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Implications of BTI-Induced Time-Dependent Statistics on Yield Estimation of Digital Circuits
IEEE transactions on electron devices, 2014-03, Vol.61 (3), p.666-673
2014
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Impact of random telegraph noise on ring oscillators evaluated by circuit-level simulations
2015 International Conference on IC Design & Technology (ICICDT), 2015, p.1-4
2015
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Integral impact of BTI and voltage temperature variation on SRAM sense amplifier
2015 IEEE 33rd VLSI Test Symposium (VTS), 2015, p.1-6
2015
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A Comprehensive Study of Nanosheet and Forksheet SRAM for Beyond N5 Node
IEEE transactions on electron devices, 2021-08, Vol.68 (8), p.3819-3825
2021
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Physical-based RTN modeling of ring oscillators in 40-nm SiON and 28-nm HKMG by bimodal defect-centric behaviors
2016 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD), 2016, p.327-330
2016
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The Complementary FET (CFET) 6T-SRAM
IEEE transactions on electron devices, 2021-12, Vol.68 (12), p.6106-6111
2021
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Understanding the Impact of Time-Dependent Random Variability on Analog ICs: From Single Transistor Measurements to Circuit Simulations
IEEE transactions on very large scale integration (VLSI) systems, 2019-03, Vol.27 (3), p.601-610
2019
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Multitimescale Mitigation for Performance Variability Improvement in Time-Critical Systems
IEEE transactions on very large scale integration (VLSI) systems, 2022-11, Vol.30 (11), p.1757-1769
2022
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Evaluation of Nanosheet and Forksheet Width Modulation for Digital IC Design in the Sub-3-nm Era
IEEE transactions on very large scale integration (VLSI) systems, 2022-10, Vol.30 (10), p.1497-1506
2022
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Extended Methodology to Determine SRAM Write Margin in Resistance-Dominated Technology Node
IEEE transactions on electron devices, 2022-06, Vol.69 (6), p.3113-3117
2022
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CFET SRAM DTCO, Interconnect Guideline, and Benchmark for CMOS Scaling
IEEE transactions on electron devices, 2023-03, Vol.70 (3), p.1-8
2023
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Future Design Direction for SRAM Data Array: Hierarchical Subarray With Active Interconnect
IEEE transactions on circuits and systems. I, Regular papers, 2024-06, p.1-12
2024
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Impact of interconnects enhancement on SRAM design beyond 5nm technology node
2023 IEEE International Symposium on Circuits and Systems (ISCAS), 2023, p.1-5
2023
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3D SRAM Macro Design in 3D Nanofabric Process Technology
IEEE transactions on circuits and systems. I, Regular papers, 2023-07, Vol.70 (7), p.1-10
2023
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SRAM With Buried Power Distribution to Improve Write Margin and Performance in Advanced Technology Nodes
IEEE electron device letters, 2019-08, Vol.40 (8), p.1261-1264
2019
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Analysis of Functional Errors Produced by Long-Term Workload-Dependent BTI Degradation in Ultralow Power Processors
IEEE transactions on very large scale integration (VLSI) systems, 2020-10, Vol.28 (10), p.2122-2133
2020
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Parametric and Functional Degradation Analysis of Complete 14-nm FinFET SRAM
IEEE transactions on very large scale integration (VLSI) systems, 2019-06, Vol.27 (6), p.1308-1321
2019
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Integral Impact of BTI, PVT Variation, and Workload on SRAM Sense Amplifier
IEEE transactions on very large scale integration (VLSI) systems, 2017-04, Vol.25 (4), p.1444-1454
2017
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Impact and Mitigation of Sense Amplifier Aging Degradation Using Realistic Workloads
IEEE transactions on very large scale integration (VLSI) systems, 2017-12, Vol.25 (12), p.3464-3472
2017
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CFET SRAM With Double-Sided Interconnect Design and DTCO Benchmark
IEEE transactions on electron devices, 2023-10, Vol.70 (10), p.1-8
2023
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Impact of 3-D Integration on Thermal Performance of RISC-V MemPool Multicore SOC
IEEE transactions on very large scale integration (VLSI) systems, 2023-12, Vol.31 (12), p.1896-1904
2023
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Thermal Performance Analysis of Mempool RISC-V Multicore SoC
IEEE transactions on very large scale integration (VLSI) systems, 2022-11, Vol.30 (11), p.1-9
2022
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Sense amplifier offset voltage analysis for both time-zero and time-dependent variability
Microelectronics and reliability, 2019-08, Vol.99, p.52-61
2019
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Design enablement of CFET devices for sub-2nm CMOS nodes
2022 Design, Automation & Test in Europe Conference & Exhibition (DATE), 2022, p.29-33
2022
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Impact and mitigation of SRAM read path aging
Microelectronics and reliability, 2018-08, Vol.87, p.158-167
2018
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