UB Paderborn / Katalog / Suche / in CDI

Nuclear instruments & methods in physics research. Section A, Accelerators, spectrometers, detectors and associated equipment, 2016-09, Vol.831, p.265-268

2016

Link zum Volltext

Verfügbarkeit prüfen

Gate Bias Dependence of Defect-Mediated Hot-Carrier Degradation in GaN HEMTs

IEEE transactions on electron devices, 2014-05, Vol.61 (5), p.1316-1320

2014

Link zum Volltext
IEEE_Xplore

Single Event Upsets Induced by Direct Ionization from Low-Energy Protons in Floating Gate Cells

IEEE transactions on nuclear science, 2017-01, Vol.64 (1), p.464-470

2017

Link zum Volltext
IEEE_Xplore

Present and Future Non-Volatile Memories for Space

IEEE transactions on nuclear science, 2010-12, Vol.57 (6), p.3016-3039

2010

Link zum Volltext
IEEE_Xplore

Inkjet Printed Interdigitated Biosensor for Easy and Rapid Detection of Bacteriophage Contamination: a Preliminary Study for Milk Processing Control Applications

Chemosensors, 2019-02, Vol.7 (1), p.8

2019

Link zum Volltext

Verfügbarkeit prüfen

Palladium on plastic substrates for plasmonic devices

Sensors (Basel, Switzerland), 2015-01, Vol.15 (1), p.1138-1147

2015

Link zum Volltext

Verfügbarkeit prüfen

2015 IEEE Nuclear and Space Radiation Effects Conference Awards Comments by the Chairman

IEEE transactions on nuclear science, 2015-12, Vol.62 (6), p.2381-2382

2015

Link zum Volltext
IEEE_Xplore

TID Sensitivity of NAND Flash Memory Building Blocks

IEEE transactions on nuclear science, 2009-08, Vol.56 (4), p.1909-1913

2009

Link zum Volltext
IEEE_Xplore

Proton-Induced Upsets in SLC and MLC NAND Flash Memories

IEEE transactions on nuclear science, 2013-12, Vol.60 (6), p.4130-4135

2013

Link zum Volltext
IEEE_Xplore

Annealing of Heavy-Ion Induced Floating Gate Errors: LET and Feature Size Dependence

IEEE transactions on nuclear science, 2010-08, Vol.57 (4), p.1835-1841

2010

Link zum Volltext
IEEE_Xplore

Comparison of radiation degradation induced by x-ray and 3-MeV protons in 65-nm CMOS transistors

Chinese physics B, 2016-09, Vol.25 (9), p.468-473

丁李利 Simone Gerardin Marta Bagatin Dario Bisello Serena Mattiazzo Alessandro Paccagnella

2016

Link zum Volltext

Verfügbarkeit prüfen

Lactate Dehydrogenase and Glutamate Pyruvate Transaminase biosensing strategies for lactate detection on screen-printed sensors. Catalysis efficiency and interference analysis in complex matrices: from cell cultures to sport medicine

Sensing and Bio-Sensing Research, 2018-11, Vol.21, p.54-64

2018

Link zum Volltext

Verfügbarkeit prüfen

Low-Power, Subthreshold Reference Circuits for the Space Environment: Evaluated with γ-rays, X-rays, Protons and Heavy Ions

Electronics (Basel), 2019-05, Vol.8 (5), p.562

2019

Link zum Volltext

Verfügbarkeit prüfen

Effects of Total Ionizing Dose on the Retention of 41-nm NAND Flash Cells

IEEE transactions on nuclear science, 2011-12, Vol.58 (6), p.2824-2829

2011

Link zum Volltext
IEEE_Xplore

Silver nanoparticles inkjet-printed flexible biosensor for rapid label-free antibiotic detection in milk

Sensors and actuators. B, Chemical, 2019-02, Vol.280, p.280-289

2019

Link zum Volltext

Verfügbarkeit prüfen

Total Ionizing Dose Effects in 3-D NAND Replacement Gate Flash Memory Cells

IEEE transactions on nuclear science, 2024-04, Vol.71 (4), p.412-417

2024

Link zum Volltext
IEEE_Xplore

Impact of Tier Pitch Scaling on Heavy-ion Sensitivity of 3D NAND Flash Memories

IEEE transactions on nuclear science, 2024, p.1-1

2024

Link zum Volltext

Verfügbarkeit prüfen

Channel-Hot-Carrier Degradation and Bias Temperature Instabilities in CMOS Inverters

