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Computer (Long Beach, Calif.), 2023-02, Vol.56 (2), p.57-66
2023
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Microelectronics and reliability, 2021-10, Vol.125, p.114346, Article 114346
2021
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IEEE transactions on nuclear science, 2021-05, Vol.68 (5), p.716-723
2021
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IEEE transactions on emerging topics in computing, 2022-10, Vol.10 (4), p.1867-1882
2022
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Microelectronics and reliability, 2022-01, Vol.128, p.114406, Article 114406
2022
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2020 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT), 2020, p.1-6
2020
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2019 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT), 2019, p.1-6
2019
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2020 15th Design & Technology of Integrated Systems in Nanoscale Era (DTIS), 2020, p.1-5
2020
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2022 IEEE European Test Symposium (ETS), 2022, p.1-10
2022
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2021 IEEE 22nd Latin American Test Symposium (LATS), 2021, p.1-5
2021
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2021 24th International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS), 2021, p.41-44
2021
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IEEE transactions on nuclear science, 2023-08, Vol.70 (8), p.1-1
2023
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Microelectronics and reliability, 2021-11, Vol.126, p.114276, Article 114276
2021
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2020 15th Design & Technology of Integrated Systems in Nanoscale Era (DTIS), 2020, p.1-6
2020
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2019 19th European Conference on Radiation and Its Effects on Components and Systems (RADECS), 2019, p.1-6
2019
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2021 16th International Conference on Design & Technology of Integrated Systems in Nanoscale Era (DTIS), 2021, p.1-6
2021
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2019 IEEE 8th International Workshop on Advances in Sensors and Interfaces (IWASI), 2019, p.158-162
2019
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2022 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT), 2022, p.1-6
2022
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2021 16th International Conference on Design & Technology of Integrated Systems in Nanoscale Era (DTIS), 2021, p.1-6
2021
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2019 19th European Conference on Radiation and Its Effects on Components and Systems (RADECS), 2019, p.1-4
2019
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2019 IEEE Latin American Test Symposium (LATS), 2019, p.1-6
2019
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- Embedded Systems
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