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Nuclear instruments & methods in physics research. Section A, Accelerators, spectrometers, detectors and associated equipment, 1999-08, Vol.433 (1), p.121-127
- Adam, I.
- Aleksan, R.
- Aston, D.
- Bailly, P.
- Beigbeder, C.
- Benayoun, M.
- Benkebil, M.
- Bonneaud, G.
- Breton, D.
- Briand, H.
- Brown, D.
- Bourgeois, Ph
- Chauveau, J.
- Cizeron, R.
- Cohen-Tanugi, J.
- Convery, M.
- Dardin, S.
- David, P.
- De Domenico, G.
- de la Vaissiere, C.
- de Lesquen, A.
- Del Buono, L.
- Doser, M.
- Emery, S.
- Fouque, G.
- Gaidot, A.
- Gastaldi, F.
- Genat, J.-F.
- Geld, T.
- Gosset, L.
- Hale, D.
- Hamel de Monchenault, G.
- Hamon, O.
- Hoecker, A.
- Imbault, D.
- W. Kadel, R.
- Kadyk, J.
- Kalelkar, M.
- Karolak, M.
- Kawahara, H.
- Krueger, H.
- Le Diberder, F.
- Lebbolo, H.
- H. Leruste, P.
- London, G.
- Lory, J.
- Lu, A.
- Lutz, A.-M.
- Lynch, G.
- Mancinelli, G.
- McCulloch, M.
- McShurley, D.
- Malchow, R.
- Matricon, P.
- Mayer, B.
- Meadows, B.
- Micout, P.
- Muller, D.
- Narjoux, J.-L.
- Noppe, J.-M.
- Oshatz, D.
- Oxoby, G.
- Plano, R.
- Plaszczynski, S.
- Pripstein, M.
- Rasson, J.
- Ratcliff, B.
- Reif, R.
- Renard, C.
- Roos, L.
- Roussot, E.
- Salnikov, A.
- Sarazin, X.
- Schune, M.-H.
- Schwiening, J.
- Sen, S.
- Shelkov, V.
- Sokoloff, M.
- Staengle, H.
- Spanier, S.
- Stiles, P.
- Stone, R.
- Thiebaux, Ch
- Truong, K.
- Toki, W.
- Valassi, A.
- Vasileiadis, G.
- Va'vra, J.
- Verderi, M.
- Versille, S.
- Warner, D.
- Weber, T.
- F. Weber, T.
- Wenzel, W.
- Wilson, R.
- Wormser, G.
- Yèche, Ch
- Yellin, S.
- Zhang, B.
- Zito, M.
1999
Link zum Volltext
Nuclear instruments & methods in physics research. Section A, Accelerators, spectrometers, detectors and associated equipment, 2000-05, Vol.446 (1), p.310-316
2000
Link zum Volltext
1999 IEEE Nuclear Science Symposium. Conference Record. 1999 Nuclear Science Symposium and Medical Imaging Conference (Cat. No.99CH37019), 1999, Vol.1, p.77-81 vol.1
- Adam, I.
- Aleksan, R.
- Aston, D.
- Bailly, P.
- Beigbeder, C.
- Benayoun, M.
- Benkebil, M.
- Bonneaud, G.
- Breton, D.
- Briand, H.
- Brown, D.
- Bourgeois, P.
- Chauveau, J.
- Cizeron, R.
- Cohen-Tanugi, J.
- Convery, M.
- Dardin, S.
- David, P.
- de Domenico, G.
- de La Vaissiere, C.
- de Lesquen, A.
- Emery, S.
- Fouque, G.
- Gaidot, A.
- Gastaldi, F.
- Genat, J.-F.
- Geld, T.
- Gosset, L.
- Hale, D.
- Hamel de Monchenault, G.
- Hamon, O.
- Hoecker, A.
- Imbault, D.
- Kadel, R.W.
- Kadyk, J.
- Kalelkar, M.
- Karolak, M.
- Kawahara, H.
- Krueger, H.
- Lebbolo, H.
- Le Diberder, F.
- Leruste, P.H.
- London, G.
- Long, M.
- Lory, J.
- Lu, A.
- Lutz, A.-M.
- Lynch, G.
- Mancinelli, G.
- McCulloch, M.
- McShurley, D.
- Matricon, P.
- Mayer, B.
- Meadows, B.
- Micout, P.
- Muller, D.
- Narjoux, J.-L.
- Noppe, J.-M.
- Oshatz, D.
- Oxoby, G.
- Plano, R.
- Plaszczynski, S.
- Pripstein, M.
- Rasson, J.
- Ratcliff, B.
- Reif, R.
- Renard, C.
- Roos, L.
- Roussot, E.
- Salnikov, A.
- Schune, M.-H.
- Schwiening, J.
- Shelkov, V.
- Sokoloff, M.
- Spanier, S.
- Stark, J.
- Stiles, P.
- Stone, R.
- Telnov, A.
- Thiebaux, Ch
- Truong, K.
- Valassi, A.
- Vasileiadis, G.
- Vasseur, G.
- Va'vra, J.
- Verderi, M.
- Versille, S.
- Warner, D.