IEEE transactions on electron devices, 2009-09, Vol.56 (9), p.2155-2159

2009

Link zum Volltext
IEEE_Xplore

Total Ionizing Dose Effects in 3D NAND Replacement Gate Flash Memory Cells

IEEE transactions on nuclear science, 2023, p.1-1

2023

Link zum Volltext

Verfügbarkeit prüfen

Effectiveness of TMR-Based Techniques to Mitigate Alpha-Induced SEU Accumulation in Commercial SRAM-Based FPGAs

IEEE transactions on nuclear science, 2008-08, Vol.55 (4), p.1968-1973

2008

Link zum Volltext
IEEE_Xplore

TID Degradation Mechanisms in 16-nm Bulk FinFETs Irradiated to Ultrahigh Doses

IEEE transactions on nuclear science, 2021-08, Vol.68 (8), p.1571-1578

2021

Link zum Volltext
IEEE_Xplore

1 – 25 von 221

Suche als RSS-Feed

Suchergebnisse filtern

Filter anzeigen

Nur zeigen

Geprüft (Peer-Review)
(184)
Mit Volltextzugriff
(216)

Publikationsform

Sprache

Erscheinungsjahr

n.n

Thema

Science & Technology
(168)
Technology
(143)
Engineering
(122)
Engineering, Electrical & Electronic
(121)
Nuclear Science & Technology
(86)
Physical Sciences
(63)
Physics
(58)
Radiation Effects
(57)
Degradation
(44)
Nonvolatile Memory
(34)
Threshold Voltage
(34)
Gates
(33)
Flash Memory
(32)
Devices
(31)
Mosfets
(31)
Physics, Applied
(31)
Leakage Current
(29)
Irradiation
(28)
Transistors
(28)
Instruments & Instrumentation
(27)

15 weitere anzeigen...

Weniger anzeigen...

Neu hinzugefügt

... seit 90 Tagen
(2)

Menü

Weitere Dienste

Einstellungen

Inkjet-printed fully customizable and low-cost electrodes matrix for gesture recognition

SPECTRA: A Novel Compact System for Surface Plasmon Resonance Measurements

Optical System Based on Nafion Membrane for the Detection of Ammonia in Blood Serum Samples

Influence of Bulk Doping and Halos on the TID Response of I/O and Core 150 nm nMOSFETs

Radiation tolerance study of a commercial 65 nm CMOS technology for high energy physics applications

Gate Bias Dependence of Defect-Mediated Hot-Carrier Degradation in GaN HEMTs

Single Event Upsets Induced by Direct Ionization from Low-Energy Protons in Floating Gate Cells

Present and Future Non-Volatile Memories for Space

Inkjet Printed Interdigitated Biosensor for Easy and Rapid Detection of Bacteriophage Contamination: a Preliminary Study for Milk Processing Control Applications

Palladium on plastic substrates for plasmonic devices

2015 IEEE Nuclear and Space Radiation Effects Conference Awards Comments by the Chairman

TID Sensitivity of NAND Flash Memory Building Blocks

Proton-Induced Upsets in SLC and MLC NAND Flash Memories

Annealing of Heavy-Ion Induced Floating Gate Errors: LET and Feature Size Dependence

Comparison of radiation degradation induced by x-ray and 3-MeV protons in 65-nm CMOS transistors

Lactate Dehydrogenase and Glutamate Pyruvate Transaminase biosensing strategies for lactate detection on screen-printed sensors. Catalysis efficiency and interference analysis in complex matrices: from cell cultures to sport medicine

Low-Power, Subthreshold Reference Circuits for the Space Environment: Evaluated with γ-rays, X-rays, Protons and Heavy Ions

Effects of Total Ionizing Dose on the Retention of 41-nm NAND Flash Cells

Silver nanoparticles inkjet-printed flexible biosensor for rapid label-free antibiotic detection in milk

Total Ionizing Dose Effects in 3-D NAND Replacement Gate Flash Memory Cells

Impact of Tier Pitch Scaling on Heavy-ion Sensitivity of 3D NAND Flash Memories

Channel-Hot-Carrier Degradation and Bias Temperature Instabilities in CMOS Inverters

Total Ionizing Dose Effects in 3D NAND Replacement Gate Flash Memory Cells

Effectiveness of TMR-Based Techniques to Mitigate Alpha-Induced SEU Accumulation in Commercial SRAM-Based FPGAs

TID Degradation Mechanisms in 16-nm Bulk FinFETs Irradiated to Ultrahigh Doses

Suchergebnisse filtern