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Improved analysis and modeling of low-frequency noise in nanoscale MOSFETs

Solid-state electronics, 2012-10, Vol.76, p.54-59

2012

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Evolution of low frequency noise and noise variability through CMOS bulk technology nodes from 0.5 μm down to 20 nm

Solid-state electronics, 2014-05, Vol.95, p.28-31

2014

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Characterization and modeling of drain current local variability in 28 and 14 nm FDSOI nMOSFETs

Solid-state electronics, 2016-04, Vol.118, p.4-11

2016

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Impact of low-frequency noise variability on statistical parameter extraction in ultra-scaled CMOS devices

Electronics letters, 2014-09, Vol.50 (19), p.1393-1395

2014

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Characterization of traps in the gate dielectric of amorphous and nanocrystalline silicon thin-film transistors by 1/f noise

Journal of applied physics, 2010-11, Vol.108 (10), p.106103-106103-3

2010

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Impact of dynamic variability on the operation of CMOS inverter

Electronics letters, 2013-09, Vol.49 (19), p.1214-1216

2013

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Characterization and modeling of low frequency noise in CMOS inverters

Solid-state electronics, 2013-03, Vol.81, p.151-156

2013

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State-of-the-art low frequency noise performance of n-MOSFET for analog/RF applications

Solid-state electronics, 2020-05, Vol.167, p.107754, Article 107754

2020

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Full front and back gate voltage range method for the parameter extraction of advanced FDSOI CMOS devices

2015 73rd Annual Device Research Conference (DRC), 2015, p.115-116

2015

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Full gate voltage range Lambert-function based methodology for FDSOI MOSFET parameter extraction

Solid-state electronics, 2015-09, Vol.111, p.123-128

2015

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Low frequency noise investigation of n-MOSFET single cells for memory applications

Solid-state electronics, 2019-01, Vol.151, p.36-39

2019

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Impact of Source-Drain Series Resistance on Drain Current Mismatch in Advanced Fully Depleted SOI n-MOSFETs

IEEE electron device letters, 2015-05, Vol.36 (5), p.433-435

2015

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Low frequency noise variability in ultra scaled FD-SOI n-MOSFETs: Dependence on gate bias, frequency and temperature

Solid-state electronics, 2016-03, Vol.117, p.88-93

2016

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Impact of hydrogen anneal on low frequency noise of n- and p-MOSFET

Solid-state electronics, 2016-12, Vol.126, p.158-162

2016

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Impact of source/drain and bulk engineering on LFN performance of n- and p-MOSFET

Solid-state electronics, 2017-09, Vol.135, p.1-7

2017

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Effect of Localized Interface Charge on the Threshold Voltage of Short-Channel Undoped Symmetrical Double-Gate MOSFETs

IEEE transactions on electron devices, 2011-02, Vol.58 (2), p.433-440

2011

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Impact of dynamic variability on the operation of CMOS inverter

Electronics letters, 2013-09, Vol.49 (19), p.1-1

2013

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Analytical low-frequency noise model in the linear region of lightly doped nanoscale double-gate metal-oxide-semiconductor field-effect transistors

Journal of applied physics, 2010-09, Vol.108 (6), p.064512-064512-7

2010

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Statistical analysis of dynamic variability in 28nm FD-SOI MOSFETs

2014 44th European Solid State Device Research Conference (ESSDERC), 2014, p.214-217

2014

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Low frequency noise statistical characterization of 14nm FDSOI technology node

EUROSOI-ULIS 2015: 2015 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon, 2015, p.181-184

2015

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Impact of front-back gate coupling on low frequency noise in 28 nm FDSOI MOSFETs

2012 Proceedings of the European Solid-State Device Research Conference (ESSDERC), 2012, p.334-337

2012

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Low frequency noise variability in high-k/metal gate stack 28nm bulk and FD-SOI CMOS transistors

2011 International Electron Devices Meeting, 2011, p.18.6.1-18.6.4

2011

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On the Distribution of Single Defect Threshold Voltage Shifts in SiON Transistors

IEEE transactions on device and materials reliability, 2021-06, Vol.21 (2), p.199-206

2021

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Evolution of low frequency noise and noise variability through CMOS bulk technology nodes

2013 22nd International Conference on Noise and Fluctuations (ICNF), 2013, p.1-4

2013

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Front-back gate coupling effect on 1/f noise in ultra-thin Si film FDSOI MOSFETs

2012 International Semiconductor Conference Dresden-Grenoble (ISCDG), 2012, p.223-226

2012

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Improved analysis and modeling of low-frequency noise in nanoscale MOSFETs

Evolution of low frequency noise and noise variability through CMOS bulk technology nodes from 0.5 μm down to 20 nm

Characterization and modeling of drain current local variability in 28 and 14 nm FDSOI nMOSFETs

Impact of low-frequency noise variability on statistical parameter extraction in ultra-scaled CMOS devices

Characterization of traps in the gate dielectric of amorphous and nanocrystalline silicon thin-film transistors by 1/f noise

Impact of dynamic variability on the operation of CMOS inverter

Characterization and modeling of low frequency noise in CMOS inverters

State-of-the-art low frequency noise performance of n-MOSFET for analog/RF applications

Full front and back gate voltage range method for the parameter extraction of advanced FDSOI CMOS devices

Full gate voltage range Lambert-function based methodology for FDSOI MOSFET parameter extraction

Low frequency noise investigation of n-MOSFET single cells for memory applications

Impact of Source-Drain Series Resistance on Drain Current Mismatch in Advanced Fully Depleted SOI n-MOSFETs

Low frequency noise variability in ultra scaled FD-SOI n-MOSFETs: Dependence on gate bias, frequency and temperature

Impact of hydrogen anneal on low frequency noise of n- and p-MOSFET

Impact of source/drain and bulk engineering on LFN performance of n- and p-MOSFET

Effect of Localized Interface Charge on the Threshold Voltage of Short-Channel Undoped Symmetrical Double-Gate MOSFETs

Impact of dynamic variability on the operation of CMOS inverter

Analytical low-frequency noise model in the linear region of lightly doped nanoscale double-gate metal-oxide-semiconductor field-effect transistors

Statistical analysis of dynamic variability in 28nm FD-SOI MOSFETs

Low frequency noise statistical characterization of 14nm FDSOI technology node

Impact of front-back gate coupling on low frequency noise in 28 nm FDSOI MOSFETs

Low frequency noise variability in high-k/metal gate stack 28nm bulk and FD-SOI CMOS transistors

On the Distribution of Single Defect Threshold Voltage Shifts in SiON Transistors

Evolution of low frequency noise and noise variability through CMOS bulk technology nodes

Front-back gate coupling effect on 1/f noise in ultra-thin Si film FDSOI MOSFETs

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