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Assembling programmable FRET-based photonic networks using designer DNA scaffolds

Nature communications, 2014-12, Vol.5 (1), p.5615, Article 5615

2014

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Concurrent Modulation of Quantum Dot Photoluminescence Using a Combination of Charge Transfer and Förster Resonance Energy Transfer: Competitive Quenching and Multiplexed Biosensing Modality

Journal of the American Chemical Society, 2017-01, Vol.139 (1), p.363-372

2017

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Carrier lifetime variation in thick 4H-SiC epilayers using two-photon absorption

Applied physics letters, 2017-11, Vol.111 (22)

2017

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Mitigation of Single-Event Effects in SiGe-HBT Current-Mode Logic Circuits

Sensors (Basel, Switzerland), 2020-05, Vol.20 (9), p.2581

2020

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FRET from Multiple Pathways in Fluorophore-Labeled DNA

ACS photonics, 2016-04, Vol.3 (4), p.659-669

2016

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Using TCAD Modeling to Compare Heavy-Ion and Laser-Induced Single Event Transients in SiGe HBTs

IEEE transactions on nuclear science, 2017-01, Vol.64 (1), p.398-405

2017

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Fabrication of terahertz metamaterials by laser printing

Optics letters, 2010-12, Vol.35 (23), p.4039

2010

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The Impact of Technology Scaling on the Single-Event Transient Response of SiGe HBTs

IEEE transactions on nuclear science, 2017-01, Vol.64 (1), p.406-414

2017

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Simulation of Laser-Based Two-Photon Absorption Induced Charge Carrier Generation in Silicon

IEEE transactions on nuclear science, 2015-08, Vol.62 (4), p.1550-1557

2015

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Two-Photon Absorption Induced Single-Event Effects: Correlation Between Experiment and Simulation

IEEE transactions on nuclear science, 2015-12, Vol.62 (6), p.2867-2873

2015

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Simulation of Light-Matter Interaction and Two-Photon Absorption Induced Charge Deposition by Ultrashort Optical Pulses in Silicon

IEEE transactions on nuclear science, 2014-12, Vol.61 (6), p.3504-3511

2014

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Single-Event Transient Study of Ga₂O₃ Rectifiers

IEEE transactions on nuclear science, 2024-08, Vol.71 (8), p.1455-1460

2024

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Quantitative Laser Testing for Predicting Heavy-Ion SEE Response-Part 2: Accurately Determining Laser-Equivalent LET

IEEE transactions on nuclear science, 2024-04, Vol.71 (4), p.641-653

2024

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Quantitative Laser Testing for Predicting Heavy-Ion SEE Response-Part 1: Metrics for Assessing Response Agreement

IEEE transactions on nuclear science, 2024-04, Vol.71 (4), p.626-640

2024

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Review—Radiation Damage in Wide and Ultra-Wide Bandgap Semiconductors

ECS journal of solid state science and technology, 2021-05, Vol.10 (5), p.55008

2021

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Quantitative Prediction of Ion-Induced Single-Event Transients in an Operational Amplifier Using a Quasi-Bessel Beam Pulsed-Laser Approach

IEEE transactions on nuclear science, 2023-04, Vol.70 (4), p.354-362

2023

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Review—Opportunities in Single Event Effects in Radiation-Exposed SiC and GaN Power Electronics

ECS journal of solid state science and technology, 2021-07, Vol.10 (7), p.75004

2021

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Electric Orbit Raising Radiation-Induced Coverglass Darkening and Its Impact on III-V Multijunction Solar Cell Performance

IEEE journal of photovoltaics, 2024-11, Vol.14 (6), p.907-910

2024

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Comparing Digital Modulation Schemes in RF Receivers for Bit Errors Induced by Single-Event Transients in the Low Noise Amplifier

IEEE transactions on nuclear science, 2024-04, Vol.71 (4), p.1-1

2024

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SET-Induced Dropout and Recovery of Cross-Coupled and Differential-Colpitts Microwave Oscillators Using SiGe HBTs

