UB Paderborn / Katalog / Suche / in CDI

Sortiert nach

Einfacher Volltextzugriff von (fast) überall

Installieren Sie die LibKey Nomad-Browsererweiterung und erhalten Sie von vielen Webseiten einfachen Zugriff auf lizenzierte Volltexte oder Open Access Publikationen. Mehr erfahren...

Sub-10 nm spatial resolution for electrical properties measurements using bimodal excitation in electric force microscopy

Review of scientific instruments, 2021-02, Vol.92 (2)

2021

Volltextzugriff (PDF)

Erratum: “Sub-10 nm spatial resolution for electrical properties measurements using bimodal excitation in electric force microscopy” [Rev. Sci. Instrum. 92, 023703 (2021)]

Review of scientific instruments, 2021-04, Vol.92 (4)

2021

Volltextzugriff (PDF)

High breakdown voltages on pseudo-vertical p–n diodes by selective area growth of GaN on silicon

Journal of applied physics, 2024-11, Vol.136 (17)

2024

Volltextzugriff (PDF)

Doping efficiency of single and randomly stacked bilayer graphene by iodine adsorption

Applied physics letters, 2014-07, Vol.105 (1)

2014

Volltextzugriff (PDF)

A synthetic redox biofilm made from metalloprotein–prion domain chimera nanowires

Nature chemistry, 2017-02, Vol.9 (2), p.157-163

2017

Volltextzugriff (PDF)

Low-temperature and scalable CVD route to WS2 monolayers on SiO2/Si substrates

Journal of vacuum science & technology. A, Vacuum, surfaces, and films, 2017-11, Vol.35 (6)

2017

Volltextzugriff (PDF)

A scanning probe microscopy study of nanostructured TiO2/poly(3-hexylthiophene) hybrid heterojunctions for photovoltaic applications

Beilstein journal of nanotechnology, 2018-08, Vol.9 (1), p.2087-2096

2018

Volltextzugriff (PDF)

CF4/H2 Plasma Cleaning of Graphene Regenerates Electronic Properties of the Pristine Material

ACS applied nano materials, 2019-03, Vol.2 (3), p.1356-1366

2019

Volltextzugriff (PDF)

Effect of strain on the electron effective mobility in biaxially strained silicon inversion layers: An experimental and theoretical analysis via atomic force microscopy measurements and Kubo-Greenwood mobility calculations

Journal of applied physics, 2008-03, Vol.103 (6), p.063715-063715-9

2008

Volltextzugriff (PDF)

Work Function Tuning for High-Performance Solution-Processed Organic Photodetectors with Inverted Structure

Advanced materials (Weinheim), 2013-12, Vol.25 (45), p.6534-6538

2013

Volltextzugriff (PDF)

Characterization of unintentional doping in localized epitaxial GaN layers on Si wafers by scanning spreading resistance microscopy

Microelectronic engineering, 2023-03, Vol.273, p.111964, Article 111964

2023

Volltextzugriff (PDF)

Plasma surface treatment of GeSn layers and its subsequent impact on Ni / GeSn solid-state reaction

Microelectronic engineering, 2022-03, Vol.257, p.111737, Article 111737

2022

Volltextzugriff (PDF)

ZIF-8 thin films by a vapor-phase process: limits to growth

Nanoscale, 2023-04, Vol.15 (15), p.7115-7125

2023

Volltextzugriff (PDF)

Localized Epitaxial Growth of 402 V Breakdown Voltage Quasi‐Vertical GaN‐on‐Si p‐n Diode on 200 mm‐Diameter Wafers

Physica status solidi. A, Applications and materials science, 2024-06

2024

Volltextzugriff (PDF)

Integration of the Ni/InP system on a 300 mm platform for III-V/Si hybrid lasers

Journal of vacuum science and technology. B, Nanotechnology & microelectronics, 2020-01, Vol.38 (1)

2020

Volltextzugriff (PDF)

Characterization of GaN structures for power electronics by secondary ion mass spectrometry and atomic force microscope approach

Journal of vacuum science and technology. B, Nanotechnology & microelectronics, 2023-05, Vol.41 (3)

2023

Volltextzugriff (PDF)

Impact of etching process on Al2O3/GaN interface for MOSc-HEMT devices combining ToF-SIMS, HAXPES and AFM

Solid-state electronics, 2023-10, Vol.208, p.108743, Article 108743

2023

Volltextzugriff (PDF)

Evaluation of crystal quality and dopant activation of Smart Cut™- transferred 4H-SiC thin film

Materials science forum, 2023, Vol.1089, p.71-79

2023

Volltextzugriff (PDF)

Evaluation of Crystal Quality and Dopant Activation of Smart CutTM - Transferred 4H-SiC Thin Film

Materials science forum, 2023-05, Vol.1089, p.71-79

2023

Volltextzugriff (PDF)

Characterization of photoresist films exposed to high-dose implantation conditions

Journal of vacuum science and technology. B, Nanotechnology & microelectronics, 2018-01, Vol.36 (1)

2018

Volltextzugriff (PDF)

