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Evaluation of Neutron Radiation Impact for 1200V class 4H-SiC MOSFET at Gate Switching Mode with TCAD Simulation
IEEE transactions on nuclear science, 2023-05, p.1-1
2023
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Evaluation of Neutron Radiation Impact for 1200-V Class 4H-SiC MOSFET at Gate Switching Mode With TCAD Simulation
IEEE transactions on nuclear science, 2023-08, Vol.70 (8), p.1852-1860
2023
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New Real-Time Fluence Correction Method with SRAM Dosimeter for High Accuracy Single-Event Upset Evaluation
IEEE transactions on nuclear science, 2023-05, Vol.70 (5), p.1-1
2023
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A new waveform-reshaping circuit: an alternative approach to Schmitt trigger
IEEE journal of solid-state circuits, 1993-02, Vol.28 (2), p.162-164
1993
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Class-AB large-swing CMOS buffer amplifier with controlled bias current
IEEE journal of solid-state circuits, 1993-12, Vol.28 (12), p.1350-1353
1993
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An experimental high-density DRAM cell with a built-in gain stage
IEEE journal of solid-state circuits, 1994-08, Vol.29 (8), p.978-981
1994
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Evaluation and Analysis of Commercial 1200V Rated SiC Diodes with SEBO (Single-Event Burnout) Radiation Test Equipment
2021 IEEE Region 10 Symposium (TENSYMP), 2021, p.1-7
2021
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Digitally controlled phase locked loop with tracking analog-to-digital converter
2005 IEEE Asian Solid-State Circuits Conference, 2005, p.377-380
2005
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Crosstalk Cancellation of DDR3 Memory Channel for over 1600 Mbps Data Rate
2009 20th International Zurich Symposium on Electromagnetic Compatibility, 2009, p.337-340
2009
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Digital delay locked loop with open-loop digital duty cycle corrector for 1.2Gb/s/pin double data rate SDRAM
Proceedings of the 30th European Solid-State Circuits Conference, 2004, p.379-382
2004
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A High Density Multi-Bit/Analog DRAM Cell
ESSDERC '93: 23rd European solid State Device Research Conference, 1993, p.377-380
1993
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An experimental high-density DRAM cell with a built-in gain stage: The 1993 European solid-state circuits conference
IEEE journal of solid-state circuits, 1994, Vol.29 (8), p.978-981
1994
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Impact of package inductance and DQ driver strength on the 3rd harmonic EMI from DRAM
2008 Electrical Design of Advanced Packaging and Systems Symposium, 2008, p.132-134
2008
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