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IEEE journal of solid-state circuits, 2004-01, Vol.39 (1), p.157-168
2004
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IEEE electron device letters, 2009-06, Vol.30 (6), p.690-692
2009
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IEEE transactions on electron devices, 2012-08, Vol.59 (8), p.2093-2099
2012
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IEEE transactions on semiconductor manufacturing, 2001-11, Vol.14 (4), p.302-310
2001
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IEEE transactions on semiconductor manufacturing, 2009-02, Vol.22 (1), p.59-65
2009
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IEEE transactions on semiconductor manufacturing, 1996-02, Vol.9 (1), p.2-8
1996
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2016 17th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems (EuroSimE), 2016, p.1-6
2016
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2015 IEEE International Electron Devices Meeting (IEDM), 2015, p.7.3.1-7.3.4
2015
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2001 IEEE International Reliability Physics Symposium Proceedings. 39th Annual (Cat. No.00CH37167), 2001, p.393-398
2001
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IEEE transactions on semiconductor manufacturing, 2003-05, Vol.16 (2), p.187-193
2003
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2003 Proceedings of the Bipolar/BiCMOS Circuits and Technology Meeting (IEEE Cat. No.03CH37440), 2003, p.163-170
2003
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2019 IEEE International Electron Devices Meeting (IEDM), 2019, p.25.2.1-25.2.4
2019
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Proceedings of the 2004 International Conference on Microelectronic Test Structures (IEEE Cat. No.04CH37516), 2004, p.117-122
2004
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International Electron Devices Meeting. IEDM Technical Digest, 1997, p.631-634
1997
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2009 IEEE International Electron Devices Meeting (IEDM), 2009, p.1-4
2009
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Proceedings of the 2002 International Conference on Microelectronic Test Structures, 2002. ICMTS 2002, 2002, p.235-240
2002
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Proceedings of the 2002 International Conference on Microelectronic Test Structures, 2002. ICMTS 2002, 2002, p.223-228
2002
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MRS proceedings, 2000, Vol.610, Article B3.1
2000
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2009 IEEE International Electron Devices Meeting (IEDM), 2009, p.1-4
2009
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International Electron Devices Meeting 1998. Technical Digest (Cat. No.98CH36217), 1998, p.915-918
1998
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International Electron Devices Meeting. Technical Digest (Cat. No.01CH37224), 2001, p.10.2.1-10.2.4
2001
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ICMTS 2001. Proceedings of the 2001 International Conference on Microelectronic Test Structures (Cat. No.01CH37153), 2001, p.99-102
2001
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International Conference on Microelectronic Test Structures, 2003, 2003, p.221-226
2003
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Proceedings of 1994 IEEE International Conference on Microelectronic Test Structures, 1994, p.21-27
1994
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ICMTS 1998. Proceedings of 1998 International Conference on Microelectronic Test Structures (Cat. No.98CH36157), 1998, p.7-12
1998
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