Study of ALD-grown Tin Oxide as an Electron Selective Layer for NIP Perovskite-Based Solar Cells

2022 IEEE 49th Photovoltaics Specialists Conference (PVSC), 2022, p.0497-0503

2022

Volltextzugriff (PDF)

Characterization of Collagen/Lipid Nanoparticle–Curcumin Cryostructurates for Wound Healing Applications

Macromolecular bioscience, 2019-05, Vol.19 (5), p.e1800446-n/a

2019

Volltextzugriff (PDF)

Plasma Surface Preparation of III-V Materials: Quasi In-Situ XPS Measurements and Integration Guidelines

ECS transactions, 2019-07, Vol.92 (2), p.73-83

2019

Volltextzugriff (PDF)

Combining surface-sensitive microscopies for analysis of biological tissues after neural device implantation

Biointerphases, 2020-05, Vol.15 (3), p.031016-031016

2020

Volltextzugriff (PDF)

Drying nano particles solution on an oscillating tip at an air liquid interface: what we can learn, what we can do

Nanoscale research letters, 2007-06, Vol.2 (7), p.309-318

2007

Volltextzugriff (PDF)

1 – 25 von 58

Suche als RSS-Feed

Suchergebnisse filtern

Filter anzeigen

Nur zeigen

Geprüft (Peer-Review)
(46)
Mit Volltextzugriff
(43)

Publikationsform

Artikel
(55)
Tagungsberichte
(3)

Sprache

Erscheinungsjahr

n.n

Thema

Science & Technology
(38)
Physical Sciences
(33)
Physics
(32)
Technology
(30)
Physics, Applied
(22)
Materials Science
(21)
Nanoscience & Nanotechnology
(16)
Science & Technology - Other Topics
(16)
Materials Science, Multidisciplinary
(15)
Chemistry
(10)
Engineering
(10)
Engineering, Electrical & Electronic
(8)
Physics, Condensed Matter
(8)
Chemical Sciences
(7)
Chemistry, Physical
(7)
Condensed Matter
(6)
Engineering Sciences
(6)
Material Chemistry
(5)
Micro And Nanotechnologies
(5)
Microelectronics
(5)

15 weitere anzeigen...

Weniger anzeigen...

Neu hinzugefügt

... seit 7 Tagen
(1)

Menü

Weitere Dienste

Einstellungen

Sub-10 nm spatial resolution for electrical properties measurements using bimodal excitation in electric force microscopy

Erratum: “Sub-10 nm spatial resolution for electrical properties measurements using bimodal excitation in electric force microscopy” [Rev. Sci. Instrum. 92, 023703 (2021)]

High breakdown voltages on pseudo-vertical p–n diodes by selective area growth of GaN on silicon

Doping efficiency of single and randomly stacked bilayer graphene by iodine adsorption

A synthetic redox biofilm made from metalloprotein–prion domain chimera nanowires

Low-temperature and scalable CVD route to WS2 monolayers on SiO2/Si substrates

A scanning probe microscopy study of nanostructured TiO2/poly(3-hexylthiophene) hybrid heterojunctions for photovoltaic applications

CF4/H2 Plasma Cleaning of Graphene Regenerates Electronic Properties of the Pristine Material

Effect of strain on the electron effective mobility in biaxially strained silicon inversion layers: An experimental and theoretical analysis via atomic force microscopy measurements and Kubo-Greenwood mobility calculations

Work Function Tuning for High-Performance Solution-Processed Organic Photodetectors with Inverted Structure

Characterization of unintentional doping in localized epitaxial GaN layers on Si wafers by scanning spreading resistance microscopy

Plasma surface treatment of GeSn layers and its subsequent impact on Ni / GeSn solid-state reaction

ZIF-8 thin films by a vapor-phase process: limits to growth

Localized Epitaxial Growth of 402 V Breakdown Voltage Quasi‐Vertical GaN‐on‐Si p‐n Diode on 200 mm‐Diameter Wafers

Integration of the Ni/InP system on a 300 mm platform for III-V/Si hybrid lasers

Characterization of GaN structures for power electronics by secondary ion mass spectrometry and atomic force microscope approach

Impact of etching process on Al2O3/GaN interface for MOSc-HEMT devices combining ToF-SIMS, HAXPES and AFM

Evaluation of crystal quality and dopant activation of Smart Cut™- transferred 4H-SiC thin film

Evaluation of Crystal Quality and Dopant Activation of Smart CutTM - Transferred 4H-SiC Thin Film

Characterization of photoresist films exposed to high-dose implantation conditions

Study of ALD-grown Tin Oxide as an Electron Selective Layer for NIP Perovskite-Based Solar Cells

Characterization of Collagen/Lipid Nanoparticle–Curcumin Cryostructurates for Wound Healing Applications

Plasma Surface Preparation of III-V Materials: Quasi In-Situ XPS Measurements and Integration Guidelines

Combining surface-sensitive microscopies for analysis of biological tissues after neural device implantation

Drying nano particles solution on an oscillating tip at an air liquid interface: what we can learn, what we can do

Suchergebnisse filtern