UB Paderborn / Katalog / Suche / in CDI

Combining XRD and XRF analysis in one Rietveld-like fitting

Powder diffraction, 2017-09, Vol.32 (S1), p.S225-S230

2017

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JGIXA — A software package for the calculation and fitting of grazing incidence X-ray fluorescence and X-ray reflectivity data for the characterization of nanometer-layers and ultra-shallow-implants

Spectrochimica acta. Part B: Atomic spectroscopy, 2016-04, Vol.118, p.20-28

2016

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ZnO and Au/ZnO thin films: Room-temperature chemoresistive properties for gas sensing applications

Sensors and actuators. B, Chemical, 2016-12, Vol.237, p.1085-1094

2016

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Binder-free nanostructured germanium anode for high resilience lithium-ion battery

Electrochimica acta, 2022-04, Vol.411, p.139832, Article 139832

2022

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Spectroscopic study of nitrogen incorporation in Ge, Sb, and Te elemental systems: A step toward the understanding of nitrogen effect in phase-change materials

Journal of applied physics, 2022-11, Vol.132 (20)

2022

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AFM and Raman study of graphene deposited on silicon surfaces nanostructured by ion beam irradiation

Journal of microscopy (Oxford), 2020-12, Vol.280 (3), p.183-193

2020

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Simple method for determining Si p-n junction depth using anodization

Microelectronic engineering, 2021-05, Vol.244-246, p.111558, Article 111558

2021

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Tunable formation of nanostructured SiC/SiOC core-shell for selective detection of SO2

Sensors and actuators. B, Chemical, 2020-02, Vol.305, p.127485, Article 127485

2020

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Characterization of the morphology of titanium and titanium (IV) oxide nanolayers deposited on different substrates by application of grazing incidence X-ray diffraction and X-ray reflectometry techniques

Thin solid films, 2019-02, Vol.671, p.103-110

2019

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Combined evaluation of grazing incidence X-ray fluorescence and X-ray reflectivity data for improved profiling of ultra-shallow depth distributions

Spectrochimica acta. Part B: Atomic spectroscopy, 2014-09, Vol.99 (100), p.121-128

2014

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Plasma-based etching approach for GEM detector microfabrication at FBK for X-ray polarimetry in space

Journal of instrumentation, 2024-04, Vol.19 (4), p.C04017

2024

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Characterization of the mistura alloy used for Venetian sesino coins: 16th century

X-ray spectrometry, 2019-01, Vol.48 (1), p.8-20

2019

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Design and characterization of Kerberos: a 48-channel analog pulse processing and data acquisition platform

Journal of instrumentation, 2021-07, Vol.16 (7), p.T07007

2021

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Synchrotron radiation-induced total reflection X-ray fluorescence analysis

TrAC, Trends in analytical chemistry (Regular ed.), 2010-06, Vol.29 (6), p.479-496

2010

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Synchrotron radiation induced TXRF

Journal of analytical atomic spectrometry, 2008, Vol.23 (6), p.792-798

2008

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Grazing exit versus grazing incidence geometry for x-ray absorption near edge structure analysis of arsenic traces

Journal of applied physics, 2009-04, Vol.105 (7), p.074906-074906-7

2009

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Evolution of arsenic in high fluence plasma immersion ion implanted silicon: Behavior of the as-implanted surface

Applied surface science, 2015-11, Vol.355 (C), p.792-799

2015

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A new spectrometer for grazing incidence X-ray fluorescence for the characterization of Arsenic implants and Hf based high-k layers

Spectrochimica acta. Part B: Atomic spectroscopy, 2010-06, Vol.65 (6), p.429-433

2010

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Determination of the elemental distribution in human joint bones by SR micro XRF

X-ray spectrometry, 2008-01, Vol.37 (1), p.3-11

2008

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Lead accumulation in tidemark of articular cartilage

