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Phase transition, effective mass and carrier mobility of MoS2 monolayer under tensile strain

Applied surface science, 2015, Vol.325, p.27-32

2015

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A Self-Compliant One-Diode-One-Resistor Bipolar Resistive Random Access Memory for Low Power Application

IEEE electron device letters, 2014-02, Vol.35 (2), p.196-198

2014

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Characterization of Transient Gate Oxide Trapping in SiC MOSFETs Using Fast I- V Techniques

IEEE transactions on electron devices, 2008-08, Vol.55 (8), p.2004-2012

2008

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Correlation between microstructure, electronic properties and flicker noise in organic thin film transistors

Applied physics letters, 2008-03, Vol.92 (13), p.132103-132103-3

2008

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Self-assembled nanowire array capacitors: capacitance and interface state profile

Nanotechnology, 2014-04, Vol.25 (13), p.135201-135201

2014

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Silicon nanowire on oxide/nitride/oxide for memory application

Nanotechnology, 2007-06, Vol.18 (23), p.235204-235204 (4)

2007

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The large-scale integration of high-performance silicon nanowire field effect transistors

Nanotechnology, 2009-10, Vol.20 (41), p.415202-415202

2009

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Random telegraph signals in n-type ZnO nanowire field effect transistors at low temperature

Applied physics letters, 2007-07, Vol.91 (5)

2007

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Noise in ZnO Nanowire Field Effect Transistors

Journal of nanoscience and nanotechnology, 2009-02, Vol.9 (2), p.1041-1044

2009

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Doping induces large variation in the electrical properties of MoS2 monolayers

Solid-state electronics, 2015-04, Vol.106, p.44-49

2015

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Methods to Characterize the Electrical and Mechanical Properties of Si Nanowires

Frontiers of Characterization and Metrology for Nanoelectronics: 2007 (AIP Conference Proceedings Volume 931), 2007, Vol.931, p.457-461

2007

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Low frequency noise characterizations of ZnO nanowire field effect transistors

Journal of applied physics, 2007-02, Vol.101 (4), p.044313-044313-5

2007

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Metrology for the Electrical Characterization of Semiconductor Nanowires

IEEE transactions on electron devices, 2008-11, Vol.55 (11), p.3086-3095

2008

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Efficacy of balloon dilation in the treatment of symptomatic Eustachian tube dysfunction: One year follow-up study

American journal of otolaryngology, 2016-03, Vol.37 (2), p.99-102

2016

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Total dose effects on double gate fully depleted SOI MOSFETs

IEEE transactions on nuclear science, 2004-12, Vol.51 (6), p.3767-3772

2004

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Metrology for the Electrical Characterization of Semiconductor Nanowires : Nanowire transistors: modeling, device, desing, and technology

IEEE transactions on electron devices, 2008, Vol.55 (11), p.3086-3095

2008

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Characterization of Transient Gate Oxide Trapping in SiC MOSFETs Using Fast I-V Techniques : Silicon carbide devices and technology

IEEE transactions on electron devices, 2008, Vol.55 (8), p.2004-2012

2008

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Random telegraph signals in n -type ZnO nanowire field effect transistorsat low temperature

Applied physics letters, 2007-07, Vol.91 (5), p.053107-053107-3

2007

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Application of intraoperative ABR during middle ear surgery to predict improvement in hearing

Interdisciplinary neurosurgery : Advanced techniques and case management, 2019-09, Vol.17, p.96-100

2019

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Association between HLA-B∗46:01 and cutaneous adverse drug reactions in Han Chinese

Journal of bio-X research, 2018-09, Vol.1 (2), p.73-78

2018

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Surgical treatment of monostotic fibrous dysplasia of the temporal bone: a retrospective analysis

American journal of otolaryngology, 2012-11, Vol.33 (6), p.697-701

2012

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Stress-induced defect generation in HfO2/SiO2 stacks observed by using charge pumping and low frequency noise measurements

2008 IEEE International Reliability Physics Symposium, 2008, p.319-323

2008

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Low frequency noise and charge trapping in MOSFETs

Xiong, Hao D

2004

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Measurements for the reliability and electrical characterization of semiconductor nanowires

2008 IEEE International Reliability Physics Symposium, 2008, p.39-45

2008

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Polymer solar cells with an inverted device configuration using polyhedral oligomeric silsesquioxane-[60]fullerene dyad as a novel electron acceptor

Science China. Chemistry, 2012-05, Vol.55 (5), p.749-754

2012

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Phase transition, effective mass and carrier mobility of MoS2 monolayer under tensile strain

A Self-Compliant One-Diode-One-Resistor Bipolar Resistive Random Access Memory for Low Power Application

Characterization of Transient Gate Oxide Trapping in SiC MOSFETs Using Fast I- V Techniques

Correlation between microstructure, electronic properties and flicker noise in organic thin film transistors

Self-assembled nanowire array capacitors: capacitance and interface state profile

Silicon nanowire on oxide/nitride/oxide for memory application

The large-scale integration of high-performance silicon nanowire field effect transistors

Random telegraph signals in n-type ZnO nanowire field effect transistors at low temperature

Noise in ZnO Nanowire Field Effect Transistors

Doping induces large variation in the electrical properties of MoS2 monolayers

Methods to Characterize the Electrical and Mechanical Properties of Si Nanowires

Low frequency noise characterizations of ZnO nanowire field effect transistors

Metrology for the Electrical Characterization of Semiconductor Nanowires

Efficacy of balloon dilation in the treatment of symptomatic Eustachian tube dysfunction: One year follow-up study

Total dose effects on double gate fully depleted SOI MOSFETs

Metrology for the Electrical Characterization of Semiconductor Nanowires : Nanowire transistors: modeling, device, desing, and technology

Characterization of Transient Gate Oxide Trapping in SiC MOSFETs Using Fast I-V Techniques : Silicon carbide devices and technology

Random telegraph signals in n -type ZnO nanowire field effect transistorsat low temperature

Application of intraoperative ABR during middle ear surgery to predict improvement in hearing

Association between HLA-B∗46:01 and cutaneous adverse drug reactions in Han Chinese

Surgical treatment of monostotic fibrous dysplasia of the temporal bone: a retrospective analysis

Stress-induced defect generation in HfO2/SiO2 stacks observed by using charge pumping and low frequency noise measurements

Low frequency noise and charge trapping in MOSFETs

Measurements for the reliability and electrical characterization of semiconductor nanowires

Polymer solar cells with an inverted device configuration using polyhedral oligomeric silsesquioxane-[60]fullerene dyad as a novel electron acceptor

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