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A Unified Procedure for Fault Detection of Analog and Mixed-Mode Circuits Using Magnitude and Phase Components of the Power Supply Current Spectrum

IEEE transactions on instrumentation and measurement, 2008-11, Vol.57 (11), p.2589-2595

2008

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An Improved Optical Feedback Pixel Driver Circuit

IEEE transactions on electron devices, 2009-02, Vol.56 (2), p.229-235

2009

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A Light-Impact Model for p-Type and n-Type Poly-Si TFTs

Journal of display technology, 2009-07, Vol.5 (7), p.265-272

2009

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Simulation of organic inverter

Solid-state electronics, 2012-02, Vol.68, p.18-21

2012

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Wavelet energy-based testing using supply current measurements

IET science, measurement & technology, 2010-03, Vol.4 (2), p.76-85

2010

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Determination of bulk and interface density of states in polycristalline silicon thin film transistors

Thin solid films, 2007-07, Vol.515 (19), p.7581-7584

2007

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Determination of bulk and interface density of states in polycrystalline silicon thin film transistors

Thin solid films, 2007-07, Vol.515 (19), p.7581-7584

2007

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Analogue fault detectability comparison between power supply current and output voltage magnitude and phase spectrum components

Electronics letters, 2004-04, Vol.40 (8), p.457

2004

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Current-Based Testing of Optical Feedback Pixel Driver

Journal of display technology, 2010-04, Vol.6 (4), p.150-157

2010

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Detection of time-delay related faults using Fourier phase components of power supply current

Electronics letters, 2004-01, Vol.40 (1), p.7

2004

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A simple built-in current sensor for current monitoring in mixed-signal circuits

IEEE transactions on instrumentation and measurement, 1997-12, Vol.46 (6), p.1301-1304

1997

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Built-in current sensor with reduced voltage drop using thin-film transistors

2005 IEEE International Symposium on Circuits and Systems (ISCAS), 2005, p.2196-2199 Vol. 3

2005

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Modeling the impact of light on the performance of polycrystalline thin-film transistors at the sub-threshold region

2006 IEEE International Symposium on Circuits and Systems (ISCAS), 2006, p.4 pp.-432

2006

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A threshold voltage variation cancellation technique for analogue peripheral circuits of a display array using poly-Si TFTs

2006 IEEE International Symposium on Circuits and Systems (ISCAS), 2006, p.4 pp.-3308

2006

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Supply current testing in linear bipolar ICs

Electronics letters, 1994-01, Vol.30 (2), p.128-130

1994

Volltextzugriff (PDF)

Analogue fault identification based on power supply current spectrum

Electronics letters, 1993-01, Vol.29 (1), p.118-119

1993

Volltextzugriff (PDF)

Testing of an optical feedback pixel driver using supply current

2009 MIXDES-16th International Conference Mixed Design of Integrated Circuits & Systems, 2009, p.525-529

2009

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Correlation-based comparison of analog signatures for identification and fault diagnosis

IEEE transactions on instrumentation and measurement, 1993-08, Vol.42 (4), p.860-863

1993

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Reducing the number of nonzero elements of topological loop (B) and cutset (D) matrices

Electronics letters, 1992-08, Vol.28 (17), p.1577-1579

HATZOPOULOS, A. A

1992

Volltextzugriff (PDF)

A data-acquisition system for the analysis of the isometric tension generated by an electrically stimulated skeletal muscle

Bioinformatics, 1993-06, Vol.9 (3), p.325-330

1993

Volltextzugriff (PDF)

Modeling the impact of light on the performance of polycrystalline thin-film transistors at the sub-threshold region

Microelectronics, 2006-11, Vol.37 (11), p.1313-1320

2006

Volltextzugriff (PDF)

A complete scheme of built-in self-tests (BIST) structure for fault diagnosis in analog circuits and systems

IEEE transactions on instrumentation and measurement, 1993-06, Vol.42 (3), p.689-694, Article 689

1993

Volltextzugriff (PDF)

Analog and mixed-signal testing by wavelet transformations of power supply current measurements

2009 MIXDES-16th International Conference Mixed Design of Integrated Circuits & Systems, 2009, p.505-508

2009

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Improving the quality factor estimation for differentially driven RF CMOS inductor

2007 18th European Conference on Circuit Theory and Design, 2007, p.599-602

2007

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Design and development of a versatile testing system for analog and mixed-signal circuits

2007 18th European Conference on Circuit Theory and Design, 2007, p.846-849

2007

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A Unified Procedure for Fault Detection of Analog and Mixed-Mode Circuits Using Magnitude and Phase Components of the Power Supply Current Spectrum

An Improved Optical Feedback Pixel Driver Circuit

A Light-Impact Model for p-Type and n-Type Poly-Si TFTs

Simulation of organic inverter

Wavelet energy-based testing using supply current measurements

Determination of bulk and interface density of states in polycristalline silicon thin film transistors

Determination of bulk and interface density of states in polycrystalline silicon thin film transistors

Analogue fault detectability comparison between power supply current and output voltage magnitude and phase spectrum components

Current-Based Testing of Optical Feedback Pixel Driver

Detection of time-delay related faults using Fourier phase components of power supply current

A simple built-in current sensor for current monitoring in mixed-signal circuits

Built-in current sensor with reduced voltage drop using thin-film transistors

Modeling the impact of light on the performance of polycrystalline thin-film transistors at the sub-threshold region

A threshold voltage variation cancellation technique for analogue peripheral circuits of a display array using poly-Si TFTs

Supply current testing in linear bipolar ICs

Analogue fault identification based on power supply current spectrum

Testing of an optical feedback pixel driver using supply current

Correlation-based comparison of analog signatures for identification and fault diagnosis

Reducing the number of nonzero elements of topological loop (B) and cutset (D) matrices

A data-acquisition system for the analysis of the isometric tension generated by an electrically stimulated skeletal muscle

Modeling the impact of light on the performance of polycrystalline thin-film transistors at the sub-threshold region

A complete scheme of built-in self-tests (BIST) structure for fault diagnosis in analog circuits and systems

Analog and mixed-signal testing by wavelet transformations of power supply current measurements

Improving the quality factor estimation for differentially driven RF CMOS inductor

Design and development of a versatile testing system for analog and mixed-signal circuits

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