Core Processing Elements

Ultra-Low Power and High-Throughput SRAM Design to Enhance AI Computing Ability in Autonomous Vehicles

A Novel Ultra-Low Power 8T SRAM-Based Compute-in-Memory Design for Binary Neural Networks

Novel CNN-Based AP2D-Net Accelerator: An Area and Power Efficient Solution for Real-Time Applications on Mobile FPGA

Design and Development of BTI Model and 3D InGaAs HEMT-Based SRAM for Reliable and Secure Internet of Things Application

Low-Power RTL Code Generation for Advanced CNN Algorithms toward Object Detection in Autonomous Vehicles

Sensitive, Linear, Robust Current-To-Time Converter Circuit for Vehicle Automation Application

A Reactive and On-Chip Sensor Circuit for NBTI and PBTI Resilient SRAM Design

Design of a Voltage to Time Converter with High Conversion Gain for Reliable and Secure Autonomous Vehicles

Symmetric dual gate insulator-based FinFET module and design window for reliable circuits

Stable, Reliable, and Bit-Interleaving 12T SRAM for Space Applications: A Device Circuit Co-Design

An efficient NBTI sensor and compensation circuit for stable and reliable SRAM cells

SPICE compatible semi-empirical compact model for ferroelectric hysteresis

Integration of ferroelectric devices for advanced in-memory computing concepts

Analysis of trap-assisted tunnelling in asymmetrical underlap 3D-cylindrical GAA-TFET based on hetero-spacer engineering for improved device reliability

Low-Frequency Noise Sources and Back-Gate Coupling Effects in FDX-SOI Device

SUBHDIP: process variations tolerant subthreshold Darlington pair-based NBTI sensor circuit

Analog/RF characteristics of a 3D-Cyl underlap GAA-TFET based on a Ge source using fringing-field engineering for low-power applications

Impact of varying carbon concentration in SiC S/D asymmetric dual-k spacer for high performance and reliable FinFET

A novel stability and process sensitivity driven model for optimal sized FinFET based SRAM

LISOCHIN: An NBTI Degradation Monitoring Sensor for Reliable CMOS Circuits

A New Sensitivity-Driven Process Variation Aware Self-Repairing Low-Power SRAM Design

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