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Optics express, 2014-01, Vol.22 (1), p.399-410
2014
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Journal of applied physics, 2013-01, Vol.113 (1)
2013
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Optics express, 2011-05, Vol.19 (10), p.9915-9922
2011
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Semiconductor science and technology, 2007-01, Vol.22 (1), p.S153-S157
2007
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IEEE microwave and wireless components letters, 2014-07, Vol.24 (7), p.469-471
2014
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Journal of applied physics, 2009-06, Vol.105 (11)
2009
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Physical review. B, Condensed matter and materials physics, 2014-01, Vol.89 (1), Article 014101
2014
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Electronics letters, 2017-02, Vol.53 (3), p.194-196
2017
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Microelectronic engineering, 2011-07, Vol.88 (7), p.1133-1135
2011
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Journal of applied physics, 2012-04, Vol.111 (7), p.073515-073515-9
2012
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Nanotechnology, 2012-09, Vol.23 (35), p.355706-355706
2012
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Electronics letters, 2012-12, Vol.48 (25), p.1598-1600
2012
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IEEE photonics technology letters, 2009-12, Vol.21 (24), p.1894-1896
2009
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Thin solid films, 1998-04, Vol.318 (1), p.1-5
1998
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Nanotechnology, 2012-03, Vol.23 (11), p.115704-1-7
2012
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Thin solid films, 2012-02, Vol.520 (8), p.3249-3254
2012
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Microelectronic engineering, 2014-08, Vol.125, p.38-44
2014
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Thin solid films, 2011-06, Vol.519 (17), p.5734-5739
2011
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Microelectronic engineering, 2011-07, Vol.88 (7), p.1521-1524
2011
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Microelectronic engineering, 2012-09, Vol.97, p.169-172
2012
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Thin solid films, 2008-11, Vol.517 (1), p.71-74
2008
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Microelectronics and reliability, 2013-09, Vol.53 (9-11), p.1659-1662
2013
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Thin solid films, 2000-07, Vol.369 (1-2), p.189-194
2000
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Thin solid films, 2008-11, Vol.517 (1), p.259-261
2008
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Microelectronics and reliability, 2012-09, Vol.52 (9-10), p.2310-2313
2012
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