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IEEE journal of the Electron Devices Society, 2018, Vol.6, p.438-448
2018
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IEEE transactions on electron devices, 2018-11, Vol.65 (11), p.5157-5164
2018
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IEEE transactions on electron devices, 2006-08, Vol.53 (8), p.1840-1851
2006
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IEEE electron device letters, 2004-04, Vol.25 (4), p.191-193
2004
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IEEE electron device letters, 2014-04, Vol.35 (4), p.473-475
2014
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IEEE transactions on electron devices, 2004-11, Vol.51 (11), p.1790-1797
2004
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Sensors and actuators. B, Chemical, 2012, Vol.161 (1), p.163-170
2012
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2010 IEEE International Reliability Physics Symposium, 2010, p.689-693
2010
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Journal of computational electronics, 2004-10, Vol.3 (3-4), p.161-164
2004
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IEEE transactions on electron devices, 1998-06, Vol.45 (6), p.1226-1238
1998
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2013 American Control Conference, 2013, p.25-30
2013
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Morphing Aerospace Vehicles and Structures, 2012, p.87-125
2012
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Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 2001-12, Vol.184 (4), p.500-508
2001
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2006 International Conference on Simulation of Semiconductor Processes and Devices, 2006, p.27-30
2006
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IEEE transactions on semiconductor manufacturing, 2000-05, Vol.13 (2), p.243-248
2000
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- Ieee Transactions On Electron Devices
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- Nuclear Instruments & Methods In Physics Research. Section B, Beam Interactions With Materials And Atoms
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