IEEE transactions on nuclear science, 2024-04, Vol.71 (4), p.830-838

2024

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Analysis of Optical Single-Event Transients in Integrated Silicon Photonics Mach-Zehnder Modulators for Space-Based Optical Communications

IEEE transactions on nuclear science, 2024-04, Vol.71 (4), p.736-743

2024

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Examination of Trapping Effects on Single-Event Transients in GaN HEMTs

IEEE transactions on nuclear science, 2023-04, Vol.70 (4), p.1-1

2023

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Mapping the Spatial Dependence of Charge-Collection Efficiency in Semiconductor Devices Using Pulsed-Laser Testing

IEEE transactions on nuclear science, 2021-05, Vol.68 (5), p.617-625

2021

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Radiation Hardened Millimeter-Wave Receiver Implemented in 90-nm, SiGe HBT Technology

IEEE transactions on nuclear science, 2022-10, Vol.69 (10), p.2154-2161

2022

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Single-Event Effect Performance of a Commercial Embedded ReRAM

IEEE transactions on nuclear science, 2014-12, Vol.61 (6), p.3088-3094

2014

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Assembling programmable FRET-based photonic networks using designer DNA scaffolds

Concurrent Modulation of Quantum Dot Photoluminescence Using a Combination of Charge Transfer and Förster Resonance Energy Transfer: Competitive Quenching and Multiplexed Biosensing Modality

Carrier lifetime variation in thick 4H-SiC epilayers using two-photon absorption

Mitigation of Single-Event Effects in SiGe-HBT Current-Mode Logic Circuits

FRET from Multiple Pathways in Fluorophore-Labeled DNA

Using TCAD Modeling to Compare Heavy-Ion and Laser-Induced Single Event Transients in SiGe HBTs

Fabrication of terahertz metamaterials by laser printing

The Impact of Technology Scaling on the Single-Event Transient Response of SiGe HBTs

Simulation of Laser-Based Two-Photon Absorption Induced Charge Carrier Generation in Silicon

Two-Photon Absorption Induced Single-Event Effects: Correlation Between Experiment and Simulation

Simulation of Light-Matter Interaction and Two-Photon Absorption Induced Charge Deposition by Ultrashort Optical Pulses in Silicon

Single-Event Transient Study of Ga₂O₃ Rectifiers

Quantitative Laser Testing for Predicting Heavy-Ion SEE Response-Part 2: Accurately Determining Laser-Equivalent LET

Quantitative Laser Testing for Predicting Heavy-Ion SEE Response-Part 1: Metrics for Assessing Response Agreement

Review—Radiation Damage in Wide and Ultra-Wide Bandgap Semiconductors

Quantitative Prediction of Ion-Induced Single-Event Transients in an Operational Amplifier Using a Quasi-Bessel Beam Pulsed-Laser Approach

Review—Opportunities in Single Event Effects in Radiation-Exposed SiC and GaN Power Electronics

Electric Orbit Raising Radiation-Induced Coverglass Darkening and Its Impact on III-V Multijunction Solar Cell Performance

Comparing Digital Modulation Schemes in RF Receivers for Bit Errors Induced by Single-Event Transients in the Low Noise Amplifier

SET-Induced Dropout and Recovery of Cross-Coupled and Differential-Colpitts Microwave Oscillators Using SiGe HBTs

Analysis of Optical Single-Event Transients in Integrated Silicon Photonics Mach-Zehnder Modulators for Space-Based Optical Communications

Examination of Trapping Effects on Single-Event Transients in GaN HEMTs

Mapping the Spatial Dependence of Charge-Collection Efficiency in Semiconductor Devices Using Pulsed-Laser Testing

Radiation Hardened Millimeter-Wave Receiver Implemented in 90-nm, SiGe HBT Technology

Single-Event Effect Performance of a Commercial Embedded ReRAM

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