Osteoarthritis and cartilage, 2006-09, Vol.14 (9), p.906-913

2006

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Characterization of atmospheric aerosols using Synchroton radiation total reflection X-ray fluorescence and Fe K-edge total reflection X-ray fluorescence-X-ray absorption near-edge structure

Spectrochimica acta. Part B: Atomic spectroscopy, 2008-12, Vol.63 (12), p.1489-1495

2008

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Grazing incidence x-ray fluorescence and secondary ion mass spectrometry combined approach for the characterization of ultrashallow arsenic distribution in silicon

Journal of vacuum science and technology. B, Nanotechnology & microelectronics, 2010-01, Vol.28 (1), p.C1-C1C64

2010

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A new total reflection X-ray fluorescence vacuum chamber with sample changer analysis using a silicon drift detector for chemical analysis

Spectrochimica acta. Part B: Atomic spectroscopy, 2004-08, Vol.59 (8), p.1199-1203

2004

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Iron speciation in human cancer cells by K-edge total reflection X-ray fluorescence–X-ray absorption near edge structure analysis

Spectrochimica acta. Part B: Atomic spectroscopy, 2011-03, Vol.66 (3), p.274-279

2011

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Recent results of synchrotron radiation induced total reflection X-ray fluorescence analysis at HASYLAB, beamline L

Spectrochimica acta. Part B: Atomic spectroscopy, 2006-11, Vol.61 (10), p.1129-1134

2006

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Combining XRD and XRF analysis in one Rietveld-like fitting

JGIXA — A software package for the calculation and fitting of grazing incidence X-ray fluorescence and X-ray reflectivity data for the characterization of nanometer-layers and ultra-shallow-implants

ZnO and Au/ZnO thin films: Room-temperature chemoresistive properties for gas sensing applications

Binder-free nanostructured germanium anode for high resilience lithium-ion battery

Spectroscopic study of nitrogen incorporation in Ge, Sb, and Te elemental systems: A step toward the understanding of nitrogen effect in phase-change materials

AFM and Raman study of graphene deposited on silicon surfaces nanostructured by ion beam irradiation

Simple method for determining Si p-n junction depth using anodization

Tunable formation of nanostructured SiC/SiOC core-shell for selective detection of SO2

Characterization of the morphology of titanium and titanium (IV) oxide nanolayers deposited on different substrates by application of grazing incidence X-ray diffraction and X-ray reflectometry techniques

Combined evaluation of grazing incidence X-ray fluorescence and X-ray reflectivity data for improved profiling of ultra-shallow depth distributions

Plasma-based etching approach for GEM detector microfabrication at FBK for X-ray polarimetry in space

Characterization of the mistura alloy used for Venetian sesino coins: 16th century

Design and characterization of Kerberos: a 48-channel analog pulse processing and data acquisition platform

Synchrotron radiation-induced total reflection X-ray fluorescence analysis

Synchrotron radiation induced TXRF

Grazing exit versus grazing incidence geometry for x-ray absorption near edge structure analysis of arsenic traces

Evolution of arsenic in high fluence plasma immersion ion implanted silicon: Behavior of the as-implanted surface

A new spectrometer for grazing incidence X-ray fluorescence for the characterization of Arsenic implants and Hf based high-k layers

Determination of the elemental distribution in human joint bones by SR micro XRF

Lead accumulation in tidemark of articular cartilage

Characterization of atmospheric aerosols using Synchroton radiation total reflection X-ray fluorescence and Fe K-edge total reflection X-ray fluorescence-X-ray absorption near-edge structure

Grazing incidence x-ray fluorescence and secondary ion mass spectrometry combined approach for the characterization of ultrashallow arsenic distribution in silicon

A new total reflection X-ray fluorescence vacuum chamber with sample changer analysis using a silicon drift detector for chemical analysis

Iron speciation in human cancer cells by K-edge total reflection X-ray fluorescence–X-ray absorption near edge structure analysis

Recent results of synchrotron radiation induced total reflection X-ray fluorescence analysis at HASYLAB, beamline L

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