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Perceived competence in ice hockey and its associations with relative age, early sport specialization, and players' position

Frontiers in psychology, 2024, Vol.15, p.1336529-1336529

2024

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Assessment and Conceptualization of Perceived Competence in Ice Hockey: A Scale Development and Validation Study

Perceptual and motor skills, 2023-08, Vol.130 (4), p.1587-1608

2023

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Adolescent hockey players' predispositions to adopt sport and exercise behaviours: An ecological perspective

PloS one, 2020-02, Vol.15 (2), p.e0228352-e0228352

2020

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Early Sport Specialization and Relative Age Effect: Prevalence and Influence on Perceived Competence in Ice Hockey Players

Sports (Basel), 2022-04, Vol.10 (4), p.62

2022

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Video games and their associations with physical health: a scoping review

BMJ Open Sport & Exercise Medicine, 2020-01, Vol.6 (1), p.e000832-e000832

2020

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Talent Identification in Elite Adolescent Ice Hockey Players: The Discriminant Capacity of Fitness Tests, Skating Performance and Psychological Characteristics

Sports (Basel), 2022-04, Vol.10 (4), p.58

2022

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Associations between Testing and Game Performance in Ice Hockey: A Scoping Review

Sports (Basel), 2021-08, Vol.9 (9), p.117

2021

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Embracing the new era of AI at the edge

2023 International Conference on IC Design and Technology (ICICDT), 2023, p.xi-xi

Huard, Vincent

2023

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Relative Age Effect in Canadian Hockey: Prevalence, Perceived Competence and Performance

Frontiers in sports and active living, 2021-03, Vol.3, p.622590-622590

2021

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A Complete Characterization and Modeling of the BTI-Induced Dynamic Variability of SRAM Arrays in 28-nm FD-SOI Technology

IEEE transactions on electron devices, 2014-12, Vol.61 (12), p.3991-3999

2014

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Two independent components modeling for Negative Bias Temperature Instability

2010 IEEE International Reliability Physics Symposium, 2010, p.33-42

Huard, V

2010

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General framework about defect creation at the Si∕SiO2 interface

Journal of applied physics, 2009-06, Vol.105 (11)

2009

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Correlation Technologies for Emerging Wireless Applications

Electronics (Basel), 2022-04, Vol.11 (7), p.1134-18

2022

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Hot-Carrier acceleration factors for low power management in DC-AC stressed 40nm NMOS node at high temperature

2009 IEEE International Reliability Physics Symposium, 2009, p.531-548

2009

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Statistical Simulation of Progressive NBTI Degradation in a 45-nm Technology pMOSFET

IEEE transactions on electron devices, 2010-09, Vol.57 (9), p.2320-2323

2010

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Performance vs. reliability adaptive body bias scheme in 28nm & 14nm UTBB FDSOI nodes

Microelectronics and reliability, 2016-09, Vol.64, p.158-162

2016

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22.1 A 12.4TOPS/W @ 136GOPS AI-IoT System-on-Chip with 16 RISC-V, 2-to-8b Precision-Scalable DNN Acceleration and 30%-Boost Adaptive Body Biasing

2023 IEEE International Solid- State Circuits Conference (ISSCC), 2023, p.21-23

2023

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Design-in-Reliable Millimeter-Wave Power Amplifiers in a 65-nm CMOS Process

IEEE transactions on microwave theory and techniques, 2012-04, Vol.60 (4), p.1079-1085

2012

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NBTI aged cell rejuvenation with back biasing and resulting critical path reordering for digital circuits in 28nm FDSOI

2018 Design, Automation & Test in Europe Conference & Exhibition (DATE), 2018, p.997-998

2018

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35.2 A 0.021mm2 PVT-Aware Digital-Flow-Compatible Adaptive Back-Biasing Regulator with Scalable Drivers Achieving 450% Frequency Boosting and 30% Power Reduction in 22nm FDSOI Technology

2021 IEEE International Solid- State Circuits Conference (ISSCC), 2021, Vol.64, p.492-494

2021

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Hot-Carrier Stress Effect on a CMOS 65-nm 60-GHz One-Stage Power Amplifier

IEEE electron device letters, 2010-09, Vol.31 (9), p.927-929

2010

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Workload dependent reliability timing analysis flow

Design, Automation & Test in Europe Conference & Exhibition (DATE), 2017, 2017, p.736-737

2017

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Dynamic aging compensation and Safety measures in Automotive environment

2017 IEEE 23rd International Symposium on On-Line Testing and Robust System Design (IOLTS), 2017, p.106-112

2017

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Study of workload impact on BTI HCI induced aging of digital circuits

2016 Design, Automation & Test in Europe Conference & Exhibition (DATE), 2016, p.1020-1021

2016

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CMOS device design-in reliability approach in advanced nodes

2009 IEEE International Reliability Physics Symposium, 2009, p.624-633

2009

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Perceived competence in ice hockey and its associations with relative age, early sport specialization, and players' position

Assessment and Conceptualization of Perceived Competence in Ice Hockey: A Scale Development and Validation Study

Adolescent hockey players' predispositions to adopt sport and exercise behaviours: An ecological perspective

Early Sport Specialization and Relative Age Effect: Prevalence and Influence on Perceived Competence in Ice Hockey Players

Video games and their associations with physical health: a scoping review

Talent Identification in Elite Adolescent Ice Hockey Players: The Discriminant Capacity of Fitness Tests, Skating Performance and Psychological Characteristics

Associations between Testing and Game Performance in Ice Hockey: A Scoping Review

Embracing the new era of AI at the edge

Relative Age Effect in Canadian Hockey: Prevalence, Perceived Competence and Performance

A Complete Characterization and Modeling of the BTI-Induced Dynamic Variability of SRAM Arrays in 28-nm FD-SOI Technology

Two independent components modeling for Negative Bias Temperature Instability

General framework about defect creation at the Si∕SiO2 interface

Correlation Technologies for Emerging Wireless Applications

Hot-Carrier acceleration factors for low power management in DC-AC stressed 40nm NMOS node at high temperature

Statistical Simulation of Progressive NBTI Degradation in a 45-nm Technology pMOSFET

Performance vs. reliability adaptive body bias scheme in 28nm & 14nm UTBB FDSOI nodes

22.1 A 12.4TOPS/W @ 136GOPS AI-IoT System-on-Chip with 16 RISC-V, 2-to-8b Precision-Scalable DNN Acceleration and 30%-Boost Adaptive Body Biasing

Design-in-Reliable Millimeter-Wave Power Amplifiers in a 65-nm CMOS Process

NBTI aged cell rejuvenation with back biasing and resulting critical path reordering for digital circuits in 28nm FDSOI

35.2 A 0.021mm2 PVT-Aware Digital-Flow-Compatible Adaptive Back-Biasing Regulator with Scalable Drivers Achieving 450% Frequency Boosting and 30% Power Reduction in 22nm FDSOI Technology

Hot-Carrier Stress Effect on a CMOS 65-nm 60-GHz One-Stage Power Amplifier

Workload dependent reliability timing analysis flow

Dynamic aging compensation and Safety measures in Automotive environment

Study of workload impact on BTI HCI induced aging of digital circuits

CMOS device design-in reliability approach in advanced nodes

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