- Weber, T.
- Weber, T.F.
- Wenzel, W.
- Wilson, R.
- Wormser, G.
- Yeche, Ch
- Yellin, S.
- Zhang, B.
- Zito, M.
1999
- Link zum Volltext
2016 IEEE Symposium on VLSI Technology, 2016, p.1-2
- Pasini, L.
- Batude, P.
- Lacord, J.
- Casse, M.
- Mathieu, B.
- Sklenard, B.
- Luce, F. Piegas
- Micout, J.
- Payet, A.
- Mazen, F.
- Besson, P.
- Ghegin, E.
- Borrel, J.
- Daubriac, R.
- Hutin, L.
- Blachier, D.
- Barge, D.
- Chhun, S.
- Mazzocchi, V.
- Cros, A.
- Barnes, J.-P
- Saghi, Z.
- Delaye, V.
- Rambal, N.
- Lapras, V.
- Mazurier, J.
- Weber, O.
- Andrieu, F.
- Brunet, L.
- Fenouillet-Beranger, C.
- Rafhay, Q.
- Ghibaudo, G.
- Cristiano, F.
- Haond, M.
- Boeuf, F.
- Vinet, M.
2016
- Link zum Volltext
2017 IEEE International Electron Devices Meeting (IEDM), 2017, p.3.1.1-3.1.4
- Batude, P.
- Brunet, L.
- Fenouillet-Beranger, C.
- Andrieu, F.
- Colinge, J.-P
- Lattard, D.
- Vianello, E.
- Thuries, S.
- Billoint, O.
- Vivet, P.
- Santos, C.
- Mathieu, B.
- Sklenard, B.
- Lu, C.-M V.
- Micout, J.
- Deprat, F.
- Mercado, E. Avelar
- Ponthenier, F.
- Rambal, N.
- Samson, M.-P
- Casse, M.
- Hentz, S.
- Arcamone, J.
- Sicard, G.
- Hutin, L.
- Pasini, L.
- Ayres, A.
- Rozeau, O.
- Berthelon, R.
- Nemouchi, F.
- Rodriguez, P.
- Pin, J.-B
- Larmagnac, D.
- Duboust, A.
- Ripoche, V.
- Barraud, S.
- Allouti, N.
- Barnola, S.
- Vizioz, C.
- Hartmann, J.-M
- Kerdiles, S.
- Alba, P. Acosta
- Beaurepaire, S.
- Beugin, V.
- Fournel, F.
- Besson, P.
- Loup, V.
- Gassilloud, R.
- Martin, F.
- Garros, X.
- Mazen, F.
- Previtali, B.
- Euvrard-Colnat, C.
- Balan, V.
- Comboroure, C.
- Zussy, M.
- Mazzocchi
- Faynot, O.
- Vinet, M.
2017
- Link zum Volltext
2016 International Conference on IC Design and Technology (ICICDT), 2016, p.1-4
2016
Link zum Volltext
2019 Electron Devices Technology and Manufacturing Conference (EDTM), 2019, p.249-251
2019
Link zum Volltext
2017 IEEE International Electron Devices Meeting (IEDM), 2017, p.32.2.1-32.2.4
- Micout, J.
- Lapras, V.
- Batude, P.
- Fenouillet-Beranger, C.
- Lacord, J.
- Sklenard, B.
- Mathieu, B.
- Rafhay, Q.
- Mazzocchi, V.
- Colinge, J.-P
- Lachal, L.
- Garros, X.
- Casse, M.
- Toffoli, A.
- Romano, G.
- Allain, F.
- Brunet, L.
- Hartmann, J.-M
- Bortolin, R.
- Mazen, F.
- Barraud, S.
- Rambal, N.
- Tabone, C.
- Samson, M.-P
- Besombes, P.
- Delaye, V.
- Saghi, Z.
- Loup, V.
- Comboroure, C.
- Balan, V.
- Desvoivres, L.
- Vizioz, C.
- Ghibaudo, G.
- Vinet, M.
2017
- Link zum Volltext
2016 IEEE SOI-3D-Subthreshold Microelectronics Technology Unified Conference (S3S), 2016, p.1-3
- Fenouillet-Beranger, C.
- Batude, P.
- Brunet, L.
- Mazzocchi, V.
- Lu, C.-M V.
- Deprat, F.
- Micout, J.
- Samson, M.-P
- Previtali, B.
- Besombes, P.
- Rambal, N.
- Lapras, V.
- Andrieu, F.
- Billoint, O.
- Brocard, M.
- Thuries, S.
- Cibrario, G.
- Acosta-Alba, P.
- Mathieu, B.
- Kerdiles, S.
- Nemouchi, F.
- Arvet, C.
- Besson, P.
- Loup, V.
- Gassilloud, R.
- Garros, X.
- Leroux, C.
- Beugin, V.
- Guerin, C.
- Benoit, D.
- Pasini, L.
- Hartmann, J.-M
- Vinet, M.
2016
Link zum Volltext
2017 IEEE SOI-3D-Subthreshold Microelectronics Technology Unified Conference (S3S), 2017, p.1-2
2017
- Link zum Volltext
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