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IEEE transactions on electron devices, 2006-09, Vol.53 (9), p.1979-1993
2006
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IEEE transactions on electron devices, 2003-03, Vol.50 (3), p.618-632
2003
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IEEE transactions on electron devices, 2005-11, Vol.52 (11), p.2463-2472
2005
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IEEE transactions on electron devices, 2001-08, Vol.48 (8), p.1776-1782
2001
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IEEE transactions on microwave theory and techniques, 2005-09, Vol.53 (9), p.2917-2925
2005
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IEEE journal of solid-state circuits, 2009-05, Vol.44 (5), p.1415-1424
2009
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IEEE transactions on electron devices, 2006-02, Vol.53 (2), p.270-278
2006
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IEEE transactions on electron devices, 2009-02, Vol.56 (2), p.243-251
2009
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IEEE transactions on electron devices, 2008-11, Vol.55 (11), p.3295-3298
2008
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IEEE electron device letters, 2003-01, Vol.24 (1), p.37-39
2003
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IEEE journal of solid-state circuits, 2005-09, Vol.40 (9), p.1922-1931
2005
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IEEE transactions on electron devices, 2006-09, Vol.53 (9), p.2098-2107
2006
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IEEE transactions on electron devices, 2006-09, Vol.53 (9), p.2035-2043
2006
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IEEE transactions on electron devices, 2008-06, Vol.55 (6), p.1424-1432
2008
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Solid-state electronics, 2009, Vol.53 (1), p.18-29
2009
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IEEE transactions on electron devices, 2006-01, Vol.53 (1), p.153-157
2006
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Solid-state electronics, 2006, Vol.50 (1), p.10-17
2006
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IEEE transactions on semiconductor manufacturing, 2004-05, Vol.17 (2), p.150-154
2004
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Solid-state electronics, 2015-11, Vol.113, p.28-34
2015
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2020 IEEE BiCMOS and Compound Semiconductor Integrated Circuits and Technology Symposium (BCICTS), 2020, p.1-8
2020
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IEEE transactions on electron devices, 2007-02, Vol.54 (2), p.316-322
2007
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2007 IEEE Custom Integrated Circuits Conference, 2007, p.41-48
2007
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IEEE Custom Integrated Circuits Conference 2006, 2006, p.711-716
2006
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Microelectronic engineering, 2004-04, Vol.72 (1), p.149-153
2004
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2007 IEEE International Conference on Microelectronic Test Structures, 2007, p.259-264
2007
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