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Assessment of Proton Direct Ionization for the Radiation Hardness Assurance of Deep Submicron SRAMs Used in Space Applications
IEEE transactions on nuclear science, 2021-05, Vol.68 (5), p.937-948
2021
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Exploring Radiation-Induced Vulnerabilities in RFICs through Traditional RF Metrics
IEEE transactions on nuclear science, 2023-08, Vol.70 (8), p.1-1
2023
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FPGA Benchmarking Structures Dedicated to TID Parametric Degradation Evaluation
IEEE transactions on nuclear science, 2022-07, Vol.69 (7), p.1453-1460
2022
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The Pion Single-Event Latch-Up Cross Section Enhancement: Mechanisms and Consequences for Accelerator Hardness Assurance
IEEE transactions on nuclear science, 2021-08, Vol.68 (8), p.1613-1622
2021
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Testing and Validation Methodology for a Radiation Monitoring System for Electronics in Particle Accelerators
IEEE transactions on nuclear science, 2022-07, Vol.69 (7), p.1642-1650
2022
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Characterization of Fragmented Ultra-high Energy Heavy Ion Beam and its Effects on Electronics Single Event Effect Testing
IEEE transactions on nuclear science, 2024-05, p.1-1
2024
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Towards an Embedded and Distributed Optical Fiber-based Dosimeter for Space Applications
IEEE transactions on nuclear science, 2022-12, p.1-1
2022
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Thermal Runaway in SiC Schottky Barrier Diodes Caused by Heavy Ions
IEEE transactions on nuclear science, 2019-07, Vol.66 (7), p.1688-1693
2019
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The Use of a Dose-Rate Switching Technique to Characterize Bipolar Devices
IEEE transactions on nuclear science, 2009-12, Vol.56 (6), p.3347-3353
2009
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Comparison of High Energy X-ray and Cobalt 60 irradiations on MOS capacitors
IEEE transactions on nuclear science, 2024, p.1-1
2024
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An analysis of the significance of the 14N(n,p)14C reaction for single-event upsets induced by thermal neutrons in SRAMs
IEEE transactions on nuclear science, 2023-08, p.1-1
2023
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Proton direct ionization upsets at tens of MeV
IEEE transactions on nuclear science, 2023-04, Vol.70 (4), p.1-1
2023
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MC-ORACLE: A tool for predicting Soft Error Rate
Computer physics communications, 2011-02, Vol.182 (2), p.317-321
2011
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SEL Hardness Assurance in a Mixed Radiation Field
IEEE transactions on nuclear science, 2015-12, Vol.62 (6), p.2555-2562
2015
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Natural radioactivity consideration for high- Delta k dielectrics and metal gates choice in nanoelectronic devices
Journal of physics. D, Applied physics, 2010-07, Vol.43 (27), p.275501-275501
2010
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Accelerated Irradiation Method to Study Synergy Effects in Bipolar Integrated Circuits
IEEE transactions on nuclear science, 2009-08, Vol.56 (4), p.1971-1977
2009
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The Pion Single-Event Effect Resonance and its Impact in an Accelerator Environment
IEEE transactions on nuclear science, 2020-07, Vol.67 (7), p.1606-1613
2020
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Neutron Induced Energy Deposition in a Silicon Diode
IEEE transactions on nuclear science, 2008-12, Vol.55 (6), p.3146-3150
2008
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The Use of High Energy X-Ray Generators for TID Testing of Electronic Devices
IEEE transactions on nuclear science, 2023-01, Vol.70 (8), p.1-1
2023
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Single-Event Effects in the Peripheral Circuitry of a Commercial Ferroelectric Random Access Memory
IEEE transactions on nuclear science, 2018-08, Vol.65 (8), p.1708-1714
2018
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Contribution of Latent Defects Induced by High-Energy Heavy Ion Irradiation on the Gate Oxide Breakdown
IEEE transactions on nuclear science, 2009-08, Vol.56 (4), p.2213-2217
2009
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Heavy-Ion Radiation Impact on a 4 Mb FRAM Under Different Test Modes and Conditions
IEEE transactions on nuclear science, 2016-08, Vol.63 (4), p.2010-2015
2016
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The CELESTA CubeSat In-Flight Radiation Measurements and their Comparison with Ground Facilities Predictions
IEEE transactions on nuclear science, 2024, p.1-1
2024
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Radiation Qualification by Means of the System-Level Testing: Opportunities and Limitations
Electronics (Basel), 2022-02, Vol.11 (3), p.378
2022
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SiO2–Si under swift heavy ion irradiation: A comparison between normal and grazing incidence features
Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 2008-06, Vol.266 (12-13), p.2981-2985
2008
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